JP1593851S - - Google Patents
Info
- Publication number
- JP1593851S JP1593851S JPD2017-16071F JP2017016071F JP1593851S JP 1593851 S JP1593851 S JP 1593851S JP 2017016071 F JP2017016071 F JP 2017016071F JP 1593851 S JP1593851 S JP 1593851S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2017-16071F JP1593851S (de) | 2017-07-25 | 2017-07-25 | |
US29/634,686 USD851151S1 (en) | 2017-07-25 | 2018-01-24 | Microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2017-16071F JP1593851S (de) | 2017-07-25 | 2017-07-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP1593851S true JP1593851S (de) | 2017-12-25 |
Family
ID=60781160
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JPD2017-16071F Active JP1593851S (de) | 2017-07-25 | 2017-07-25 |
Country Status (2)
Country | Link |
---|---|
US (1) | USD851151S1 (de) |
JP (1) | JP1593851S (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD878444S1 (en) * | 2017-04-08 | 2020-03-17 | Leica Microsystems Cms Gmbh | Microscope |
USD876506S1 (en) * | 2017-04-08 | 2020-02-25 | Leica Microsystems Cms Gmbh | Microscope |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1927410B2 (de) * | 1969-05-28 | 1972-03-30 | Siemens AG, 1000 Berlin u 8000 München | Korpuskularstrahlgeraet mit mitteln zur daempfung mechanischer schwingungen |
USD303267S (en) * | 1986-08-07 | 1989-09-05 | Olympus Optical Co., Ltd. | Ultrasonic microscope |
USD381031S (en) * | 1995-07-03 | 1997-07-15 | Hitachi, Ltd. | Electron microscope |
DE69631475T2 (de) * | 1996-07-16 | 2005-01-13 | Perkin-Elmer Ltd., Beaconsfield | Kontrolle einer Mikroskopblende |
USD671654S1 (en) * | 2009-02-20 | 2012-11-27 | Sii Nano Technology Inc. | Compound charged particle beam device |
USD644258S1 (en) * | 2010-02-22 | 2011-08-30 | Hitachi High-Technologies Corporation | Electron microscope |
USD638046S1 (en) * | 2010-02-22 | 2011-05-17 | Hitachi High-Technologies Corporation | Electron microscope |
USD668699S1 (en) * | 2011-09-13 | 2012-10-09 | Life Technologies Corporation | Digital microscope |
USD687475S1 (en) * | 2012-05-10 | 2013-08-06 | Hitachi High-Technologies Corporation | Electron microscope |
USD708244S1 (en) * | 2012-11-30 | 2014-07-01 | Hitachi High-Technologies Corporation | Electron microscope |
-
2017
- 2017-07-25 JP JPD2017-16071F patent/JP1593851S/ja active Active
-
2018
- 2018-01-24 US US29/634,686 patent/USD851151S1/en active Active
Also Published As
Publication number | Publication date |
---|---|
USD851151S1 (en) | 2019-06-11 |