DE69730367T2 - Bildsignalausleseschaltung mit Offset-Korrektur - Google Patents
Bildsignalausleseschaltung mit Offset-Korrektur Download PDFInfo
- Publication number
- DE69730367T2 DE69730367T2 DE69730367T DE69730367T DE69730367T2 DE 69730367 T2 DE69730367 T2 DE 69730367T2 DE 69730367 T DE69730367 T DE 69730367T DE 69730367 T DE69730367 T DE 69730367T DE 69730367 T2 DE69730367 T2 DE 69730367T2
- Authority
- DE
- Germany
- Prior art keywords
- circuit
- output
- differential
- offset correction
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012937 correction Methods 0.000 title claims description 38
- 238000012546 transfer Methods 0.000 claims description 28
- 238000000034 method Methods 0.000 claims description 16
- 230000004044 response Effects 0.000 claims description 6
- 230000000977 initiatory effect Effects 0.000 claims 1
- 230000005540 biological transmission Effects 0.000 description 64
- 230000010354 integration Effects 0.000 description 27
- 239000003990 capacitor Substances 0.000 description 26
- 238000012545 processing Methods 0.000 description 19
- 238000010586 diagram Methods 0.000 description 15
- HBGGXOJOCNVPFY-UHFFFAOYSA-N diisononyl phthalate Chemical compound CC(C)CCCCCCOC(=O)C1=CC=CC=C1C(=O)OCCCCCCC(C)C HBGGXOJOCNVPFY-UHFFFAOYSA-N 0.000 description 11
- 238000012360 testing method Methods 0.000 description 11
- 230000033001 locomotion Effects 0.000 description 10
- 238000005286 illumination Methods 0.000 description 9
- 102100035474 DNA polymerase kappa Human genes 0.000 description 8
- 101710108091 DNA polymerase kappa Proteins 0.000 description 8
- 239000000758 substrate Substances 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 108091008695 photoreceptors Proteins 0.000 description 6
- 238000002310 reflectometry Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 239000000835 fiber Substances 0.000 description 5
- 230000006870 function Effects 0.000 description 5
- 230000003321 amplification Effects 0.000 description 4
- 230000008901 benefit Effects 0.000 description 4
- 230000007850 degeneration Effects 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 4
- 238000003199 nucleic acid amplification method Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 238000005070 sampling Methods 0.000 description 4
- 238000012935 Averaging Methods 0.000 description 3
- 230000002411 adverse Effects 0.000 description 3
- 238000013459 approach Methods 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 230000003071 parasitic effect Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000007726 management method Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
- 101100384801 Bos taurus CGN1 gene Proteins 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000005314 correlation function Methods 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000011143 downstream manufacturing Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
- H03F1/303—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters using a switching device
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/04—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
- H03F3/08—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light
- H03F3/087—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light with IC amplifier blocks
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
- H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/701—Line sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/767—Horizontal readout lines, multiplexers or registers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/249—A switch coupled in the input circuit of an amplifier being controlled by a circuit, e.g. feedback circuitry being controlling the switch
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45212—Indexing scheme relating to differential amplifiers the differential amplifier being designed to have a reduced offset
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Power Engineering (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Facsimile Scanning Arrangements (AREA)
- Facsimile Heads (AREA)
- Light Receiving Elements (AREA)
- Amplifiers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US591076 | 1996-01-25 | ||
| US08/591,076 US5703353A (en) | 1996-01-25 | 1996-01-25 | Offset removal and spatial frequency band filtering circuitry for photoreceiver signals |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE69730367D1 DE69730367D1 (de) | 2004-09-30 |
| DE69730367T2 true DE69730367T2 (de) | 2005-09-01 |
Family
ID=24364959
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69730367T Expired - Lifetime DE69730367T2 (de) | 1996-01-25 | 1997-01-13 | Bildsignalausleseschaltung mit Offset-Korrektur |
| DE69737665T Expired - Lifetime DE69737665T2 (de) | 1996-01-25 | 1997-01-13 | Signalübertragungsschaltung mit Offset-Korrektur |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69737665T Expired - Lifetime DE69737665T2 (de) | 1996-01-25 | 1997-01-13 | Signalübertragungsschaltung mit Offset-Korrektur |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US5703353A (cg-RX-API-DMAC7.html) |
| EP (2) | EP0786899B1 (cg-RX-API-DMAC7.html) |
| JP (2) | JP3956242B2 (cg-RX-API-DMAC7.html) |
| DE (2) | DE69730367T2 (cg-RX-API-DMAC7.html) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6256016B1 (en) | 1997-06-05 | 2001-07-03 | Logitech, Inc. | Optical detection system, device, and method utilizing optical matching |
| US6025935A (en) * | 1997-12-31 | 2000-02-15 | Peripheral Imaging Corporation | Charge storage image scanner having equalizing pre-charge and reset improvements |
| US6233368B1 (en) * | 1998-03-18 | 2001-05-15 | Agilent Technologies, Inc. | CMOS digital optical navigation chip |
| US6002124A (en) * | 1998-03-20 | 1999-12-14 | Hewlett-Packard Company | Portable image scanner with optical position sensors |
| US6188058B1 (en) | 1998-09-17 | 2001-02-13 | Agilent Technologies Inc. | System for taking displacement measurements having photosensors with imaged pattern arrangement |
| US6118132A (en) * | 1998-09-17 | 2000-09-12 | Agilent Technologies | System for measuring the velocity, displacement and strain on a moving surface or web of material |
| US6304826B1 (en) * | 1999-02-05 | 2001-10-16 | Syscan, Inc. | Self-calibration method and circuit architecture of image sensor |
| US6246050B1 (en) | 1999-03-08 | 2001-06-12 | Hewlett-Packard Company | Optical encoders using non-patterned targets |
| US6633332B1 (en) | 1999-05-13 | 2003-10-14 | Hewlett-Packard Development Company, L.P. | Digital camera system and method capable of performing document scans |
| US6362465B1 (en) | 1999-06-14 | 2002-03-26 | Hewlett-Packard Company | Optical scanning system and method capable of receiving inputs from a user |
| US6975355B1 (en) | 2000-02-22 | 2005-12-13 | Pixim, Inc. | Multiple sampling via a time-indexed method to achieve wide dynamic ranges |
| US6312124B1 (en) | 1999-10-27 | 2001-11-06 | Hewlett-Packard Company | Solid and semi-flexible body inkjet printing system |
| US6297984B1 (en) * | 1999-12-29 | 2001-10-02 | Tower Semiconductor Ltd. | Structure and method for protecting integrated circuits during plasma processing |
| US7161578B1 (en) | 2000-08-02 | 2007-01-09 | Logitech Europe S.A. | Universal presentation device |
| US7035932B1 (en) * | 2000-10-27 | 2006-04-25 | Eric Morgan Dowling | Federated multiprotocol communication |
| US6781570B1 (en) | 2000-11-09 | 2004-08-24 | Logitech Europe S.A. | Wireless optical input device |
| US6657487B2 (en) * | 2001-02-05 | 2003-12-02 | Em(Us) Design, Inc | Photodetector preamplifier circuit having a rotating input stage |
| US7333083B1 (en) | 2001-05-10 | 2008-02-19 | Logitech Europe S.A. | Optical based performance improvement for an optical illumination configuration |
| US6617565B2 (en) * | 2001-11-06 | 2003-09-09 | Omnivision Technologies, Inc. | CMOS image sensor with on-chip pattern recognition |
| US6788875B1 (en) | 2002-04-08 | 2004-09-07 | Logitech Europe S.A. | Suspension system for use in an optical displacement detection system |
| US7131751B1 (en) | 2002-04-12 | 2006-11-07 | Logitech, Inc. | Attachment system for use in an optical illumination system |
| US6876233B1 (en) | 2003-02-15 | 2005-04-05 | Medtronics, Inc. | DC cancellation apparatus and method |
| US7515188B2 (en) * | 2004-07-16 | 2009-04-07 | Micron Technology, Inc. | Method and system for reducing mismatch between reference and intensity paths in analog to digital converters in CMOS active pixel sensors |
| KR100790259B1 (ko) | 2005-12-14 | 2008-01-02 | 매그나칩 반도체 유한회사 | 아날로그 디지털 컨버터, 이를 구비한 시모스 이미지 센서및 아날로그 옵셋 제거방법 |
| JP4978022B2 (ja) * | 2006-02-16 | 2012-07-18 | 富士通セミコンダクター株式会社 | 演算増幅器 |
| JP5495864B2 (ja) * | 2010-03-08 | 2014-05-21 | キヤノン株式会社 | 光電変換装置 |
| JP5360270B2 (ja) * | 2011-12-07 | 2013-12-04 | 凸版印刷株式会社 | 液晶表示装置 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3937874A (en) * | 1975-01-09 | 1976-02-10 | General Electric Company | Offset voltage correction circuit for multiple video channel imager |
| US4409483A (en) * | 1980-10-07 | 1983-10-11 | Westinghouse Electric Corp. | Radiant energy differential sensor system |
| US4400729A (en) * | 1980-12-03 | 1983-08-23 | Jones George R | Pseudo-DC restore application to staring array detectors |
| DE3049043A1 (de) * | 1980-12-24 | 1982-07-15 | Robert Bosch Gmbh, 7000 Stuttgart | Verfahren und anordnung zur unterdrueckung des niederfrequenten rauschens bei ausgangssignalen von halbleiter- sensoren |
| JPS6152012A (ja) * | 1984-08-22 | 1986-03-14 | Hitachi Ltd | 差動増幅回路 |
| US4884039A (en) * | 1988-09-09 | 1989-11-28 | Texas Instruments Incorporated | Differential amplifier with low noise offset compensation |
| US4940981A (en) * | 1989-02-08 | 1990-07-10 | Burr-Brown Corporation | Dual analog-to-digital converter with single successive approximation register |
| JP2931088B2 (ja) * | 1990-11-30 | 1999-08-09 | キヤノン株式会社 | マルチチップ型光電変換装置 |
| US5149980A (en) * | 1991-11-01 | 1992-09-22 | Hewlett-Packard Company | Substrate advance measurement system using cross-correlation of light sensor array signals |
| JPH05219440A (ja) * | 1992-02-07 | 1993-08-27 | Olympus Optical Co Ltd | 画像入力装置 |
| JP2988795B2 (ja) * | 1992-05-29 | 1999-12-13 | シャープ株式会社 | 受光増幅装置 |
| US5352884A (en) * | 1993-04-14 | 1994-10-04 | General Electric Corporation | Method and apparatus for providing offset for light detector |
| FR2728420B1 (fr) * | 1994-12-16 | 1997-01-24 | Thomson Csf | Procede de compensation electronique des non-uniformites dans la detection d'images, en particulier infrarouge, et circuit de correction pour sa mise en oeuvre |
-
1996
- 1996-01-25 US US08/591,076 patent/US5703353A/en not_active Expired - Lifetime
-
1997
- 1997-01-07 JP JP00082897A patent/JP3956242B2/ja not_active Expired - Lifetime
- 1997-01-13 EP EP97300163A patent/EP0786899B1/en not_active Expired - Lifetime
- 1997-01-13 DE DE69730367T patent/DE69730367T2/de not_active Expired - Lifetime
- 1997-01-13 DE DE69737665T patent/DE69737665T2/de not_active Expired - Lifetime
- 1997-01-13 EP EP01117841A patent/EP1175090B1/en not_active Expired - Lifetime
- 1997-09-05 US US08/924,161 patent/US5900625A/en not_active Expired - Lifetime
-
2003
- 2003-12-26 JP JP2003434480A patent/JP4027308B2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2004120801A (ja) | 2004-04-15 |
| JP3956242B2 (ja) | 2007-08-08 |
| DE69737665T2 (de) | 2007-12-27 |
| JP4027308B2 (ja) | 2007-12-26 |
| EP1175090A1 (en) | 2002-01-23 |
| US5900625A (en) | 1999-05-04 |
| DE69737665D1 (de) | 2007-06-06 |
| DE69730367D1 (de) | 2004-09-30 |
| JPH10136149A (ja) | 1998-05-22 |
| EP0786899A3 (en) | 1998-10-14 |
| EP0786899B1 (en) | 2004-08-25 |
| EP1175090B1 (en) | 2007-04-25 |
| EP0786899A2 (en) | 1997-07-30 |
| US5703353A (en) | 1997-12-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8327 | Change in the person/name/address of the patent owner |
Owner name: HEWLETT-PACKARD DEVELOPMENT CO., L.P., HOUSTON, TE Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA |
|
| 8364 | No opposition during term of opposition | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA |
|
| 8327 | Change in the person/name/address of the patent owner |
Owner name: AVAGO TECHNOLOGIES SENSOR IP (SINGAPORE) PTE. LTD. |
|
| 8327 | Change in the person/name/address of the patent owner |
Owner name: MICRON TECHNOLOGY, INC., BOISE, ID., US |
|
| 8327 | Change in the person/name/address of the patent owner |
Owner name: APTINA IMAGING CORP., GRAND CAYMAN, CAYMAN ISL, KY |