ATE226127T1 - Verfahren und vorrichtung zum abfasen von halbleiterscheiben - Google Patents

Verfahren und vorrichtung zum abfasen von halbleiterscheiben

Info

Publication number
ATE226127T1
ATE226127T1 AT99926637T AT99926637T ATE226127T1 AT E226127 T1 ATE226127 T1 AT E226127T1 AT 99926637 T AT99926637 T AT 99926637T AT 99926637 T AT99926637 T AT 99926637T AT E226127 T1 ATE226127 T1 AT E226127T1
Authority
AT
Austria
Prior art keywords
wheel
wafer
chamfering
semiconductor discs
edge flanks
Prior art date
Application number
AT99926637T
Other languages
English (en)
Inventor
Mark Andrew Stocker
Original Assignee
Unova Uk Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GBGB9813606.2A external-priority patent/GB9813606D0/en
Priority claimed from GBGB9910898.7A external-priority patent/GB9910898D0/en
Application filed by Unova Uk Ltd filed Critical Unova Uk Ltd
Application granted granted Critical
Publication of ATE226127T1 publication Critical patent/ATE226127T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B53/00Devices or means for dressing or conditioning abrasive surfaces
    • B24B53/017Devices or means for dressing, cleaning or otherwise conditioning lapping tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/02Lapping machines or devices; Accessories designed for working surfaces of revolution
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/16Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B51/00Arrangements for automatic control of a series of individual steps in grinding a workpiece
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B55/00Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
    • B24B55/04Protective covers for the grinding wheel
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B9/00Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
    • B24B9/02Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
    • B24B9/06Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
    • B24B9/065Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of thin, brittle parts, e.g. semiconductors, wafers

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Die Bonding (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Grinding Of Cylindrical And Plane Surfaces (AREA)
  • Grinding-Machine Dressing And Accessory Apparatuses (AREA)
AT99926637T 1998-06-25 1999-06-17 Verfahren und vorrichtung zum abfasen von halbleiterscheiben ATE226127T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB9813606.2A GB9813606D0 (en) 1998-06-25 1998-06-25 Improvements relating to wafer edge polishing
GBGB9910898.7A GB9910898D0 (en) 1999-05-12 1999-05-12 Wafer edge polishing method and apparatus
PCT/GB1999/001928 WO1999067054A1 (en) 1998-06-25 1999-06-17 Wafer edge polishing method and apparatus

Publications (1)

Publication Number Publication Date
ATE226127T1 true ATE226127T1 (de) 2002-11-15

Family

ID=26313924

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99926637T ATE226127T1 (de) 1998-06-25 1999-06-17 Verfahren und vorrichtung zum abfasen von halbleiterscheiben

Country Status (11)

Country Link
US (1) US6428397B1 (de)
EP (1) EP1089851B1 (de)
JP (1) JP2002518195A (de)
KR (1) KR100416446B1 (de)
CN (1) CN1138612C (de)
AT (1) ATE226127T1 (de)
DE (1) DE69903547T2 (de)
ES (1) ES2186368T3 (de)
GB (1) GB2342060B (de)
TW (1) TW445193B (de)
WO (1) WO1999067054A1 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2351684B (en) * 1999-07-03 2001-07-11 Unova Uk Ltd Improvement in and relating to edge grinding
KR100602186B1 (ko) 2004-07-30 2006-07-19 주식회사 하이닉스반도체 웨이퍼 테두리 연마단자를 구비한 웨이퍼 세정장치
JP4524643B2 (ja) * 2005-05-18 2010-08-18 株式会社Sumco ウェーハ研磨方法
JP2007088143A (ja) * 2005-09-21 2007-04-05 Elpida Memory Inc エッジ研磨装置
US20070298240A1 (en) * 2006-06-22 2007-12-27 Gobena Feben T Compressible abrasive article
KR100845967B1 (ko) * 2006-12-28 2008-07-11 주식회사 실트론 웨이퍼 연삭방법 및 연삭휠
JP2008284682A (ja) * 2007-05-21 2008-11-27 Applied Materials Inc 効率的なテープのルーティング配置を有する斜面研磨ヘッドを使用する方法及び装置
US8231431B2 (en) * 2008-01-24 2012-07-31 Applied Materials, Inc. Solar panel edge deletion module
DE102009037281B4 (de) * 2009-08-12 2013-05-08 Siltronic Ag Verfahren zur Herstellung einer polierten Halbleiterscheibe
US8815110B2 (en) * 2009-09-16 2014-08-26 Cabot Microelectronics Corporation Composition and method for polishing bulk silicon
JP6012719B2 (ja) * 2012-05-07 2016-10-25 信越半導体株式会社 円板形ワーク用外周研磨装置
DE102013210057A1 (de) 2013-05-29 2014-12-04 Siltronic Ag Verfahren zur Politur der Kante einer Halbleiterscheibe
DE102013212850A1 (de) 2013-07-02 2013-09-12 Siltronic Ag Verfahren zur Politur der Kante einer Halbleiterscheibe
CN105636743B (zh) * 2013-10-04 2021-01-08 福吉米株式会社 研磨构件的加工方法以及研磨构件的修正方法
CN104526493A (zh) * 2014-11-18 2015-04-22 天津中环领先材料技术有限公司 一种单晶硅晶圆片边缘抛光工艺
AT517879B1 (de) * 2015-11-03 2018-02-15 Berndorf Band Gmbh Verfahren und Vorrichtung zum Herstellen einer homogenen, geschliffenen Oberfläche eines Metallbands
TWI583491B (zh) 2015-11-03 2017-05-21 財團法人工業技術研究院 振動輔助拋光模組
CN107627216B (zh) * 2017-10-11 2019-04-05 盐城环宇汽车零部件制造有限公司 一种基于物联网的高安全性能的智能磨床
CN108705396A (zh) * 2018-07-05 2018-10-26 天长市百盛半导体科技有限公司 一种太阳能电池晶体硅的打磨装置
JP7258489B2 (ja) * 2018-08-21 2023-04-17 株式会社岡本工作機械製作所 半導体装置の製造方法及び製造装置
CN109848826B (zh) * 2019-03-04 2024-04-30 天通日进精密技术有限公司 晶圆多工位边缘抛光设备
CN109822419B (zh) * 2019-03-04 2024-08-23 天通日进精密技术有限公司 晶圆转移装置及晶圆转移方法
JP7317441B2 (ja) * 2019-04-15 2023-07-31 株式会社ディスコ 面取り加工装置
CN110605629B (zh) * 2019-09-19 2022-11-18 西安奕斯伟材料科技有限公司 一种研磨装置
CN111015489B (zh) * 2019-11-22 2021-05-18 山西迪迈沃科光电工业有限公司 回转体外表面抛光装置
CN113714889B (zh) * 2021-11-03 2022-02-11 天通控股股份有限公司 一种大尺寸超薄高精度铌酸锂晶片边缘加工方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4344260A (en) * 1979-07-13 1982-08-17 Nagano Electronics Industrial Co., Ltd. Method for precision shaping of wafer materials
SU1114528A1 (ru) * 1981-10-13 1984-09-23 Организация П/Я А-7124 Устройство дл обработки фасок на полупроводниковых пластинах
JP2559650B2 (ja) * 1991-11-27 1996-12-04 信越半導体株式会社 ウエーハ面取部研磨装置
JP2628424B2 (ja) * 1992-01-24 1997-07-09 信越半導体株式会社 ウエーハ面取部の研磨方法及び装置
US5538463A (en) 1992-11-26 1996-07-23 Shin-Etsu Handotai Co., Ltd. Apparatus for bevelling wafer-edge
JPH07205001A (ja) * 1993-11-16 1995-08-08 Tokyo Seimitsu Co Ltd ウェーハ面取り機
JP3010572B2 (ja) * 1994-09-29 2000-02-21 株式会社東京精密 ウェーハエッジの加工装置
TW308561B (de) * 1995-08-24 1997-06-21 Mutsubishi Gum Kk
GB2317585B (en) * 1997-06-11 1999-12-01 Western Atlas Uk Ltd Improvements in and relating to grinding machines
JP3620679B2 (ja) * 1996-08-27 2005-02-16 信越半導体株式会社 遊離砥粒によるウエーハの面取装置及び面取方法
GB2326523B (en) * 1997-11-24 1999-11-17 United Microelectronics Corp Chemical mechanical polishing methods using low ph slurry mixtures

Also Published As

Publication number Publication date
GB2342060B (en) 2001-03-07
GB9914215D0 (en) 1999-08-18
JP2002518195A (ja) 2002-06-25
CN1138612C (zh) 2004-02-18
DE69903547D1 (de) 2002-11-21
KR20010072644A (ko) 2001-07-31
US6428397B1 (en) 2002-08-06
WO1999067054A1 (en) 1999-12-29
TW445193B (en) 2001-07-11
KR100416446B1 (ko) 2004-01-31
EP1089851B1 (de) 2002-10-16
DE69903547T2 (de) 2003-07-10
ES2186368T3 (es) 2003-05-01
EP1089851A1 (de) 2001-04-11
GB2342060A (en) 2000-04-05
CN1312747A (zh) 2001-09-12

Similar Documents

Publication Publication Date Title
ATE226127T1 (de) Verfahren und vorrichtung zum abfasen von halbleiterscheiben
Pei et al. Fine grinding of silicon wafers
EP0820092A4 (de) Ceroxid-schleifmittel, halbleiterchip, halbleiterelement, deren herstellungsverfahren und methode,ein substrat zu polieren
ATE320881T1 (de) Schleifmittel mit einem fenstersystem zum polieren von wafern und verfahren hierfür
TW428225B (en) A method of polishing a surface of a substrate, a method of manufacturing semiconductor device, and an apparatus of manufacturing the same
US20020102920A1 (en) Eccentric abrasive wheel for wafer processing
ATE428537T1 (de) Schleifwerkzeuge zum schleifen von elektronischen bauteilen
TW197531B (de)
WO2002053322A3 (en) System and method for polishing and planarization of semiconductor wafers using reduced surface area polishing pads
TW363218B (en) Integrated pad and belt for chemical mechanical polishing
MY105865A (en) Fine polishing compound for wafer
ATE296185T1 (de) Verfahren und vorrichtung zum planarisieren von mikroelektronischem substratenaufbau
ATE302092T1 (de) Schleifmittel und verfahren zum schleifen von glas
AU5148198A (en) Method for chemical-mechanical planarization of a substrate on a fixed-abrasive polishing pad
MY132588A (en) Apparatus and method for double-side polishing semiconductor wafers
ATE267070T1 (de) Vorrichtung zum polieren von halbleiterscheiben
DE69410338D1 (de) Schleifwerkzeug
MY132505A (en) Apparatus and method for chamfering wafer with loose abrasive grains
US4587771A (en) Process for the backside-gettering surface treatment of semiconductor wafers
GB0100613D0 (en) Improvements in and relating to grinding machines
EP1426140A4 (de) Richtwerkzeug, richtvorrichtung, richtverfahren, bearbeitungsvorrichtung und verfahren zur herstellung einer halbleiteranordnung
TW374943B (en) Apparatus of grinding process and the method
JPS57170538A (en) Polishing method for one side of semiconductor wafer
MY113647A (en) Apparatus and method of lapping works
EP1125688A4 (de) Poliervorrichtung und halbleiter-herstellungsverfahren unter verwendung desselben

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties