DE69717900D1 - Reinigungsmittelzusammensetzung für Photoresist und Verfahren zur Herstellung eines halbleitenden integrierten Schaltkreises - Google Patents
Reinigungsmittelzusammensetzung für Photoresist und Verfahren zur Herstellung eines halbleitenden integrierten SchaltkreisesInfo
- Publication number
- DE69717900D1 DE69717900D1 DE69717900T DE69717900T DE69717900D1 DE 69717900 D1 DE69717900 D1 DE 69717900D1 DE 69717900 T DE69717900 T DE 69717900T DE 69717900 T DE69717900 T DE 69717900T DE 69717900 D1 DE69717900 D1 DE 69717900D1
- Authority
- DE
- Germany
- Prior art keywords
- photoresist
- manufacturing
- integrated circuit
- detergent composition
- semiconducting integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000003599 detergent Substances 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 title 1
- 229920002120 photoresistant polymer Polymers 0.000 title 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
- H01L21/02068—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
- H01L21/02071—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers the processing being a delineation, e.g. RIE, of conductive layers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
- G03F7/422—Stripping or agents therefor using liquids only
- G03F7/425—Stripping or agents therefor using liquids only containing mineral alkaline compounds; containing organic basic compounds, e.g. quaternary ammonium compounds; containing heterocyclic basic compounds containing nitrogen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31127—Etching organic layers
- H01L21/31133—Etching organic layers by chemical means
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Drying Of Semiconductors (AREA)
- Weting (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP09152196A JP3614242B2 (ja) | 1996-04-12 | 1996-04-12 | フォトレジスト剥離剤及び半導体集積回路の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69717900D1 true DE69717900D1 (de) | 2003-01-30 |
DE69717900T2 DE69717900T2 (de) | 2003-04-30 |
Family
ID=14028728
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69717900T Expired - Fee Related DE69717900T2 (de) | 1996-04-12 | 1997-04-03 | Reinigungsmittelzusammensetzung für Photoresist und Verfahren zur Herstellung eines halbleitenden integrierten Schaltkreises |
Country Status (9)
Country | Link |
---|---|
US (1) | US5846695A (de) |
EP (1) | EP0801422B1 (de) |
JP (1) | JP3614242B2 (de) |
KR (1) | KR100455299B1 (de) |
DE (1) | DE69717900T2 (de) |
ID (1) | ID16581A (de) |
MY (1) | MY129085A (de) |
SG (1) | SG76509A1 (de) |
TW (1) | TW351830B (de) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1168095A (ja) * | 1997-08-11 | 1999-03-09 | Fujitsu Ltd | 半導体装置の製造方法 |
US7547669B2 (en) | 1998-07-06 | 2009-06-16 | Ekc Technology, Inc. | Remover compositions for dual damascene system |
US7579308B2 (en) | 1998-07-06 | 2009-08-25 | Ekc/Dupont Electronics Technologies | Compositions and processes for photoresist stripping and residue removal in wafer level packaging |
US7135445B2 (en) * | 2001-12-04 | 2006-11-14 | Ekc Technology, Inc. | Process for the use of bis-choline and tris-choline in the cleaning of quartz-coated polysilicon and other materials |
US6348239B1 (en) * | 2000-04-28 | 2002-02-19 | Simon Fraser University | Method for depositing metal and metal oxide films and patterned films |
FR2793952B1 (fr) * | 1999-05-21 | 2001-08-31 | Commissariat Energie Atomique | Procede de realisation d'un niveau d'interconnexion de type damascene comprenant un dielectrique organique |
JP3410403B2 (ja) | 1999-09-10 | 2003-05-26 | 東京応化工業株式会社 | ホトレジスト用剥離液およびこれを用いたホトレジスト剥離方法 |
KR100360985B1 (ko) * | 2000-04-26 | 2002-11-18 | 주식회사 동진쎄미켐 | 레지스트 스트리퍼 조성물 |
JP2002016034A (ja) * | 2000-06-30 | 2002-01-18 | Mitsubishi Electric Corp | 半導体装置の製造方法、及び半導体装置 |
US7543592B2 (en) * | 2001-12-04 | 2009-06-09 | Ekc Technology, Inc. | Compositions and processes for photoresist stripping and residue removal in wafer level packaging |
TWI295076B (en) * | 2002-09-19 | 2008-03-21 | Dongwoo Fine Chem Co Ltd | Washing liquid for semiconductor substrate and method of producing semiconductor device |
US7199059B2 (en) * | 2004-10-26 | 2007-04-03 | United Microelectronics Corp. | Method for removing polymer as etching residue |
US20060094613A1 (en) * | 2004-10-29 | 2006-05-04 | Lee Wai M | Compositions and processes for photoresist stripping and residue removal in wafer level packaging |
US20060094612A1 (en) * | 2004-11-04 | 2006-05-04 | Mayumi Kimura | Post etch cleaning composition for use with substrates having aluminum |
JP5224228B2 (ja) * | 2006-09-15 | 2013-07-03 | Nltテクノロジー株式会社 | 薬液を用いた基板処理方法 |
US8900802B2 (en) | 2013-02-23 | 2014-12-02 | International Business Machines Corporation | Positive tone organic solvent developed chemically amplified resist |
CN104678719A (zh) * | 2013-11-28 | 2015-06-03 | 安集微电子科技(上海)有限公司 | 一种对金属极低腐蚀的光刻胶清洗液 |
JP5885041B1 (ja) * | 2014-10-27 | 2016-03-15 | パナソニックIpマネジメント株式会社 | レジスト剥離液 |
JP5885046B1 (ja) * | 2015-03-24 | 2016-03-15 | パナソニックIpマネジメント株式会社 | レジスト剥離液 |
CN107577121A (zh) * | 2017-08-29 | 2018-01-12 | 昆山艾森半导体材料有限公司 | 一种光刻胶去胶液 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3501675A1 (de) * | 1985-01-19 | 1986-07-24 | Merck Patent Gmbh, 6100 Darmstadt | Mittel und verfahren zur entfernung von fotoresist- und stripperresten von halbleitersubstraten |
US5102777A (en) * | 1990-02-01 | 1992-04-07 | Ardrox Inc. | Resist stripping |
US5091103A (en) * | 1990-05-01 | 1992-02-25 | Alicia Dean | Photoresist stripper |
JP2906590B2 (ja) * | 1990-06-14 | 1999-06-21 | 三菱瓦斯化学株式会社 | アルミニウム配線半導体基板の表面処理剤 |
US5279771A (en) * | 1990-11-05 | 1994-01-18 | Ekc Technology, Inc. | Stripping compositions comprising hydroxylamine and alkanolamine |
DE69333877T2 (de) * | 1992-07-09 | 2006-06-14 | Ekc Technology Inc | Reinigungsmittelzusammensetzung, das einem Redox Aminverbindung enthält |
JP3302120B2 (ja) * | 1993-07-08 | 2002-07-15 | 関東化学株式会社 | レジスト用剥離液 |
US6326130B1 (en) * | 1993-10-07 | 2001-12-04 | Mallinckrodt Baker, Inc. | Photoresist strippers containing reducing agents to reduce metal corrosion |
JPH07283204A (ja) * | 1994-04-13 | 1995-10-27 | Mitsubishi Gas Chem Co Inc | 半導体装置用洗浄剤および配線パターンの形成方法 |
US5567574A (en) * | 1995-01-10 | 1996-10-22 | Mitsubishi Gas Chemical Company, Inc. | Removing agent composition for photoresist and method of removing |
US5612304A (en) * | 1995-07-07 | 1997-03-18 | Olin Microelectronic Chemicals, Inc. | Redox reagent-containing post-etch residue cleaning composition |
-
1996
- 1996-04-12 JP JP09152196A patent/JP3614242B2/ja not_active Expired - Fee Related
-
1997
- 1997-03-26 US US08/829,697 patent/US5846695A/en not_active Expired - Fee Related
- 1997-03-31 SG SG1997001012A patent/SG76509A1/en unknown
- 1997-04-03 EP EP97105547A patent/EP0801422B1/de not_active Expired - Lifetime
- 1997-04-03 DE DE69717900T patent/DE69717900T2/de not_active Expired - Fee Related
- 1997-04-08 TW TW086104445A patent/TW351830B/zh active
- 1997-04-10 KR KR1019970013173A patent/KR100455299B1/ko not_active IP Right Cessation
- 1997-04-11 MY MYPI97001597A patent/MY129085A/en unknown
- 1997-04-14 ID IDP971221A patent/ID16581A/id unknown
Also Published As
Publication number | Publication date |
---|---|
JP3614242B2 (ja) | 2005-01-26 |
MY129085A (en) | 2007-03-30 |
EP0801422A2 (de) | 1997-10-15 |
KR100455299B1 (ko) | 2005-01-15 |
TW351830B (en) | 1999-02-01 |
SG76509A1 (en) | 2000-11-21 |
EP0801422B1 (de) | 2002-12-18 |
US5846695A (en) | 1998-12-08 |
DE69717900T2 (de) | 2003-04-30 |
KR970072184A (ko) | 1997-11-07 |
ID16581A (id) | 1997-10-16 |
JPH09283507A (ja) | 1997-10-31 |
EP0801422A3 (de) | 1998-04-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |