DE69739243D1 - Phasenbestimmung in einem phasenabbildungsverfahren - Google Patents

Phasenbestimmung in einem phasenabbildungsverfahren

Info

Publication number
DE69739243D1
DE69739243D1 DE69739243T DE69739243T DE69739243D1 DE 69739243 D1 DE69739243 D1 DE 69739243D1 DE 69739243 T DE69739243 T DE 69739243T DE 69739243 T DE69739243 T DE 69739243T DE 69739243 D1 DE69739243 D1 DE 69739243D1
Authority
DE
Germany
Prior art keywords
radiation
phase
values
penetrating
obtaining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69739243T
Other languages
English (en)
Inventor
Stephen William Wilkins
Andrew Wesley Stevenson
Andrew Peter Pogany
Timur Gureyev
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
XRT Ltd
Original Assignee
XRT Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AUPO4344A external-priority patent/AUPO434496A0/en
Priority claimed from AUPO8991A external-priority patent/AUPO899197A0/en
Application filed by XRT Ltd filed Critical XRT Ltd
Application granted granted Critical
Publication of DE69739243D1 publication Critical patent/DE69739243D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02—Constructional details
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/482—Diagnostic techniques involving multiple energy imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Surgery (AREA)
  • Optics & Photonics (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biophysics (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
DE69739243T 1996-12-24 1997-12-24 Phasenbestimmung in einem phasenabbildungsverfahren Expired - Lifetime DE69739243D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AUPO4344A AUPO434496A0 (en) 1996-12-24 1996-12-24 Deriving a phase-contrast image with a point source
AUPO8991A AUPO899197A0 (en) 1997-09-05 1997-09-05 Deriving a phase-contrast image with a point source
PCT/AU1997/000882 WO1998028950A1 (en) 1996-12-24 1997-12-24 Phase retrieval in phase contrast imaging

Publications (1)

Publication Number Publication Date
DE69739243D1 true DE69739243D1 (de) 2009-03-19

Family

ID=25645337

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69739243T Expired - Lifetime DE69739243D1 (de) 1996-12-24 1997-12-24 Phasenbestimmung in einem phasenabbildungsverfahren

Country Status (13)

Country Link
US (2) US6226353B1 (de)
EP (1) EP0954951B1 (de)
JP (1) JP4436459B2 (de)
KR (1) KR100511470B1 (de)
CN (1) CN1214698C (de)
AT (1) ATE422285T1 (de)
AU (1) AU716800B2 (de)
CA (1) CA2276051C (de)
DE (1) DE69739243D1 (de)
HK (1) HK1026565A1 (de)
IL (1) IL130628A0 (de)
RU (1) RU2214697C2 (de)
WO (1) WO1998028950A1 (de)

Families Citing this family (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69739243D1 (de) * 1996-12-24 2009-03-19 Xrt Ltd Phasenbestimmung in einem phasenabbildungsverfahren
AUPP690098A0 (en) 1998-11-02 1998-11-26 University Of Melbourne, The Phase determination of a radiation wave field
DE60036161T3 (de) * 1999-07-16 2012-04-19 Konica Corp. Verfahren zur Aufnahme von Röntgenstrahlen-Bildern
US6526121B1 (en) * 2000-03-29 2003-02-25 Yeu-Kuang Hwu Apparatus and method for imaging an object with real-time response
JP2001299733A (ja) * 2000-04-27 2001-10-30 Konica Corp Ｐｃｉ放射線画像処理装置、ｐｃｉ放射線画像検出処理装置、ｐｃｉ放射線画像出力装置及びｐｃｉ画像診断支援装置
US6349128B1 (en) * 2000-04-27 2002-02-19 Philips Electronics North America Corporation Method and device using x-rays to measure thickness and composition of thin films
US6870896B2 (en) 2000-12-28 2005-03-22 Osmic, Inc. Dark-field phase contrast imaging
US6804324B2 (en) * 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
JP2002336232A (ja) * 2001-05-16 2002-11-26 Fuji Photo Film Co Ltd 位相コントラスト画像生成方法および装置並びにプログラム
US6792070B2 (en) * 2001-10-16 2004-09-14 Fuji Photo Film Co., Ltd. Radiation image recording method and apparatus
JP4137499B2 (ja) * 2002-04-23 2008-08-20 富士フイルム株式会社 位相情報復元方法及び位相情報復元装置、並びに、位相情報復元プログラム
US7171031B2 (en) * 2002-04-30 2007-01-30 Fuji Photo Film Co., Ltd. Method, apparatus, and program for restoring phase information
JP4137514B2 (ja) * 2002-05-16 2008-08-20 富士フイルム株式会社 放射線画像構成方法及びこれを使用する放射線撮像装置、並びに、放射線撮像プログラム
US20040052426A1 (en) * 2002-09-12 2004-03-18 Lockheed Martin Corporation Non-iterative method and system for phase retrieval
US7424173B2 (en) 2002-09-30 2008-09-09 Fujifilm Corporation Method, apparatus and program for restoring phase information
JP4137580B2 (ja) * 2002-10-04 2008-08-20 富士フイルム株式会社 位相情報復元方法及び位相情報復元装置、並びに、位相情報復元プログラム
US7103140B2 (en) * 2002-11-26 2006-09-05 Konica Minolta Medical & Graphic Inc. Radiation image radiographic apparatus
JP2004248736A (ja) * 2003-02-18 2004-09-09 Konica Minolta Holdings Inc 放射線画像撮影装置
KR101159380B1 (ko) * 2004-03-11 2012-06-27 이코스비젼 시스팀스 엔.브이. 파면 조정 및 향상된 3?ｄ 측정을 위한 방법 및 장치
US7286640B2 (en) * 2004-04-09 2007-10-23 Xradia, Inc. Dual-band detector system for x-ray imaging of biological samples
US7412024B1 (en) * 2004-04-09 2008-08-12 Xradia, Inc. X-ray mammography
GB0409572D0 (en) * 2004-04-29 2004-06-02 Univ Sheffield High resolution imaging
CN100442044C (zh) * 2004-12-15 2008-12-10 中国科学院上海光学精密机械研究所 中子干涉仪中位相恢复方法
US7634152B2 (en) * 2005-03-07 2009-12-15 Hewlett-Packard Development Company, L.P. System and method for correcting image vignetting
EP1943605A1 (de) * 2005-11-04 2008-07-16 Christian Hogl Verfahren und system zum übertragen von daten von einer ersten datenverarbeitungseinrichtung an eine zweite datenverarbeitungseinrichtung
JP4788887B2 (ja) * 2005-11-11 2011-10-05 独立行政法人物質・材料研究機構 透過電子顕微鏡
DE102006015356B4 (de) * 2006-02-01 2016-09-22 Siemens Healthcare Gmbh Verfahren zur Erzeugung projektiver und tomographischer Phasenkontrastaufnahmen mit einem Röntgen-System
WO2007100823A2 (en) * 2006-02-27 2007-09-07 University Of Rochester Phase contrast cone-beam ct imaging
US7564545B2 (en) * 2007-03-15 2009-07-21 Kla-Tencor Technologies Corp. Inspection methods and systems for lithographic masks
JP5438022B2 (ja) * 2007-11-26 2014-03-12 コーニンクレッカ フィリップス エヌ ヴェ Ｘ線位相コントラストイメージングの検出セットアップ
US7693256B2 (en) * 2008-03-19 2010-04-06 C-Rad Innovation Ab Phase-contrast X-ray imaging
JP4737724B2 (ja) * 2008-04-21 2011-08-03 コニカミノルタホールディングス株式会社 放射線画像処理装置
GB0817650D0 (en) * 2008-09-26 2008-11-05 Phase Focus Ltd Improvements in the field of imaging
WO2010119019A1 (de) * 2009-04-17 2010-10-21 Siemens Aktiengesellschaft Detektoranordnung und röntgentomographiegerät zur durchführung von phasenkontrastmessungen sowie verfahren zur durchführung einer phasenkontrastmessung
US8855265B2 (en) * 2009-06-16 2014-10-07 Koninklijke Philips N.V. Correction method for differential phase contrast imaging
US8705694B2 (en) * 2009-11-11 2014-04-22 Physical Optics Corporation X-ray imaging system and method
GB201020516D0 (en) * 2010-12-03 2011-01-19 Univ Sheffield Improvements in providing image data
DE102011077982B4 (de) * 2011-06-22 2017-11-30 Hochschule Bremen Verfahren und Vorrichtung zur optischen Analyse eines Prüflings
US9538970B2 (en) * 2012-01-12 2017-01-10 Koninklijke Philips N.V. Generating attenuation image data and phase image data in an X-ray system
CN102867294B (zh) * 2012-05-28 2015-06-17 天津大学 基于傅里叶和小波正则化的同轴相衬图像恢复方法
DE102012211146A1 (de) * 2012-06-28 2014-01-02 Siemens Aktiengesellschaft Verfahren und Röntgensystem zur Erzeugung einer Phasenkontrastdarstellung
AU2012258412A1 (en) * 2012-11-30 2014-06-19 Canon Kabushiki Kaisha Combining differential images by inverse Riesz transformation
US9364191B2 (en) 2013-02-11 2016-06-14 University Of Rochester Method and apparatus of spectral differential phase-contrast cone-beam CT and hybrid cone-beam CT
KR20140109192A (ko) * 2013-03-05 2014-09-15 삼성전자주식회사 엑스선 영상 장치 및 그 제어 방법
KR20140111818A (ko) * 2013-03-12 2014-09-22 삼성전자주식회사 엑스선 영상 장치 및 그 제어 방법
CN103559686B (zh) * 2013-10-16 2016-07-06 中国科学院深圳先进技术研究院 一种基于多面图像信息的同轴相衬成像相位恢复方法及系统
GB2519955B (en) * 2013-11-01 2015-09-30 Paragon Inspection Ltd Apparatus and method for radiological pipe inspection
WO2015067461A1 (en) * 2013-11-05 2015-05-14 Koninklijke Philips N.V. X-ray imaging device with fast spatial modulation of photon flux
TWI629474B (zh) * 2014-05-23 2018-07-11 財團法人工業技術研究院 Ｘ光光源以及ｘ光成像的方法
CN104323790B (zh) * 2014-10-27 2016-09-21 中国科学院深圳先进技术研究院 同轴相衬成像方法及系统和相衬ct方法及系统
EP3312619B1 (de) * 2016-10-19 2022-03-30 Rohde & Schwarz GmbH & Co. KG Testsystem und verfahren zum testen einer zu testenden vorrichtung
JP2019007802A (ja) * 2017-06-22 2019-01-17 株式会社東芝 光学検査装置及び光学検査方法
CN107432749B (zh) * 2017-07-05 2019-05-21 天津大学 一种x射线相衬成像的相位抽取方法
JP2021067456A (ja) * 2018-02-22 2021-04-30 株式会社ニコン Ｘ線画像生成方法、ｘ線装置および構造物の製造方法
JP7225432B2 (ja) * 2019-04-18 2023-02-20 プリズマティック、センサーズ、アクチボラグ 医療用透過ｘ線撮影におけるｘ線の操作に使用されるインラインｘ線集束光学系

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5005200A (en) * 1988-02-12 1991-04-02 Fischer Addison M Public key/signature cryptosystem with enhanced digital signature certification
US5241364A (en) 1990-10-19 1993-08-31 Fuji Photo Film Co., Ltd. Confocal scanning type of phase contrast microscope and scanning microscope
WO1995005725A1 (en) * 1993-08-16 1995-02-23 Commonwealth Scientific And Industrial Research Organisation Improved x-ray optics, especially for phase contrast imaging
DE4432811B4 (de) * 1993-09-15 2006-04-13 Carl Zeiss Phasenkontrast-Röntgenmikroskop
JP3449791B2 (ja) * 1994-08-23 2003-09-22 理化学研究所 撮像方法及び撮像装置
US5646997A (en) * 1994-12-14 1997-07-08 Barton; James M. Method and apparatus for embedding authentication information within digital data
EP0808465B1 (de) * 1995-02-10 2003-08-13 NexRay, Inc. Abbildungssystem mit röntgenstrahlabtastung
ATE419586T1 (de) * 1995-02-13 2009-01-15 Intertrust Tech Corp Systeme und verfahren zur gesicherten transaktionsverwaltung und elektronischem rechtsschutz
AUPN201295A0 (en) * 1995-03-28 1995-04-27 Commonwealth Scientific And Industrial Research Organisation Simplified conditions and configurations for phase-contrast imaging with hard x-rays
EP0830632B9 (de) * 1995-04-28 2002-12-18 Forskningscenter Riso Phasenkontrastbilderzeugung
EP0799600B1 (de) * 1996-03-29 2004-09-08 Hitachi, Ltd. Bilderzeugungssystem mit Phasenkontrast für Röntgenstrahlen
US5844986A (en) * 1996-09-30 1998-12-01 Intel Corporation Secure BIOS
DE69739243D1 (de) * 1996-12-24 2009-03-19 Xrt Ltd Phasenbestimmung in einem phasenabbildungsverfahren

Also Published As

Publication number Publication date
US6493422B2 (en) 2002-12-10
JP4436459B2 (ja) 2010-03-24
US20020041653A1 (en) 2002-04-11
CA2276051A1 (en) 1998-07-02
CA2276051C (en) 2005-10-18
EP0954951A1 (de) 1999-11-10
AU716800B2 (en) 2000-03-09
KR100511470B1 (ko) 2005-08-31
RU2214697C2 (ru) 2003-10-20
CN1247687A (zh) 2000-03-15
EP0954951B1 (de) 2009-02-04
JP2001506160A (ja) 2001-05-15
CN1214698C (zh) 2005-08-10
ATE422285T1 (de) 2009-02-15
KR20000069718A (ko) 2000-11-25
WO1998028950A1 (en) 1998-07-02
IL130628A0 (en) 2000-06-01
EP0954951A4 (de) 2005-02-16
AU7876798A (en) 1998-07-17
HK1026565A1 (en) 2000-12-15
US6226353B1 (en) 2001-05-01

Similar Documents

Publication Publication Date Title
DE69739243D1 (de) Phasenbestimmung in einem phasenabbildungsverfahren
RU99116264A (ru) Способ нахождения фазы при получении фазовых контрастных изображений
IT1083683B (it) Apparecchio per tomografia
ATE2863T1 (de) Vorrichtung und verfahren zur akustischen pruefung eines mikroskopisch kleinen teils eines objekts.
EP0746756A4 (de) Vorrichtung und verfahren zur bestimmung eines ersten parameters eines objektes
CN105404128B (zh) 多帧相移数字全息方法及装置
CN103728324A (zh) 一种核燃料组件高能x射线无损检测装置
EP0361770A3 (de) Verfahren und Vorrichtung zur Messung von Partikeln
TW352426B (en) Coin testing apparatus and method
CA2122782A1 (en) Apparatus for Measuring an Ambient Physical Parameter Applied to a Highly Birefringent Sensing Fiber and Method
Rohe et al. Structural Dynamic Measurements using High-Speed X-Ray Digital Image Correlation.
JPS55112502A (en) Plate automatic examination unit
CA2175455A1 (en) Imaging System and Method Using Direct Reconstruction of Scattered Radiation
WO2003077724A3 (en) Method for improving the accuracy of data obtained in a laser imaging apparatus
WO2005103632A3 (en) Irradiation system having cybernetic parameter acquisition system
CN109782432A (zh) 基于空间光调制器的汇聚透镜single-shot叠层相位恢复技术
CN109724690A (zh) 基于光谱角度填图的纹影法远场测量焦斑自动重构方法
CN203949886U (zh) 一种核燃料组件高能x射线无损检测装置
Valente et al. Design of an integral radiation dosimetry system optimized for modern medical applications
O’Neill et al. External beam profiles measured with film or ionization chamber
GAMO Imaging of incoherent objects by intensity correlation interferometry[Final Report, Oct. 1971- Sep. 1976]
Aiello et al. The beam profile monitors for ELETTRA
JPS5410791A (en) Measurement of electron-spin resonance
JPS6444882A (en) Method for measuring ion beam
Mens et al. High-dynamic-range image readout system

Legal Events

Date Code Title Description
8364 No opposition during term of opposition