JP1593851S - - Google Patents

Info

Publication number
JP1593851S
JP1593851S JPD2017-16071F JP2017016071F JP1593851S JP 1593851 S JP1593851 S JP 1593851S JP 2017016071 F JP2017016071 F JP 2017016071F JP 1593851 S JP1593851 S JP 1593851S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2017-16071F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2017-16071F priority Critical patent/JP1593851S/ja
Application granted granted Critical
Publication of JP1593851S publication Critical patent/JP1593851S/ja
Priority to US29/634,686 priority patent/USD851151S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2017-16071F 2017-07-25 2017-07-25 Active JP1593851S (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JPD2017-16071F JP1593851S (en) 2017-07-25 2017-07-25
US29/634,686 USD851151S1 (en) 2017-07-25 2018-01-24 Microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2017-16071F JP1593851S (en) 2017-07-25 2017-07-25

Publications (1)

Publication Number Publication Date
JP1593851S true JP1593851S (en) 2017-12-25

Family

ID=60781160

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2017-16071F Active JP1593851S (en) 2017-07-25 2017-07-25

Country Status (2)

Country Link
US (1) USD851151S1 (en)
JP (1) JP1593851S (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD878444S1 (en) * 2017-04-08 2020-03-17 Leica Microsystems Cms Gmbh Microscope
USD876506S1 (en) * 2017-04-08 2020-02-25 Leica Microsystems Cms Gmbh Microscope

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1927410B2 (en) * 1969-05-28 1972-03-30 Siemens AG, 1000 Berlin u 8000 München BODY BLAST DEVICE WITH MEANS FOR DAMPING MECHANICAL VIBRATIONS
USD303267S (en) * 1986-08-07 1989-09-05 Olympus Optical Co., Ltd. Ultrasonic microscope
USD381031S (en) * 1995-07-03 1997-07-15 Hitachi, Ltd. Electron microscope
DE69631475T2 (en) * 1996-07-16 2005-01-13 Perkin-Elmer Ltd., Beaconsfield Control of a microscope screen
USD671654S1 (en) * 2009-02-20 2012-11-27 Sii Nano Technology Inc. Compound charged particle beam device
USD644258S1 (en) * 2010-02-22 2011-08-30 Hitachi High-Technologies Corporation Electron microscope
USD638046S1 (en) * 2010-02-22 2011-05-17 Hitachi High-Technologies Corporation Electron microscope
USD668699S1 (en) * 2011-09-13 2012-10-09 Life Technologies Corporation Digital microscope
USD687475S1 (en) * 2012-05-10 2013-08-06 Hitachi High-Technologies Corporation Electron microscope
USD708244S1 (en) * 2012-11-30 2014-07-01 Hitachi High-Technologies Corporation Electron microscope

Also Published As

Publication number Publication date
USD851151S1 (en) 2019-06-11

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