DE69610572T2 - Zusammensetzung für reflexionsvermindernde Resistbeschichtung - Google Patents
Zusammensetzung für reflexionsvermindernde ResistbeschichtungInfo
- Publication number
- DE69610572T2 DE69610572T2 DE69610572T DE69610572T DE69610572T2 DE 69610572 T2 DE69610572 T2 DE 69610572T2 DE 69610572 T DE69610572 T DE 69610572T DE 69610572 T DE69610572 T DE 69610572T DE 69610572 T2 DE69610572 T2 DE 69610572T2
- Authority
- DE
- Germany
- Prior art keywords
- composition
- resist coating
- reflective resist
- reflective
- coating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D129/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal, or ketal radical; Coating compositions based on hydrolysed polymers of esters of unsaturated alcohols with saturated carboxylic acids; Coating compositions based on derivatives of such polymers
- C09D129/10—Homopolymers or copolymers of unsaturated ethers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Structural Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Architecture (AREA)
- Life Sciences & Earth Sciences (AREA)
- Materials Engineering (AREA)
- Wood Science & Technology (AREA)
- Organic Chemistry (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Paints Or Removers (AREA)
- Materials For Photolithography (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6413295 | 1995-03-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69610572D1 DE69610572D1 (de) | 2000-11-16 |
DE69610572T2 true DE69610572T2 (de) | 2001-05-31 |
Family
ID=13249253
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69610572T Expired - Fee Related DE69610572T2 (de) | 1995-03-23 | 1996-03-20 | Zusammensetzung für reflexionsvermindernde Resistbeschichtung |
Country Status (4)
Country | Link |
---|---|
US (1) | US5611850A (de) |
EP (1) | EP0736809B1 (de) |
KR (1) | KR100404951B1 (de) |
DE (1) | DE69610572T2 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3694703B2 (ja) * | 1996-04-25 | 2005-09-14 | Azエレクトロニックマテリアルズ株式会社 | 反射防止コーティング用組成物 |
JP2001142221A (ja) * | 1999-11-10 | 2001-05-25 | Clariant (Japan) Kk | 反射防止コーティング用組成物 |
KR100400331B1 (ko) * | 1999-12-02 | 2003-10-01 | 주식회사 하이닉스반도체 | 포토레지스트 오버코팅용 조성물 및 이를 이용한포토레지스트 패턴 형성방법 |
JP3320402B2 (ja) * | 2000-06-26 | 2002-09-03 | クラリアント ジャパン 株式会社 | 現像欠陥防止プロセス及び材料 |
DE10045793C2 (de) * | 2000-09-15 | 2002-07-18 | Zeiss Carl | Verfahren zum Strukturieren eines Substrats |
JP2003345026A (ja) * | 2002-05-24 | 2003-12-03 | Tokyo Ohka Kogyo Co Ltd | 反射防止膜形成用塗布液組成物およびこれを用いたホトレジスト積層体、並びにホトレジストパターンの形成方法 |
JP3707780B2 (ja) * | 2002-06-24 | 2005-10-19 | 東京応化工業株式会社 | パターン微細化用被覆形成剤およびそれを用いた微細パターンの形成方法 |
JP3851594B2 (ja) * | 2002-07-04 | 2006-11-29 | Azエレクトロニックマテリアルズ株式会社 | 反射防止コーティング用組成物およびパターン形成方法 |
KR20050096161A (ko) | 2003-01-29 | 2005-10-05 | 아사히 가라스 가부시키가이샤 | 코팅 조성물, 반사 방지막, 포토레지스트 및 그것을 사용한패턴 형성 방법 |
TWI362566B (en) | 2004-06-30 | 2012-04-21 | Dainippon Ink & Chemicals | Composition for antireflection coating and pattern forming method |
DE602005027888D1 (de) * | 2004-12-03 | 2011-06-16 | Jsr Corp | Zusammensetzung zur bildung eines antireflexionsfilms, beschichtetes produkt und verfahren zur herstellung einer resiststruktur |
JP2006301524A (ja) * | 2005-04-25 | 2006-11-02 | Tokyo Ohka Kogyo Co Ltd | 保護膜形成用材料およびこれを用いたレジストパターン形成方法 |
US7989568B2 (en) | 2008-11-13 | 2011-08-02 | E.I. Du Pont De Nemours And Company | Fluorosulfonates |
US20230056958A1 (en) * | 2021-08-06 | 2023-02-23 | Taiwan Semiconductor Manufacturing Co., Ltd. | Photoresist developer and methods of use |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58213057A (ja) * | 1982-06-04 | 1983-12-10 | Dainippon Ink & Chem Inc | 被覆用組成物 |
US4514537A (en) * | 1984-02-09 | 1985-04-30 | E. I. Du Pont De Nemours And Company | Tetrafluoroethylene polymer dispersions |
JP2643056B2 (ja) * | 1991-06-28 | 1997-08-20 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 表面反射防止コーティング形成組成物及びその使用 |
US5514526A (en) * | 1992-06-02 | 1996-05-07 | Mitsubishi Chemical Corporation | Fluorine-containing composition for forming anti-reflection film on resist surface and pattern formation method |
US5330883A (en) * | 1992-06-29 | 1994-07-19 | Lsi Logic Corporation | Techniques for uniformizing photoresist thickness and critical dimension of underlying features |
-
1996
- 1996-03-18 US US08/618,307 patent/US5611850A/en not_active Expired - Fee Related
- 1996-03-20 DE DE69610572T patent/DE69610572T2/de not_active Expired - Fee Related
- 1996-03-20 EP EP96104440A patent/EP0736809B1/de not_active Expired - Lifetime
- 1996-03-23 KR KR1019960008045A patent/KR100404951B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP0736809A1 (de) | 1996-10-09 |
KR100404951B1 (ko) | 2005-02-02 |
KR960034346A (ko) | 1996-10-22 |
US5611850A (en) | 1997-03-18 |
EP0736809B1 (de) | 2000-10-11 |
DE69610572D1 (de) | 2000-11-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8327 | Change in the person/name/address of the patent owner |
Owner name: SHIPLEY CO., L.L.C., MARLBOROUGH, MASS., US |
|
8339 | Ceased/non-payment of the annual fee |