DE69717748T2 - Frequenz-Getrenntlagelaser mit zwei harmonischen Wellenlängen - Google Patents

Frequenz-Getrenntlagelaser mit zwei harmonischen Wellenlängen

Info

Publication number
DE69717748T2
DE69717748T2 DE69717748T DE69717748T DE69717748T2 DE 69717748 T2 DE69717748 T2 DE 69717748T2 DE 69717748 T DE69717748 T DE 69717748T DE 69717748 T DE69717748 T DE 69717748T DE 69717748 T2 DE69717748 T2 DE 69717748T2
Authority
DE
Germany
Prior art keywords
frequency separation
harmonic wavelengths
separation laser
laser
harmonic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69717748T
Other languages
English (en)
Other versions
DE69717748D1 (de
Inventor
Paul Zorabedian
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of DE69717748D1 publication Critical patent/DE69717748D1/de
Publication of DE69717748T2 publication Critical patent/DE69717748T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/106—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
    • H01S3/108—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using non-linear optical devices, e.g. exhibiting Brillouin or Raman scattering
    • H01S3/109—Frequency multiplication, e.g. harmonic generation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02007—Two or more frequencies or sources used for interferometric measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
    • H01S3/08—Construction or shape of optical resonators or components thereof
    • H01S3/08086—Multiple-wavelength emission
    • H01S3/0809—Two-wavelenghth emission
DE69717748T 1996-09-20 1997-09-05 Frequenz-Getrenntlagelaser mit zwei harmonischen Wellenlängen Expired - Fee Related DE69717748T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/717,386 US5732095A (en) 1996-09-20 1996-09-20 Dual harmonic-wavelength split-frequency laser

Publications (2)

Publication Number Publication Date
DE69717748D1 DE69717748D1 (de) 2003-01-23
DE69717748T2 true DE69717748T2 (de) 2003-07-10

Family

ID=24881822

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69717748T Expired - Fee Related DE69717748T2 (de) 1996-09-20 1997-09-05 Frequenz-Getrenntlagelaser mit zwei harmonischen Wellenlängen

Country Status (5)

Country Link
US (1) US5732095A (de)
EP (1) EP0831568B1 (de)
JP (1) JP3798127B2 (de)
DE (1) DE69717748T2 (de)
SG (1) SG54503A1 (de)

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US6212209B1 (en) * 1998-03-16 2001-04-03 Lucent Technologies, Inc. Switchable laser using a faraday rotator
US6188484B1 (en) 1998-10-29 2001-02-13 Maxtor Corporation Method and apparatus for measuring angular displacement of an actuator arm relative to a reference position
US6014216A (en) * 1999-01-08 2000-01-11 Hewlett-Packard Company Architecture for air-turbulence-compensated dual-wavelength heterodyne interferometer
US6724486B1 (en) 1999-04-28 2004-04-20 Zygo Corporation Helium- Neon laser light source generating two harmonically related, single- frequency wavelengths for use in displacement and dispersion measuring interferometry
JP4719918B2 (ja) * 1999-08-18 2011-07-06 独立行政法人 日本原子力研究開発機構 レーザー光の波長変換法
US6724787B2 (en) * 2000-12-08 2004-04-20 Melles Griot, Inc. Low noise solid state laser
US6595920B2 (en) 2001-05-21 2003-07-22 The Ohio State University Non-contact instrument for measurement of internal optical pressure
TWI255961B (en) * 2003-05-26 2006-06-01 Mitsubishi Electric Corp Wavelength conversion method, wavelength conversion laser, and laser processing apparatus
JP2005107449A (ja) * 2003-10-02 2005-04-21 National Institute Of Information & Communication Technology 偶数個の非線形結晶を用いた緑色コヒーレント光の発生装置
JP2009300263A (ja) * 2008-06-13 2009-12-24 Mitsutoyo Corp ２波長レーザ干渉計および２波長レーザ干渉計の光軸調整方法
US9482755B2 (en) 2008-11-17 2016-11-01 Faro Technologies, Inc. Measurement system having air temperature compensation between a target and a laser tracker
US9772394B2 (en) 2010-04-21 2017-09-26 Faro Technologies, Inc. Method and apparatus for following an operator and locking onto a retroreflector with a laser tracker
US9377885B2 (en) 2010-04-21 2016-06-28 Faro Technologies, Inc. Method and apparatus for locking onto a retroreflector with a laser tracker
US9400170B2 (en) 2010-04-21 2016-07-26 Faro Technologies, Inc. Automatic measurement of dimensional data within an acceptance region by a laser tracker
GB2503390B (en) 2011-03-03 2014-10-29 Faro Tech Inc Target apparatus and method
US9686532B2 (en) 2011-04-15 2017-06-20 Faro Technologies, Inc. System and method of acquiring three-dimensional coordinates using multiple coordinate measurement devices
US9164173B2 (en) 2011-04-15 2015-10-20 Faro Technologies, Inc. Laser tracker that uses a fiber-optic coupler and an achromatic launch to align and collimate two wavelengths of light
US9482529B2 (en) 2011-04-15 2016-11-01 Faro Technologies, Inc. Three-dimensional coordinate scanner and method of operation
JP2014516409A (ja) * 2011-04-15 2014-07-10 ファロ テクノロジーズ インコーポレーテッド レーザトラッカの改良位置検出器
DE112013000727T5 (de) 2012-01-27 2014-11-06 Faro Technologies, Inc. Prüfverfahren mit Strichcode-Kennzeichnung
WO2014095264A1 (de) 2012-12-18 2014-06-26 Rofin-Sinar Laser Gmbh Einrichtung zur frequenzumwandlung eines mit einer ersten frequenz von einer laserstrahlquelle erzeugten laserstrahls
US9188430B2 (en) 2013-03-14 2015-11-17 Faro Technologies, Inc. Compensation of a structured light scanner that is tracked in six degrees-of-freedom
US9041914B2 (en) 2013-03-15 2015-05-26 Faro Technologies, Inc. Three-dimensional coordinate scanner and method of operation
US9395174B2 (en) 2014-06-27 2016-07-19 Faro Technologies, Inc. Determining retroreflector orientation by optimizing spatial fit
CN106684691B (zh) * 2015-11-09 2019-11-12 中国科学院大连化学物理研究所 一种腔内三倍频的复合腔
CN111215027A (zh) * 2018-11-26 2020-06-02 中国科学院大连化学物理研究所 一种水热碳微球色谱介质的修饰方法
CN110548510A (zh) * 2019-08-26 2019-12-10 冷水江三A新材料科技有限公司 一种流化床酯加氢Cu/SiO2微球催化剂及其制备方法、应用
RU2728491C1 (ru) * 2019-12-30 2020-07-29 Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" (Госкорпорация "Росатом") Способ настройки преобразователя частоты лазерного излучения в третью гармонику
CN112736634B (zh) * 2021-01-12 2024-05-07 中国人民解放军国防科技大学 一种基于y型腔正交偏振激光器的一体化激光传感装置
CN113117455B (zh) * 2021-04-12 2022-11-22 江西师范大学 氯化胆碱-甘油低共熔溶剂在吸收HCl气体中的应用
CN114388273B (zh) * 2022-01-07 2022-10-14 青海大学 一种花青素敏化的P5FIn/ITO纳米复合材料的制备方法及其应用
US20230402810A1 (en) * 2022-03-26 2023-12-14 Pavilion Integration Corporation A laser with two longitudinal modes at different wavelengths with orthogonal polarizations

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Publication number Priority date Publication date Assignee Title
JP3270641B2 (ja) * 1993-11-30 2002-04-02 富士写真フイルム株式会社 固体レーザー
US4687958A (en) * 1985-03-12 1987-08-18 Zygo Corporation Apparatus to transform a single frequency, linearly polarized laser beam into a high efficiency beam with two, orthogonally polarized frequencies
US4884277A (en) * 1988-02-18 1989-11-28 Amoco Corporation Frequency conversion of optical radiation
FR2658367B1 (fr) * 1990-02-13 1992-06-05 Sagem Laser fournissant deux ondes a des frequences differentes.
US5047668A (en) * 1990-06-26 1991-09-10 Cornell Research Foundation, Inc. Optical walkoff compensation in critically phase-matched three-wave frequency conversion systems
DE4032323A1 (de) * 1990-10-11 1992-04-16 Adlas Gmbh & Co Kg Einzelmode-laser
US5263038A (en) * 1991-02-28 1993-11-16 Amoco Corporation Frequency filtered solid-state laser
US5404222A (en) * 1994-01-14 1995-04-04 Sparta, Inc. Interferametric measuring system with air turbulence compensation
JPH07230061A (ja) * 1994-02-17 1995-08-29 Fuji Photo Film Co Ltd 偏光コヒーレント合波レーザ

Also Published As

Publication number Publication date
EP0831568B1 (de) 2002-12-11
JP3798127B2 (ja) 2006-07-19
EP0831568A3 (de) 1999-08-04
DE69717748D1 (de) 2003-01-23
SG54503A1 (en) 1998-11-16
EP0831568A2 (de) 1998-03-25
US5732095A (en) 1998-03-24
JPH10107357A (ja) 1998-04-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee