DE69613607T2 - Informationsverarbeitungs-Apparat mit einer einer Kreisbewegung ausgesetzten Sonde - Google Patents
Informationsverarbeitungs-Apparat mit einer einer Kreisbewegung ausgesetzten SondeInfo
- Publication number
- DE69613607T2 DE69613607T2 DE69613607T DE69613607T DE69613607T2 DE 69613607 T2 DE69613607 T2 DE 69613607T2 DE 69613607 T DE69613607 T DE 69613607T DE 69613607 T DE69613607 T DE 69613607T DE 69613607 T2 DE69613607 T2 DE 69613607T2
- Authority
- DE
- Germany
- Prior art keywords
- processing apparatus
- information processing
- circular motion
- motion probe
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
- G11B9/1418—Disposition or mounting of heads or record carriers
- G11B9/1427—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
- G11B9/1436—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement with provision for moving the heads or record carriers relatively to each other
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q80/00—Applications, other than SPM, of scanning-probe techniques
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B21/00—Head arrangements not specific to the method of recording or reproducing
- G11B21/02—Driving or moving of heads
- G11B21/04—Automatic feed mechanism producing a progressive transducing traverse of the head in a direction which cuts across the direction of travel of the recording medium, e.g. helical scan, e.g. by lead-screw
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/85—Scanning probe control process
- Y10S977/851—Particular movement or positioning of scanning tip
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/868—Scanning probe structure with optical means
- Y10S977/869—Optical microscope
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/88—Manufacture, treatment, or detection of nanostructure with arrangement, process, or apparatus for testing
- Y10S977/881—Microscopy or spectroscopy, e.g. sem, tem
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/943—Information storage or retrieval using nanostructure
- Y10S977/947—Information storage or retrieval using nanostructure with scanning probe instrument
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP05971695A JP3581421B2 (ja) | 1995-02-23 | 1995-02-23 | 情報処理装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69613607D1 DE69613607D1 (de) | 2001-08-09 |
DE69613607T2 true DE69613607T2 (de) | 2002-05-29 |
Family
ID=13121214
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69613607T Expired - Fee Related DE69613607T2 (de) | 1995-02-23 | 1996-02-21 | Informationsverarbeitungs-Apparat mit einer einer Kreisbewegung ausgesetzten Sonde |
Country Status (4)
Country | Link |
---|---|
US (1) | US5831961A (de) |
EP (1) | EP0729006B1 (de) |
JP (1) | JP3581421B2 (de) |
DE (1) | DE69613607T2 (de) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5744799A (en) * | 1996-05-20 | 1998-04-28 | Ohara; Tetsuo | Apparatus for and method of real-time nanometer-scale position measurement of the sensor of a scanning tunneling microscope or other sensor scanning atomic or other undulating surfaces |
JP3202646B2 (ja) * | 1997-04-09 | 2001-08-27 | セイコーインスツルメンツ株式会社 | 走査型プローブ顕微鏡 |
TW369603B (en) * | 1997-04-10 | 1999-09-11 | Sii Nanotechnology Inc | Apparatus for machining, recording, and reproducing, using scanning probe microscope |
JP3978818B2 (ja) * | 1997-08-08 | 2007-09-19 | ソニー株式会社 | 微小ヘッド素子の製造方法 |
US6459088B1 (en) | 1998-01-16 | 2002-10-01 | Canon Kabushiki Kaisha | Drive stage and scanning probe microscope and information recording/reproducing apparatus using the same |
US7304486B2 (en) * | 1998-07-08 | 2007-12-04 | Capres A/S | Nano-drive for high resolution positioning and for positioning of a multi-point probe |
EP1237161B1 (de) | 2001-02-28 | 2014-05-14 | Imec | Verfahren und Vorrichtung zur Durchführung von Rasterkraftmikroskop-Messungen |
JP2002310882A (ja) * | 2001-04-17 | 2002-10-23 | Canon Inc | 走査型プローブによる信号検出装置、該装置によるプローブ顕微鏡、及び走査型プローブによる信号検出方法、該方法を用いてサンプル表面を観察する観察方法 |
CN100477067C (zh) * | 2002-07-08 | 2009-04-08 | 马尔蒂普罗布公司 | 多个扫描探针的软件同步 |
US7315505B2 (en) * | 2003-07-14 | 2008-01-01 | Hewlett-Packard Development Company, L.P. | Storage device having a probe with plural tips |
KR100603244B1 (ko) * | 2004-07-29 | 2006-07-20 | 전자부품연구원 | 탐침형 정보저장장치 |
KR100706310B1 (ko) * | 2004-10-04 | 2007-04-13 | 엘지전자 주식회사 | Pzt를 이용한 주사탐침 현미경 내의 캔틸레버와 그제조방법 및 상기 캔틸레버를 이용한 탐침형 정보 저장 장치 |
JP4140598B2 (ja) * | 2004-11-01 | 2008-08-27 | 株式会社日立製作所 | 記録再生装置 |
JP4498285B2 (ja) * | 2006-02-01 | 2010-07-07 | キヤノン株式会社 | 走査型プローブ装置 |
JP4448099B2 (ja) * | 2006-02-01 | 2010-04-07 | キヤノン株式会社 | 走査型プローブ装置 |
US8302456B2 (en) | 2006-02-23 | 2012-11-06 | Asylum Research Corporation | Active damping of high speed scanning probe microscope components |
US7486403B2 (en) * | 2006-07-20 | 2009-02-03 | Canon Kabushiki Kaisha | Droplet shape measuring method and apparatus |
JP4542620B2 (ja) | 2007-03-30 | 2010-09-15 | パイオニア株式会社 | 駆動装置 |
JP4542619B2 (ja) * | 2007-03-30 | 2010-09-15 | パイオニア株式会社 | 駆動装置 |
WO2008126236A1 (ja) | 2007-03-30 | 2008-10-23 | Pioneer Corporation | 駆動装置 |
US9383388B2 (en) | 2014-04-21 | 2016-07-05 | Oxford Instruments Asylum Research, Inc | Automated atomic force microscope and the operation thereof |
WO2016166816A1 (ja) * | 2015-04-14 | 2016-10-20 | 株式会社島津製作所 | 走査型プローブ顕微鏡 |
KR101607606B1 (ko) * | 2015-08-17 | 2016-03-31 | 한국표준과학연구원 | 원자간력 현미경의 측정 방법 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5547570A (en) * | 1978-10-02 | 1980-04-04 | Nippon Electric Ind Co Ltd | Optical reading device |
JPS6047958A (ja) * | 1983-08-26 | 1985-03-15 | Tokyo Keiki Co Ltd | 水浸超音波探傷装置 |
EP0247219B1 (de) * | 1986-05-27 | 1991-05-15 | International Business Machines Corporation | Speichereinheit mit direktem Zugriff |
JP2556491B2 (ja) * | 1986-12-24 | 1996-11-20 | キヤノン株式会社 | 記録装置及び記録法 |
JPS63262553A (ja) * | 1987-04-20 | 1988-10-28 | Fuji Photo Film Co Ltd | 電気泳動器具 |
JP2580183B2 (ja) * | 1987-06-29 | 1997-02-12 | 株式会社 マックサイエンス | 放射線画像読取装置 |
JP2686645B2 (ja) * | 1989-05-08 | 1997-12-08 | キヤノン株式会社 | 走査型トンネル電流検出装置 |
JP2909829B2 (ja) * | 1989-07-05 | 1999-06-23 | セイコーインスツルメンツ株式会社 | 位置合わせ機能付複合走査型トンネル顕微鏡 |
DE69125552T2 (de) * | 1990-09-14 | 1997-10-09 | Canon K.K., Tokio/Tokyo | Nachführungsmethode für Speichergerät |
JPH0575047A (ja) * | 1991-03-08 | 1993-03-26 | Hitachi Ltd | 記憶装置 |
JP2930447B2 (ja) * | 1991-05-15 | 1999-08-03 | キヤノン株式会社 | 情報処理装置 |
JP3198355B2 (ja) * | 1991-05-28 | 2001-08-13 | キヤノン株式会社 | 微小変位素子及びこれを用いた走査型トンネル顕微鏡、情報処理装置 |
CA2076925C (en) * | 1991-08-29 | 1999-08-31 | Kunihiro Sakai | Information processing apparatus and scanning tunnel microscope |
US5150392A (en) * | 1991-09-09 | 1992-09-22 | International Business Machines Corporation | X-ray mask containing a cantilevered tip for gap control and alignment |
JP2994505B2 (ja) * | 1991-10-04 | 1999-12-27 | キヤノン株式会社 | 情報再生装置 |
ATE175515T1 (de) * | 1991-10-15 | 1999-01-15 | Canon Kk | Informationsverarbeitungsgerät mit spurausrichtungsmechanismus |
JP2889536B2 (ja) * | 1996-06-24 | 1999-05-10 | 株式会社タチエス | シート・ベルトの取付け構造 |
-
1995
- 1995-02-23 JP JP05971695A patent/JP3581421B2/ja not_active Expired - Fee Related
-
1996
- 1996-02-21 EP EP96102606A patent/EP0729006B1/de not_active Expired - Lifetime
- 1996-02-21 DE DE69613607T patent/DE69613607T2/de not_active Expired - Fee Related
- 1996-02-22 US US08/603,890 patent/US5831961A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0729006A2 (de) | 1996-08-28 |
EP0729006A3 (de) | 1996-09-04 |
DE69613607D1 (de) | 2001-08-09 |
JP3581421B2 (ja) | 2004-10-27 |
EP0729006B1 (de) | 2001-07-04 |
US5831961A (en) | 1998-11-03 |
JPH08235651A (ja) | 1996-09-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |