DE69841587D1 - Signalkonditionierungsschaltung mit kombiniertem adc/dac-wandler, sensorsystem und verfahren dafür - Google Patents

Signalkonditionierungsschaltung mit kombiniertem adc/dac-wandler, sensorsystem und verfahren dafür

Info

Publication number
DE69841587D1
DE69841587D1 DE69841587T DE69841587T DE69841587D1 DE 69841587 D1 DE69841587 D1 DE 69841587D1 DE 69841587 T DE69841587 T DE 69841587T DE 69841587 T DE69841587 T DE 69841587T DE 69841587 D1 DE69841587 D1 DE 69841587D1
Authority
DE
Germany
Prior art keywords
sensor system
signal conditioning
method therefor
conditioning circuit
dac converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69841587T
Other languages
English (en)
Inventor
William Roeckner
Neal W Hollenbeck
Timothy Rueger
Walter Czarnocki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Application granted granted Critical
Publication of DE69841587D1 publication Critical patent/DE69841587D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/02—Reversible analogue/digital converters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/021—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation using purely analogue techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/022—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation having an ideal characteristic, map or correction data stored in a digital memory
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/1019—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error by storing a corrected or correction value in a digital look-up table
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/662—Multiplexed conversion systems
DE69841587T 1998-02-02 1998-12-18 Signalkonditionierungsschaltung mit kombiniertem adc/dac-wandler, sensorsystem und verfahren dafür Expired - Lifetime DE69841587D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/017,617 US5995033A (en) 1998-02-02 1998-02-02 Signal conditioning circuit including a combined ADC/DAC, sensor system, and method therefor
PCT/US1998/027152 WO1999039439A1 (en) 1998-02-02 1998-12-18 Signal conditioning circuit including a combined adc/dac, sensor system, and method therefor

Publications (1)

Publication Number Publication Date
DE69841587D1 true DE69841587D1 (de) 2010-05-12

Family

ID=21783590

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69841587T Expired - Lifetime DE69841587D1 (de) 1998-02-02 1998-12-18 Signalkonditionierungsschaltung mit kombiniertem adc/dac-wandler, sensorsystem und verfahren dafür

Country Status (5)

Country Link
US (1) US5995033A (de)
EP (1) EP0980601B1 (de)
JP (1) JP2001523429A (de)
DE (1) DE69841587D1 (de)
WO (1) WO1999039439A1 (de)

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US6448920B1 (en) * 2000-05-17 2002-09-10 Schneider Automation, Inc. System and method for converting analog values to and from real world values
US6448914B1 (en) * 2000-10-24 2002-09-10 Honeywell International Inc. Integrated circuit for conditioning and conversion of bi-directional discrete and analog signals
US7180798B2 (en) * 2001-04-12 2007-02-20 Fuji Electric Co., Ltd. Semiconductor physical quantity sensing device
JP4764996B2 (ja) * 2001-04-12 2011-09-07 富士電機株式会社 半導体物理量センサ装置
JP3549499B2 (ja) * 2001-07-04 2004-08-04 松下電器産業株式会社 半導体集積回路装置ならびにｄ／ａ変換装置およびａ／ｄ変換装置
US7068193B2 (en) * 2002-09-26 2006-06-27 Analog Devices, Inc. Integrated digital calibration circuit and digital to analog converter (DAC)
US6996488B2 (en) * 2002-10-15 2006-02-07 Advanced Custom Sensors, Inc. Sensor signal conditioner
US7356262B2 (en) * 2002-11-06 2008-04-08 Finisar Corporation Time division multiplexing of analog signals in an optical transceiver
US6972391B2 (en) * 2002-11-21 2005-12-06 Hadco Santa Clara, Inc. Laser trimming of annular passive components
US7297896B2 (en) * 2002-11-21 2007-11-20 Hadco Santa Clara, Inc. Laser trimming of resistors
EP1567302B8 (de) * 2002-11-21 2013-05-15 Hadco Santa Clara, Inc. Laserschneiden von widerständen
US7098826B2 (en) * 2004-06-02 2006-08-29 Texas Instruments Incorporated Auto-configuration to connect transmit and receive ports to corresponding ports on the other end irrespective of cable connection mis-match
JP4682668B2 (ja) * 2005-03-30 2011-05-11 株式会社デンソー Ａ／ｄ変換装置、およびａ／ｄ変換装置を備えたセンサ装置
US7398173B2 (en) * 2005-05-04 2008-07-08 Ami Semiconductor, Inc. Providing nonlinear temperature compensation for sensing means by use of Padé approximant function emulators
TWI260126B (en) * 2005-11-10 2006-08-11 Prolific Technology Inc Self-calibration circuit for capacitance mismatch
US20070144247A1 (en) * 2005-12-23 2007-06-28 Seesink Peter H Multiple function stable sensor circuitry
US7554079B2 (en) 2007-03-22 2009-06-30 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Signal conditioning for an optical encoder
US8010722B2 (en) * 2008-11-04 2011-08-30 Renesas Electronics America Inc. Analog comparators in a control system
US7741981B1 (en) 2008-12-30 2010-06-22 Hong Kong Applied Science And Technology Research Institute Co., Ltd. Dual-use comparator/op amp for use as both a successive-approximation ADC and DAC
KR101091667B1 (ko) * 2009-12-03 2011-12-08 현대자동차주식회사 하이브리드 차량용 모터 온도 측정 방법
US9450596B2 (en) * 2011-05-09 2016-09-20 Semiconductor Components Industries, Llc Ramp and successive approximation register analog to digital conversion methods, systems and apparatus
US9256216B2 (en) * 2012-04-23 2016-02-09 Rosemount Inc. Process variable compensation in a process transmitter
US8933385B2 (en) * 2012-07-06 2015-01-13 Omnivision Technologies, Inc. Hybrid analog-to-digital converter having multiple ADC modes
CN104813323A (zh) * 2012-09-27 2015-07-29 西门子公司 可编程逻辑控制器输入和输出的仿真
US8766833B1 (en) 2013-03-06 2014-07-01 Infineon Technologies Austria Ag System and method for calibrating a circuit
EP2930851B1 (de) * 2014-04-09 2018-09-12 Ams Ag Kapazität-zu-digital-wandler und verfahren zur bereitstellung eines digitalen ausgangssignals
EP2930848B1 (de) * 2014-04-09 2020-06-03 ams AG Treiberanordnung und Verfahren zur Bereitstellung eines analogen Ausgangssignals
JP2016225840A (ja) * 2015-05-29 2016-12-28 株式会社東芝 増幅回路、ａｄ変換器、無線通信装置、及びセンサシステム
JP6636880B2 (ja) * 2016-09-01 2020-01-29 株式会社東芝 増幅回路
US10348322B1 (en) * 2018-06-26 2019-07-09 Nxp Usa, Inc. On-chip trimming circuit and method therefor
US10879893B1 (en) * 2019-08-07 2020-12-29 Texas Instruments Incorporated Passive detection of device decoupling
US10848170B1 (en) 2020-06-26 2020-11-24 Cypress Semiconductor Corporation Method for fast detection and automatic gain adjustment in ADC based signal

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US4445111A (en) * 1980-09-15 1984-04-24 John Fluke Mfg. Co., Inc. Bi-polar electronic signal converters with single polarity accurate reference source
DE3216547C1 (de) * 1982-05-04 1983-10-06 Krautkraemer Gmbh Verfahren und Schaltungsvorrichtung zum Erzeugen und Veraendern einer vorbestimmten Anzahl voneinander unabhaengiger Gleichspannungen
US4622536A (en) * 1984-09-28 1986-11-11 Regents Of The University Of California Ratio independent cyclic A/D and D/A conversion using a reciprocating reference approach
KR890001620A (ko) * 1987-07-29 1989-03-28 이광연 제전성(除電性) 필터와 그 제조방법
JPH03237821A (ja) * 1990-02-15 1991-10-23 Canon Inc 信号変換装置
US5757181A (en) * 1992-06-22 1998-05-26 Durakool Incorporated Electronic circuit for automatically compensating for errors in a sensor with an analog output signal
EP0797305A1 (de) * 1996-03-22 1997-09-24 STMicroelectronics S.r.l. Kombinierter ADW-DAW

Also Published As

Publication number Publication date
EP0980601B1 (de) 2010-03-31
WO1999039439A1 (en) 1999-08-05
EP0980601A4 (de) 2003-08-20
EP0980601A1 (de) 2000-02-23
JP2001523429A (ja) 2001-11-20
US5995033A (en) 1999-11-30

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