JPH08204530A
(ja)
*
|
1995-01-23 |
1996-08-09 |
Sony Corp |
スイツチ回路
|
JP3310203B2
(ja)
*
|
1997-07-25 |
2002-08-05 |
株式会社東芝 |
高周波スイッチ装置
|
JP3711193B2
(ja)
*
|
1998-01-16 |
2005-10-26 |
三菱電機株式会社 |
送受信切り換え回路
|
JP3637830B2
(ja)
*
|
2000-02-22 |
2005-04-13 |
株式会社村田製作所 |
Spdtスイッチおよびそれを用いた通信機
|
JP2002050980A
(ja)
*
|
2000-08-04 |
2002-02-15 |
Matsushita Electric Ind Co Ltd |
高周波スイッチおよびそれを用いた無線通信機
|
JP3616343B2
(ja)
*
|
2001-03-27 |
2005-02-02 |
松下電器産業株式会社 |
高周波スイッチ回路およびそれを用いた通信端末装置
|
JP2002368194A
(ja)
|
2001-06-08 |
2002-12-20 |
Sanyo Electric Co Ltd |
化合物半導体スイッチ回路装置
|
US6804502B2
(en)
|
2001-10-10 |
2004-10-12 |
Peregrine Semiconductor Corporation |
Switch circuit and method of switching radio frequency signals
|
US7092677B1
(en)
|
2002-09-05 |
2006-08-15 |
Analog Devices, Inc. |
2V SPDT switch for high power RF wireless applications
|
US6730953B2
(en)
*
|
2002-09-13 |
2004-05-04 |
Mia-Com, Inc. |
Apparatus, methods and articles of manufacture for a low control voltage switch
|
US6803680B2
(en)
*
|
2002-09-13 |
2004-10-12 |
Mia-Com, Inc. |
Apparatus, methods, and articles of manufacture for a switch having sharpened control voltage
|
US6774701B1
(en)
*
|
2003-02-19 |
2004-08-10 |
Raytheon Company |
Method and apparatus for electronic switching with low insertion loss and high isolation
|
US7098755B2
(en)
*
|
2003-07-16 |
2006-08-29 |
Analog Devices, Inc. |
High power, high linearity and low insertion loss single pole double throw transmitter/receiver switch
|
US7468543B2
(en)
*
|
2003-09-19 |
2008-12-23 |
Kabushiki Kaisha Toshiba |
Semiconductor device, communication device, and semiconductor device inspecting method
|
JP2005311447A
(ja)
*
|
2004-04-16 |
2005-11-04 |
Toshiba Corp |
スイッチ回路
|
US7221207B2
(en)
|
2004-06-04 |
2007-05-22 |
Matsushita Electric Industrial Co., Ltd. |
Semiconductor switching circuit for switching the paths of a high frequency signal in a mobile communications unit
|
EP1774620B1
(de)
|
2004-06-23 |
2014-10-01 |
Peregrine Semiconductor Corporation |
Integriertes hf-front-end
|
USRE48965E1
(en)
|
2005-07-11 |
2022-03-08 |
Psemi Corporation |
Method and apparatus improving gate oxide reliability by controlling accumulated charge
|
US7910993B2
(en)
|
2005-07-11 |
2011-03-22 |
Peregrine Semiconductor Corporation |
Method and apparatus for use in improving linearity of MOSFET's using an accumulated charge sink
|
US8742502B2
(en)
|
2005-07-11 |
2014-06-03 |
Peregrine Semiconductor Corporation |
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
|
US7890891B2
(en)
|
2005-07-11 |
2011-02-15 |
Peregrine Semiconductor Corporation |
Method and apparatus improving gate oxide reliability by controlling accumulated charge
|
US20080076371A1
(en)
|
2005-07-11 |
2008-03-27 |
Alexander Dribinsky |
Circuit and method for controlling charge injection in radio frequency switches
|
US9653601B2
(en)
|
2005-07-11 |
2017-05-16 |
Peregrine Semiconductor Corporation |
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
|
US8159283B2
(en)
*
|
2005-08-09 |
2012-04-17 |
Hitachi Metals, Ltd. |
High frequency switch circuit comprising a transistor on the high frequency path
|
US7960772B2
(en)
|
2007-04-26 |
2011-06-14 |
Peregrine Semiconductor Corporation |
Tuning capacitance to enhance FET stack voltage withstand
|
EP2255443B1
(de)
*
|
2008-02-28 |
2012-11-28 |
Peregrine Semiconductor Corporation |
Verfahren und vorrichtung für digitale abstimmung eines kondensators bei einer integrierten schaltung
|
US8723260B1
(en)
|
2009-03-12 |
2014-05-13 |
Rf Micro Devices, Inc. |
Semiconductor radio frequency switch with body contact
|
JP2011024094A
(ja)
*
|
2009-07-17 |
2011-02-03 |
Panasonic Corp |
半導体装置、高周波回路、および高周波電力増幅装置
|
US20150048887A1
(en)
*
|
2012-04-09 |
2015-02-19 |
Mitsubishi Electric Corporation |
Amplifier circuit
|
US9590674B2
(en)
|
2012-12-14 |
2017-03-07 |
Peregrine Semiconductor Corporation |
Semiconductor devices with switchable ground-body connection
|
US20150236798A1
(en)
|
2013-03-14 |
2015-08-20 |
Peregrine Semiconductor Corporation |
Methods for Increasing RF Throughput Via Usage of Tunable Filters
|
US9837324B2
(en)
|
2013-11-12 |
2017-12-05 |
Skyworks Solutions, Inc. |
Devices and methods related to radio-frequency switches having improved on-resistance performance
|
US20220013415A1
(en)
|
2013-11-12 |
2022-01-13 |
Skyworks Solutions, Inc. |
Radio-frequency switching devices having improved voltage handling capability
|
EP3506504B1
(de)
*
|
2013-11-12 |
2021-09-01 |
Skyworks Solutions, Inc. |
Vorrichtungen und verfahren in zusammenhang mit hochfrequenzschaltern mit verbesserter leistung
|
US9406695B2
(en)
|
2013-11-20 |
2016-08-02 |
Peregrine Semiconductor Corporation |
Circuit and method for improving ESD tolerance and switching speed
|
TWI547091B
(zh)
*
|
2015-02-17 |
2016-08-21 |
絡達科技股份有限公司 |
可降低訊號損失的天線切換裝置
|
US9831857B2
(en)
|
2015-03-11 |
2017-11-28 |
Peregrine Semiconductor Corporation |
Power splitter with programmable output phase shift
|
EP3373455B1
(de)
*
|
2015-12-09 |
2019-12-04 |
Mitsubishi Electric Corporation |
Hochfrequenzschalter
|
US9948281B2
(en)
|
2016-09-02 |
2018-04-17 |
Peregrine Semiconductor Corporation |
Positive logic digitally tunable capacitor
|
US10361697B2
(en)
*
|
2016-12-23 |
2019-07-23 |
Skyworks Solutions, Inc. |
Switch linearization by compensation of a field-effect transistor
|
US10886911B2
(en)
|
2018-03-28 |
2021-01-05 |
Psemi Corporation |
Stacked FET switch bias ladders
|
US10505530B2
(en)
|
2018-03-28 |
2019-12-10 |
Psemi Corporation |
Positive logic switch with selectable DC blocking circuit
|
US10236872B1
(en)
|
2018-03-28 |
2019-03-19 |
Psemi Corporation |
AC coupling modules for bias ladders
|
US11476849B2
(en)
|
2020-01-06 |
2022-10-18 |
Psemi Corporation |
High power positive logic switch
|