DE69512730D1 - IC-Fassung - Google Patents

IC-Fassung

Info

Publication number
DE69512730D1
DE69512730D1 DE69512730T DE69512730T DE69512730D1 DE 69512730 D1 DE69512730 D1 DE 69512730D1 DE 69512730 T DE69512730 T DE 69512730T DE 69512730 T DE69512730 T DE 69512730T DE 69512730 D1 DE69512730 D1 DE 69512730D1
Authority
DE
Germany
Prior art keywords
version
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69512730T
Other languages
English (en)
Other versions
DE69512730T2 (de
Inventor
Masao Tohyama
Kiyoshi Adachi
Kiyokazu Ikeya
Tomohiro Nakano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sensata Technologies Massachusetts Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=16761229&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69512730(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of DE69512730D1 publication Critical patent/DE69512730D1/de
Application granted granted Critical
Publication of DE69512730T2 publication Critical patent/DE69512730T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1007—Plug-in assemblages of components, e.g. IC sockets with means for increasing contact pressure at the end of engagement of coupling parts
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
    • H05K7/1076—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by sliding
    • H05K7/1084—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by sliding pin grid array package carriers

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
DE69512730T 1994-08-23 1995-08-23 IC-Fassung Expired - Lifetime DE69512730T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22108394A JP3256796B2 (ja) 1994-08-23 1994-08-23 ソケット及びソケットを用いた電気部品の試験方法

Publications (2)

Publication Number Publication Date
DE69512730D1 true DE69512730D1 (de) 1999-11-18
DE69512730T2 DE69512730T2 (de) 2000-03-02

Family

ID=16761229

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69512730T Expired - Lifetime DE69512730T2 (de) 1994-08-23 1995-08-23 IC-Fassung

Country Status (8)

Country Link
US (1) US5690281A (de)
EP (1) EP0699018B1 (de)
JP (1) JP3256796B2 (de)
KR (1) KR100372793B1 (de)
DE (1) DE69512730T2 (de)
MY (1) MY112007A (de)
SG (1) SG38868A1 (de)
TW (1) TW344874B (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3360179B2 (ja) * 1994-09-06 2002-12-24 ザ ウィタカー コーポレーション ボールグリッドアレーソケット
JP3518091B2 (ja) * 1995-09-25 2004-04-12 株式会社エンプラス Ｉｃソケット
JP3745060B2 (ja) * 1996-12-09 2006-02-15 日本テキサス・インスツルメンツ株式会社 ソケット
JP3801713B2 (ja) * 1997-01-16 2006-07-26 株式会社エンプラス 電気部品用ソケット
US6249135B1 (en) 1997-09-19 2001-06-19 Fujitsu Limited Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage
JPH11162601A (ja) * 1997-11-27 1999-06-18 Texas Instr Japan Ltd ソケット
US6267603B1 (en) * 1998-04-01 2001-07-31 Molex Incorporated Burn-in test socket
JP3755718B2 (ja) * 1999-04-28 2006-03-15 株式会社エンプラス 電気部品用ソケット
JP4087012B2 (ja) * 1999-05-31 2008-05-14 株式会社エンプラス 電気部品用ソケット
US6325653B1 (en) * 1999-07-15 2001-12-04 Kabushiki Kaisha Yokowo Terminal connecting apparatus for storage device
JP3758069B2 (ja) * 1999-07-30 2006-03-22 株式会社エンプラス 電気部品用ソケット
JP3257994B2 (ja) 1999-08-30 2002-02-18 日本テキサス・インスツルメンツ株式会社 ソケット
KR20010046030A (ko) * 1999-11-10 2001-06-05 송재인 볼 그리드 어레이용 집적회로 소켓
JP4251423B2 (ja) 2000-01-28 2009-04-08 株式会社センサータ・テクノロジーズジャパン ソケット
TW564578B (en) * 2000-10-25 2003-12-01 Texas Instruments Inc Socket apparatus and method for removably mounting an electronic package
JP4721582B2 (ja) * 2001-09-14 2011-07-13 株式会社センサータ・テクノロジーズジャパン ソケット
US6998862B2 (en) * 2003-04-28 2006-02-14 Micron Technology, Inc. Test socket for semiconductor components having serviceable nest
US6811421B1 (en) 2003-06-06 2004-11-02 Hon Hai Precision Ind. Co., Ltd Socket connector with pivoting operating members
US6881088B2 (en) * 2003-07-29 2005-04-19 Hon Hai Precision Ind. Co., Ltd. Connector assembly with actuation system
TWI260109B (en) * 2003-09-03 2006-08-11 Hon Hai Prec Ind Co Ltd Socket connector
US6796842B1 (en) * 2003-10-08 2004-09-28 Ming-Te Wang Electronic card connector
US7121860B2 (en) * 2004-09-02 2006-10-17 Micron Technology, Inc. Pinch-style support contact, method of enabling electrical communication with and supporting an IC package, and socket including same
KR100629958B1 (ko) * 2005-01-15 2006-09-28 황동원 반도체용 테스트 및 번인을 위한 비지에이형 소켓
US7218128B2 (en) * 2005-02-14 2007-05-15 International Business Machines Corporation Method and apparatus for locating and testing a chip
JP4802059B2 (ja) 2006-07-27 2011-10-26 株式会社エンプラス 電気部品用ソケット
US7318736B1 (en) * 2006-08-08 2008-01-15 Sensata Technologies, Inc. Burn-in sockets for BGA IC devices having an integrated slider with full ball grid compatibility
TWM370216U (en) * 2009-05-12 2009-12-01 Hon Hai Prec Ind Co Ltd Electrical connector assembly and heatsink module thereof
KR102146290B1 (ko) * 2019-04-04 2020-08-21 황동원 반도체 소자 테스트용 lidless BGA 소켓장치

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3763459A (en) * 1971-06-17 1973-10-02 Textool Prod Inc Plug-in type sockets for testing semiconductors
US4147213A (en) * 1978-02-22 1979-04-03 Standard Oil Company (Indiana) Combustion air injection well
JPS58129794A (ja) * 1982-01-29 1983-08-02 ケル株式会社 Ｉｃコネクタ
US4509812A (en) * 1982-04-21 1985-04-09 Karl Lotter Plug connector for dil components
JPS61116783A (ja) * 1984-11-10 1986-06-04 山一電機株式会社 格子配列形ｉｃパツケ−ジ用ソケツト
US4836798A (en) * 1987-12-21 1989-06-06 Wells Electronics, Inc. Zero insertion socket with normally closed contacts
US5123855A (en) * 1991-04-26 1992-06-23 Minnesota Mining And Manufacturing Company Zero insertion force connector for printed circuit boards
US5247250A (en) * 1992-03-27 1993-09-21 Minnesota Mining And Manufacturing Company Integrated circuit test socket
JP3302720B2 (ja) * 1992-06-09 2002-07-15 ミネソタ マイニング アンド マニュファクチャリング カンパニー Ｉｃソケット
US5482471A (en) * 1993-02-24 1996-01-09 Texas Instruments Incorporated Socket apparatus for IC package testing
US5456613A (en) * 1993-07-16 1995-10-10 Tongrand Limited Zero insertion force connector and contact therein
US5419710A (en) * 1994-06-10 1995-05-30 Pfaff; Wayne K. Mounting apparatus for ball grid array device

Also Published As

Publication number Publication date
TW344874B (en) 1998-11-11
KR100372793B1 (ko) 2003-09-06
JP3256796B2 (ja) 2002-02-12
KR960009284A (ko) 1996-03-22
EP0699018A1 (de) 1996-02-28
JPH0864320A (ja) 1996-03-08
US5690281A (en) 1997-11-25
MY112007A (en) 2001-03-31
DE69512730T2 (de) 2000-03-02
SG38868A1 (en) 1997-04-17
EP0699018B1 (de) 1999-10-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: SENSATA TECHNOLOGIES, INC. (N.D.GES.D. STAATES DEL

8327 Change in the person/name/address of the patent owner

Owner name: SENSATA TECHNOLOGIES MASSAUSETTS,INC. (N. D. G, US