USD644258S1 - Electron microscope - Google Patents

Electron microscope Download PDF

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Publication number
USD644258S1
USD644258S1 US29/366,707 US36670710F USD644258S US D644258 S1 USD644258 S1 US D644258S1 US 36670710 F US36670710 F US 36670710F US D644258 S USD644258 S US D644258S
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US
United States
Prior art keywords
electron microscope
view
elevational view
ornamental design
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/366,707
Inventor
Hiroyuki Noda
Mitsuru Oonuma
Akira Omachi
Masahiro Nemoto
Kiyoshi Sasagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Assigned to HITACHI HIGH-TECHNOLOGIES CORPORATION reassignment HITACHI HIGH-TECHNOLOGIES CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: NEMOTO, MASAHIRO, SASAGAWA, KIYOSHI, OMACHI, AKIRA, NODA, HIROYUKI, OONUMA, MITSURU
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Publication of USD644258S1 publication Critical patent/USD644258S1/en
Assigned to HITACHI HIGH-TECH CORPORATION reassignment HITACHI HIGH-TECH CORPORATION CHANGE OF NAME AND ADDRESS Assignors: HITACHI HIGH-TECHNOLOGIES CORPORATION
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a left side elevational view thereof; and,
FIG. 7 is a right side elevational view thereof.
The broken lines shown are for illustrative purposes only and form no part of the claimed design.

Claims (1)

  1. We claim the ornamental design for an electron microscope, as shown and described.
US29/366,707 2010-02-22 2010-07-29 Electron microscope Active USD644258S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010004042 2010-02-22
JP2010-004042 2010-02-22

Publications (1)

Publication Number Publication Date
USD644258S1 true USD644258S1 (en) 2011-08-30

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ID=44486683

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/366,707 Active USD644258S1 (en) 2010-02-22 2010-07-29 Electron microscope

Country Status (1)

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US (1) USD644258S1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD851151S1 (en) * 2017-07-25 2019-06-11 Hitachi High-Tech Science Corporation Microscope

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD851151S1 (en) * 2017-07-25 2019-06-11 Hitachi High-Tech Science Corporation Microscope

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