DE69631475D1 - Kontrolle einer Mikroskopblende - Google Patents

Kontrolle einer Mikroskopblende

Info

Publication number
DE69631475D1
DE69631475D1 DE69631475T DE69631475T DE69631475D1 DE 69631475 D1 DE69631475 D1 DE 69631475D1 DE 69631475 T DE69631475 T DE 69631475T DE 69631475 T DE69631475 T DE 69631475T DE 69631475 D1 DE69631475 D1 DE 69631475D1
Authority
DE
Germany
Prior art keywords
checking
microscope aperture
microscope
aperture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69631475T
Other languages
English (en)
Other versions
DE69631475T2 (de
Inventor
Ralph Lance Carter
Simon Adrian Wells
David Robert Clark
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PerkinElmer Ltd
Original Assignee
PerkinElmer Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PerkinElmer Ltd filed Critical PerkinElmer Ltd
Publication of DE69631475D1 publication Critical patent/DE69631475D1/de
Application granted granted Critical
Publication of DE69631475T2 publication Critical patent/DE69631475T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
DE1996631475 1996-07-16 1996-07-16 Kontrolle einer Mikroskopblende Expired - Lifetime DE69631475T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP96305199A EP0819964B1 (de) 1996-07-16 1996-07-16 Kontrolle einer Mikroskopblende

Publications (2)

Publication Number Publication Date
DE69631475D1 true DE69631475D1 (de) 2004-03-11
DE69631475T2 DE69631475T2 (de) 2005-01-13

Family

ID=8225013

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1996631475 Expired - Lifetime DE69631475T2 (de) 1996-07-16 1996-07-16 Kontrolle einer Mikroskopblende

Country Status (4)

Country Link
US (1) US5946131A (de)
EP (1) EP0819964B1 (de)
JP (1) JP4035207B2 (de)
DE (1) DE69631475T2 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3322227B2 (ja) * 1998-12-10 2002-09-09 株式会社島津製作所 赤外顕微鏡
WO2000036440A1 (en) * 1998-12-14 2000-06-22 Sensir Technologies, Llc. Miniaturized opto-electronic magnifying system
US6518996B1 (en) * 1999-02-22 2003-02-11 Optical Gaging Products, Inc. Compact video inspection apparatus with Y, Z, X compounded measurement axes
US6055095A (en) * 1999-07-30 2000-04-25 Intel Corporation Microscope with infrared imaging
US6818060B2 (en) 1999-08-02 2004-11-16 Emerald Biostructures, Inc. Robot for mixing crystallization trial matrices
JP4819988B2 (ja) * 2000-07-14 2011-11-24 オリンパス株式会社 顕微鏡システム、顕微鏡システムの動作制御方法および動作制御プログラムを記録した記録媒体
WO2002093139A2 (en) * 2001-05-11 2002-11-21 Emerald Biostructures, Inc. Plate mover for crystallization data collection
DE10131508A1 (de) 2001-07-02 2003-01-16 Leica Microsystems Verfahren und Mikroskop zur Detektion eines Objekts
US6583879B1 (en) 2002-01-11 2003-06-24 X-Rite, Incorporated Benchtop spectrophotometer with improved targeting
DE102004006066B4 (de) * 2004-01-30 2005-12-15 Carl Zeiss Blendenvorrichtung
US7078696B2 (en) * 2004-02-13 2006-07-18 Thermo Electron Scientific Instruments Corporation Microspectrometer system with selectable aperturing
US20060170916A1 (en) * 2005-01-31 2006-08-03 Voigt Thomas C Method and apparatus for variable-field illumination
WO2008027927A2 (en) * 2006-08-28 2008-03-06 Thermo Electron Scientific Instruments Llc Spectroscopic microscopy with image -driven analysis
DE102012112346B4 (de) * 2012-12-14 2014-11-06 Schott Solar Ag Verfahren zur Bestimmung von Verunreinigungen in Silizium mittels IR-Spektroskopie
WO2015023255A1 (en) 2013-08-12 2015-02-19 Halliburton Energy Services, Inc Systems and methods for spread spectrum distributed acoustic sensor monitoring
USD777118S1 (en) * 2013-12-03 2017-01-24 Carl Zeiss Microscopy Gmbh Combined touchpad, operating knobs and display module for electrical control device
WO2016033192A1 (en) 2014-08-28 2016-03-03 Adelos, Inc. Noise management for optical time delay interferometry
JP6869002B2 (ja) * 2016-10-21 2021-05-12 キヤノン株式会社 計測装置
CN106907988B (zh) * 2017-02-27 2019-03-22 北京工业大学 基础数据矩阵显微视觉建模方法
JP1593851S (de) * 2017-07-25 2017-12-25

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1699251U (de) * 1955-02-09 1955-05-26 Phywe Ag Kontinuierlichverstellbare aus vier kanten bestehende optische blende mit rechteckigem ausschnitt.
US4202037A (en) * 1977-04-22 1980-05-06 Der Loos Hendrik Van Computer microscope apparatus and method for superimposing an electronically-produced image from the computer memory upon the image in the microscope's field of view
DE3213145A1 (de) * 1982-04-08 1983-10-20 Fa. Carl Zeiss, 7920 Heidenheim Mikroskopphotometer
US4672559A (en) * 1984-12-26 1987-06-09 E. I. Du Pont De Nemours And Company Method for operating a microscopical mapping system
US4741043B1 (en) * 1985-11-04 1994-08-09 Cell Analysis Systems Inc Method of and apparatus for image analyses of biological specimens
DE3853475T2 (de) * 1987-09-24 1995-09-14 Univ Washington Konzept und umwandlungssatz eines standardmikroskops in ein mikroskop mit gemeinsamem brennpunkt und epi-beleuchtung mit einzelöffnung.
JPH0776747B2 (ja) * 1989-11-03 1995-08-16 株式会社堀場製作所 顕微分光測定装置
JP2925647B2 (ja) * 1990-04-16 1999-07-28 オリンパス光学工業株式会社 顕微鏡変倍装置
JP3075308B2 (ja) * 1991-12-12 2000-08-14 オリンパス光学工業株式会社 顕微鏡写真撮影装置
JPH06180425A (ja) * 1992-12-11 1994-06-28 Shimadzu Corp 赤外顕微鏡の測定視野設定用マスク
EP0731371B1 (de) * 1995-03-06 2003-04-16 Perkin-Elmer Limited Kontrolle eines Mikroskopprobenträgers
JPH09178563A (ja) * 1995-12-21 1997-07-11 Shimadzu Corp 分光測定装置
JP3246332B2 (ja) * 1996-05-10 2002-01-15 株式会社島津製作所 赤外顕微鏡

Also Published As

Publication number Publication date
JP4035207B2 (ja) 2008-01-16
EP0819964A1 (de) 1998-01-21
EP0819964B1 (de) 2004-02-04
US5946131A (en) 1999-08-31
DE69631475T2 (de) 2005-01-13
JPH10104159A (ja) 1998-04-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: BOSCH JEHLE PATENTANWALTSGESELLSCHAFT MBH, 80639 M