USD851151S1 - Microscope - Google Patents

Microscope Download PDF

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Publication number
USD851151S1
USD851151S1 US29/634,686 US201829634686F USD851151S US D851151 S1 USD851151 S1 US D851151S1 US 201829634686 F US201829634686 F US 201829634686F US D851151 S USD851151 S US D851151S
Authority
US
United States
Prior art keywords
microscope
view
ornamental design
elevational view
side perspective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/634,686
Inventor
Ai Masuda
Hiroyuki Noda
Hiroyuki Suzuki
Yasutaka Otsuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Science Corp
Original Assignee
Hitachi High Tech Science Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Tech Science Corp filed Critical Hitachi High Tech Science Corp
Assigned to HITACHI HIGH-TECH SCIENCE CORPORATION reassignment HITACHI HIGH-TECH SCIENCE CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MASUDA, AI, OTSUKA, YASUTAKA, SUZUKI, HIROYUKI, NODA, HIROYUKI
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Publication of USD851151S1 publication Critical patent/USD851151S1/en
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Description

FIG. 1 is a front, top and right side perspective view of a microscope according to the design;
FIG. 2 is a front, top and left side perspective view thereof;
FIG. 3 is a rear, top and left side perspective view thereof;
FIG. 4 is a front elevational view thereof;
FIG. 5 is a rear elevational view thereof;
FIG. 6 is a right side elevational view thereof;
FIG. 7 is a left side elevational view thereof;
FIG. 8 is a top plan view thereof; and,
FIG. 9 is a bottom plan view thereof.

Claims (1)

    CLAIM
  1. The ornamental design for a microscope, as shown and described.
US29/634,686 2017-07-25 2018-01-24 Microscope Active USD851151S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-016071 2017-07-25
JPD2017-16071F JP1593851S (en) 2017-07-25 2017-07-25

Publications (1)

Publication Number Publication Date
USD851151S1 true USD851151S1 (en) 2019-06-11

Family

ID=60781160

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/634,686 Active USD851151S1 (en) 2017-07-25 2018-01-24 Microscope

Country Status (2)

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US (1) USD851151S1 (en)
JP (1) JP1593851S (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD876506S1 (en) * 2017-04-08 2020-02-25 Leica Microsystems Cms Gmbh Microscope
USD878444S1 (en) * 2017-04-08 2020-03-17 Leica Microsystems Cms Gmbh Microscope

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3835320A (en) * 1969-05-28 1974-09-10 Siemens Ag Particle-beam device equipped with means for attenuating mechanical movements
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD381031S (en) * 1995-07-03 1997-07-15 Hitachi, Ltd. Electron microscope
US5946131A (en) * 1996-07-16 1999-08-31 Perkin-Elmer Ltd. Microscope aperture control
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD679026S1 (en) * 2009-02-20 2013-03-26 Sii Nano Technology Inc. Compound charged particle beam device
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD693866S1 (en) * 2011-09-13 2013-11-19 Life Technologies Corporation Digital microscrope
USD708244S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Electron microscope

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3835320A (en) * 1969-05-28 1974-09-10 Siemens Ag Particle-beam device equipped with means for attenuating mechanical movements
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD381031S (en) * 1995-07-03 1997-07-15 Hitachi, Ltd. Electron microscope
US5946131A (en) * 1996-07-16 1999-08-31 Perkin-Elmer Ltd. Microscope aperture control
USD679026S1 (en) * 2009-02-20 2013-03-26 Sii Nano Technology Inc. Compound charged particle beam device
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD693866S1 (en) * 2011-09-13 2013-11-19 Life Technologies Corporation Digital microscrope
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD708244S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Electron microscope

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD876506S1 (en) * 2017-04-08 2020-02-25 Leica Microsystems Cms Gmbh Microscope
USD878444S1 (en) * 2017-04-08 2020-03-17 Leica Microsystems Cms Gmbh Microscope

Also Published As

Publication number Publication date
JP1593851S (en) 2017-12-25

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