DE69828877D1 - Testsystem für integrierte schaltkreise mit wenigstens einem quasi-autonomen testinstrument - Google Patents
Testsystem für integrierte schaltkreise mit wenigstens einem quasi-autonomen testinstrumentInfo
- Publication number
- DE69828877D1 DE69828877D1 DE69828877T DE69828877T DE69828877D1 DE 69828877 D1 DE69828877 D1 DE 69828877D1 DE 69828877 T DE69828877 T DE 69828877T DE 69828877 T DE69828877 T DE 69828877T DE 69828877 D1 DE69828877 D1 DE 69828877D1
- Authority
- DE
- Germany
- Prior art keywords
- acquisition task
- acquisition
- command
- quasi
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31935—Storing data, e.g. failure memory
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US850750 | 1997-04-30 | ||
US08/850,750 US5930735A (en) | 1997-04-30 | 1997-04-30 | Integrated circuit tester including at least one quasi-autonomous test instrument |
PCT/US1998/008681 WO1998049575A1 (en) | 1997-04-30 | 1998-04-29 | Integrated circuit tester including at least one quasi-autonomous test instrument |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69828877D1 true DE69828877D1 (de) | 2005-03-10 |
DE69828877T2 DE69828877T2 (de) | 2005-06-30 |
Family
ID=25309010
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69828877T Expired - Fee Related DE69828877T2 (de) | 1997-04-30 | 1998-04-29 | Testsystem für integrierte schaltkreise mit wenigstens einem quasi-autonomen testinstrument |
Country Status (6)
Country | Link |
---|---|
US (1) | US5930735A (de) |
EP (1) | EP0990166B1 (de) |
JP (1) | JP2002513474A (de) |
KR (1) | KR20010020404A (de) |
DE (1) | DE69828877T2 (de) |
WO (1) | WO1998049575A1 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6064948A (en) * | 1998-03-02 | 2000-05-16 | Tanisys Technology, Inc. | Tester systems |
US6031479A (en) * | 1998-04-24 | 2000-02-29 | Credence Systems Corproation | Programmable digitizer with adjustable sampling rate and triggering modes |
US6445208B1 (en) * | 2000-04-06 | 2002-09-03 | Advantest Corp. | Power source current measurement unit for semiconductor test system |
US6574764B2 (en) * | 2001-04-25 | 2003-06-03 | Agilent Technologies, Inc. | Algorithmically programmable memory tester with history FIFO's that aid in error analysis and recovery |
US7185247B2 (en) * | 2003-06-26 | 2007-02-27 | Intel Corporation | Pseudo bus agent to support functional testing |
US7908531B2 (en) * | 2006-09-29 | 2011-03-15 | Teradyne, Inc. | Networked test system |
KR20090022603A (ko) * | 2007-08-31 | 2009-03-04 | 삼성전자주식회사 | 디바이스 파워 서플라이 확장 회로, 이를 포함하는 테스트시스템 및 반도체 장치의 테스트 방법 |
US20120206150A1 (en) * | 2009-08-27 | 2012-08-16 | Kyle David Holzer | Adjustable gain amplifier, automated test equipment and method for adjusting a gain of an amplifier |
US9020078B2 (en) * | 2010-07-27 | 2015-04-28 | Nec Corporation | Signal detection device, method of controlling same, program, and wireless communication device |
US10306169B2 (en) * | 2015-02-06 | 2019-05-28 | Rambus Inc. | Image sensor with oversampled column output |
FR3033412B1 (fr) * | 2015-03-06 | 2019-04-12 | Starchip | Testeur de circuits integres sur une galette de silicium et circuit integre. |
CN113486077B (zh) * | 2021-06-11 | 2023-08-22 | 北京空间飞行器总体设计部 | 使用实时数据库处理航天器电源系统测试数据的方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4816750A (en) * | 1987-01-16 | 1989-03-28 | Teradyne, Inc. | Automatic circuit tester control system |
US5059889A (en) * | 1990-03-08 | 1991-10-22 | Texas Instruments Incorporated | Parametric measurement unit/device power supply for semiconductor test system |
JP2944256B2 (ja) * | 1991-06-10 | 1999-08-30 | 三菱電機株式会社 | デバッグ用プログラム作成方法 |
US5731700A (en) * | 1994-03-14 | 1998-03-24 | Lsi Logic Corporation | Quiescent power supply current test method and apparatus for integrated circuits |
US5528136A (en) * | 1994-10-06 | 1996-06-18 | Teradyne, Inc. | VLSI component tester with average current measuring capability |
US5748642A (en) * | 1995-09-25 | 1998-05-05 | Credence Systems Corporation | Parallel processing integrated circuit tester |
-
1997
- 1997-04-30 US US08/850,750 patent/US5930735A/en not_active Expired - Lifetime
-
1998
- 1998-04-29 WO PCT/US1998/008681 patent/WO1998049575A1/en not_active Application Discontinuation
- 1998-04-29 DE DE69828877T patent/DE69828877T2/de not_active Expired - Fee Related
- 1998-04-29 KR KR1019997010026A patent/KR20010020404A/ko not_active Application Discontinuation
- 1998-04-29 EP EP98920016A patent/EP0990166B1/de not_active Expired - Lifetime
- 1998-04-29 JP JP54736198A patent/JP2002513474A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0990166A4 (de) | 2000-10-18 |
EP0990166A1 (de) | 2000-04-05 |
KR20010020404A (ko) | 2001-03-15 |
JP2002513474A (ja) | 2002-05-08 |
DE69828877T2 (de) | 2005-06-30 |
EP0990166B1 (de) | 2005-02-02 |
WO1998049575A1 (en) | 1998-11-05 |
US5930735A (en) | 1999-07-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |