DE69811800D1 - Verfahren zur Ablagerung einer dielektrischen Ta2O5-Schicht - Google Patents
Verfahren zur Ablagerung einer dielektrischen Ta2O5-SchichtInfo
- Publication number
- DE69811800D1 DE69811800D1 DE69811800T DE69811800T DE69811800D1 DE 69811800 D1 DE69811800 D1 DE 69811800D1 DE 69811800 T DE69811800 T DE 69811800T DE 69811800 T DE69811800 T DE 69811800T DE 69811800 D1 DE69811800 D1 DE 69811800D1
- Authority
- DE
- Germany
- Prior art keywords
- dielectric
- deposition
- ta2o5 layer
- ta2o5
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/02—Pretreatment of the material to be coated
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/405—Oxides of refractory metals or yttrium
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C24/00—Coating starting from inorganic powder
- C23C24/02—Coating starting from inorganic powder by application of pressure only
- C23C24/04—Impact or kinetic deposition of particles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/04—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings of inorganic non-metallic material
- C23C28/042—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings of inorganic non-metallic material including a refractory ceramic layer, e.g. refractory metal oxides, ZrO2, rare earth oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/02—Pretreatment of the material to be coated, e.g. for coating on selected surface areas
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/12—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the method of spraying
- C23C4/134—Plasma spraying
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Plasma & Fusion (AREA)
- Inorganic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical Vapour Deposition (AREA)
- Formation Of Insulating Films (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9708955A FR2766211B1 (fr) | 1997-07-15 | 1997-07-15 | PROCEDE DE DEPOT D'UNE COUCHE DIELECTRIQUE DE Ta2O5 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69811800D1 true DE69811800D1 (de) | 2003-04-10 |
Family
ID=9509225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69811800T Expired - Lifetime DE69811800D1 (de) | 1997-07-15 | 1998-07-06 | Verfahren zur Ablagerung einer dielektrischen Ta2O5-Schicht |
Country Status (4)
Country | Link |
---|---|
US (1) | US6475928B1 (de) |
EP (1) | EP0900859B1 (de) |
DE (1) | DE69811800D1 (de) |
FR (1) | FR2766211B1 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6417041B1 (en) | 1999-03-26 | 2002-07-09 | Advanced Micro Devices, Inc. | Method for fabricating high permitivity dielectric stacks having low buffer oxide |
KR100373159B1 (ko) * | 1999-11-09 | 2003-02-25 | 주식회사 하이닉스반도체 | 반도체 소자의 캐패시터 제조방법 |
GB2358284B (en) | 1999-07-02 | 2004-07-14 | Hyundai Electronics Ind | Method of manufacturing capacitor for semiconductor memory device |
KR100550644B1 (ko) * | 2002-12-30 | 2006-02-09 | 주식회사 하이닉스반도체 | 반도체장치의 캐패시터 제조방법 |
KR100540474B1 (ko) * | 2002-12-30 | 2006-01-11 | 주식회사 하이닉스반도체 | 산소확산방지막을 구비한 캐패시터 및 그의 제조 방법 |
EP1605500A4 (de) * | 2003-03-17 | 2007-03-21 | Fujitsu Ltd | Halbleiterbauelement und herstellungsverfahren dafür |
US7300702B2 (en) * | 2003-08-18 | 2007-11-27 | Honeywell International, Inc. | Diffusion barrier coating for Si-based components |
US7947148B2 (en) * | 2006-06-01 | 2011-05-24 | The Regents Of The University Of Michigan | Dry adhesion bonding |
DE102009000821B4 (de) * | 2009-02-12 | 2013-05-02 | Surcoatec Ag | Verfahren zum Aufbringen einer Beschichtung auf Werkstücke und/oder Werkstoffe aufweisend mindestens ein leicht oxidierbares Nichteisenmetall sowie Werkstück und/oder Werkstoff hergestellt nach dem Verfahren |
DE102009053889B4 (de) * | 2009-11-20 | 2014-03-27 | C. Hafner Gmbh + Co. Kg | Verfahren zur Beschichtung einer metallischen Substratoberfläche mit einer durch einen ALD-Prozess aufgebrachten Materialschicht |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5978553A (ja) * | 1982-10-27 | 1984-05-07 | Hitachi Ltd | キヤパシタおよびその製造方法 |
JPS61166075A (ja) * | 1985-01-17 | 1986-07-26 | Mitsubishi Electric Corp | 半導体装置およびその製造方法 |
JPS6338248A (ja) * | 1986-08-04 | 1988-02-18 | Hitachi Ltd | 半導体装置およびその製造方法 |
JPH04223366A (ja) * | 1990-12-25 | 1992-08-13 | Mitsubishi Electric Corp | 半導体装置及びその製造方法 |
JP2786071B2 (ja) * | 1993-02-17 | 1998-08-13 | 日本電気株式会社 | 半導体装置の製造方法 |
US5827773A (en) * | 1997-03-07 | 1998-10-27 | Sharp Microelectronics Technology, Inc. | Method for forming polycrystalline silicon from the crystallization of microcrystalline silicon |
-
1997
- 1997-07-15 FR FR9708955A patent/FR2766211B1/fr not_active Expired - Fee Related
-
1998
- 1998-07-06 EP EP98401705A patent/EP0900859B1/de not_active Expired - Lifetime
- 1998-07-06 DE DE69811800T patent/DE69811800D1/de not_active Expired - Lifetime
- 1998-07-15 US US09/115,706 patent/US6475928B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0900859B1 (de) | 2003-03-05 |
FR2766211B1 (fr) | 1999-10-15 |
EP0900859A3 (de) | 2000-05-03 |
US6475928B1 (en) | 2002-11-05 |
FR2766211A1 (fr) | 1999-01-22 |
EP0900859A2 (de) | 1999-03-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |