USD851151S1 - Microscope - Google Patents
Microscope Download PDFInfo
- Publication number
- USD851151S1 USD851151S1 US29/634,686 US201829634686F USD851151S US D851151 S1 USD851151 S1 US D851151S1 US 201829634686 F US201829634686 F US 201829634686F US D851151 S USD851151 S US D851151S
- Authority
- US
- United States
- Prior art keywords
- microscope
- view
- ornamental design
- elevational view
- side perspective
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Description
Claims (1)
- The ornamental design for a microscope, as shown and described.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017-016071 | 2017-07-25 | ||
JPD2017-16071F JP1593851S (en) | 2017-07-25 | 2017-07-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
USD851151S1 true USD851151S1 (en) | 2019-06-11 |
Family
ID=60781160
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/634,686 Active USD851151S1 (en) | 2017-07-25 | 2018-01-24 | Microscope |
Country Status (2)
Country | Link |
---|---|
US (1) | USD851151S1 (en) |
JP (1) | JP1593851S (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD876506S1 (en) * | 2017-04-08 | 2020-02-25 | Leica Microsystems Cms Gmbh | Microscope |
USD878444S1 (en) * | 2017-04-08 | 2020-03-17 | Leica Microsystems Cms Gmbh | Microscope |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3835320A (en) * | 1969-05-28 | 1974-09-10 | Siemens Ag | Particle-beam device equipped with means for attenuating mechanical movements |
USD303267S (en) * | 1986-08-07 | 1989-09-05 | Olympus Optical Co., Ltd. | Ultrasonic microscope |
USD381031S (en) * | 1995-07-03 | 1997-07-15 | Hitachi, Ltd. | Electron microscope |
US5946131A (en) * | 1996-07-16 | 1999-08-31 | Perkin-Elmer Ltd. | Microscope aperture control |
USD638046S1 (en) * | 2010-02-22 | 2011-05-17 | Hitachi High-Technologies Corporation | Electron microscope |
USD644258S1 (en) * | 2010-02-22 | 2011-08-30 | Hitachi High-Technologies Corporation | Electron microscope |
USD679026S1 (en) * | 2009-02-20 | 2013-03-26 | Sii Nano Technology Inc. | Compound charged particle beam device |
USD687475S1 (en) * | 2012-05-10 | 2013-08-06 | Hitachi High-Technologies Corporation | Electron microscope |
USD693866S1 (en) * | 2011-09-13 | 2013-11-19 | Life Technologies Corporation | Digital microscrope |
USD708244S1 (en) * | 2012-11-30 | 2014-07-01 | Hitachi High-Technologies Corporation | Electron microscope |
-
2017
- 2017-07-25 JP JPD2017-16071F patent/JP1593851S/ja active Active
-
2018
- 2018-01-24 US US29/634,686 patent/USD851151S1/en active Active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3835320A (en) * | 1969-05-28 | 1974-09-10 | Siemens Ag | Particle-beam device equipped with means for attenuating mechanical movements |
USD303267S (en) * | 1986-08-07 | 1989-09-05 | Olympus Optical Co., Ltd. | Ultrasonic microscope |
USD381031S (en) * | 1995-07-03 | 1997-07-15 | Hitachi, Ltd. | Electron microscope |
US5946131A (en) * | 1996-07-16 | 1999-08-31 | Perkin-Elmer Ltd. | Microscope aperture control |
USD679026S1 (en) * | 2009-02-20 | 2013-03-26 | Sii Nano Technology Inc. | Compound charged particle beam device |
USD638046S1 (en) * | 2010-02-22 | 2011-05-17 | Hitachi High-Technologies Corporation | Electron microscope |
USD644258S1 (en) * | 2010-02-22 | 2011-08-30 | Hitachi High-Technologies Corporation | Electron microscope |
USD693866S1 (en) * | 2011-09-13 | 2013-11-19 | Life Technologies Corporation | Digital microscrope |
USD687475S1 (en) * | 2012-05-10 | 2013-08-06 | Hitachi High-Technologies Corporation | Electron microscope |
USD708244S1 (en) * | 2012-11-30 | 2014-07-01 | Hitachi High-Technologies Corporation | Electron microscope |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD876506S1 (en) * | 2017-04-08 | 2020-02-25 | Leica Microsystems Cms Gmbh | Microscope |
USD878444S1 (en) * | 2017-04-08 | 2020-03-17 | Leica Microsystems Cms Gmbh | Microscope |
Also Published As
Publication number | Publication date |
---|---|
JP1593851S (en) | 2017-12-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |