DE69504347D1 - Elektronenmikroskop mit raman spektroskopie - Google Patents
Elektronenmikroskop mit raman spektroskopieInfo
- Publication number
- DE69504347D1 DE69504347D1 DE69504347T DE69504347T DE69504347D1 DE 69504347 D1 DE69504347 D1 DE 69504347D1 DE 69504347 T DE69504347 T DE 69504347T DE 69504347 T DE69504347 T DE 69504347T DE 69504347 D1 DE69504347 D1 DE 69504347D1
- Authority
- DE
- Germany
- Prior art keywords
- specimen
- pct
- guide
- microscope
- light beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001069 Raman spectroscopy Methods 0.000 title abstract 6
- 230000005855 radiation Effects 0.000 abstract 3
- 230000003287 optical effect Effects 0.000 abstract 2
- 238000010894 electron beam technology Methods 0.000 abstract 1
- 238000003384 imaging method Methods 0.000 abstract 1
- 238000004626 scanning electron microscopy Methods 0.000 abstract 1
- 238000004627 transmission electron microscopy Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
- H01J37/226—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object
- H01J37/228—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object whereby illumination or light collection take place in the same area of the discharge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
- H01J37/226—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
- H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N2021/653—Coherent methods [CARS]
- G01N2021/656—Raman microprobe
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2445—Photon detectors for X-rays, light, e.g. photomultipliers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL9400111A NL9400111A (nl) | 1994-01-24 | 1994-01-24 | Elektronenmicroscoop met Ramanspectroscopie. |
PCT/NL1995/000033 WO1995020242A1 (en) | 1994-01-24 | 1995-01-24 | Electron microscope with raman spectroscopy |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69504347D1 true DE69504347D1 (de) | 1998-10-01 |
DE69504347T2 DE69504347T2 (de) | 1999-04-29 |
Family
ID=19863739
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69504347T Expired - Lifetime DE69504347T2 (de) | 1994-01-24 | 1995-01-24 | Elektronenmikroskop mit raman spektroskopie |
Country Status (9)
Country | Link |
---|---|
US (1) | US5811804A (de) |
EP (1) | EP0766869B1 (de) |
AT (1) | ATE170331T1 (de) |
AU (1) | AU1427195A (de) |
DE (1) | DE69504347T2 (de) |
DK (1) | DK0766869T3 (de) |
ES (1) | ES2122530T3 (de) |
NL (1) | NL9400111A (de) |
WO (1) | WO1995020242A1 (de) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6885445B2 (en) | 1998-05-09 | 2005-04-26 | Renishaw Plc | Electron microscope and spectroscopy system |
SE0000555D0 (sv) * | 2000-02-22 | 2000-02-22 | Nanofactory Instruments Ab | Mätanordning för transmissions-elektron-mikroskop |
US6654118B2 (en) * | 2002-02-04 | 2003-11-25 | Ortho-Mcneil Pharmaceutical, Inc. | Method and apparatus for obtaining molecular data from a pharmaceutical specimen |
TWI283296B (en) * | 2002-02-04 | 2007-07-01 | Ortho Mcneil Pharm Inc | Method and apparatus for obtaining molecular data from a pharmaceutical specimen |
US20040254479A1 (en) | 2003-02-20 | 2004-12-16 | John Fralick | Bio-photonic feedback control software and database |
US20050278184A1 (en) * | 2004-06-10 | 2005-12-15 | John Fralick | Bio-photonic feedback control software and database |
EP1735811B1 (de) * | 2004-04-02 | 2015-09-09 | California Institute Of Technology | Verfahren und system für ein ultraschnelles fotoelektronen-mikroskop |
EP1812079A4 (de) | 2004-10-15 | 2012-07-25 | Spectral Dimensions Inc | Beurteilung eines pharmazeutischen gemisches |
NL1027462C2 (nl) * | 2004-11-09 | 2006-05-10 | Koninkl Philips Electronics Nv | Werkwijze voor het lokaliseren van fluorescente markers. |
EP1953791A1 (de) * | 2007-02-05 | 2008-08-06 | FEI Company | Vorrichtung zum Betrachten einer Probe mit einem Teilchenstrahl und einem optischen Mikroskop |
DE102009015341A1 (de) * | 2009-03-27 | 2010-10-07 | Carl Zeiss Ag | Verfahren und Vorrichtungen zur optischen Untersuchung von Proben |
EP2469253A1 (de) | 2010-12-24 | 2012-06-27 | HybriScan Technologies Holding BV | System für die Elektronenmikroskopie und Raman-Spektroskopie |
JP2013096750A (ja) * | 2011-10-28 | 2013-05-20 | Hamamatsu Photonics Kk | X線分光検出装置 |
WO2013119612A1 (en) * | 2012-02-07 | 2013-08-15 | Board Of Trustees Of Michigan State University | Electron microscope |
US8872105B2 (en) | 2013-02-19 | 2014-10-28 | Fei Company | In situ reactivation of fluorescence marker |
EP2824445B1 (de) | 2013-07-08 | 2016-03-02 | Fei Company | Mikroskopie mit geladenen teilchen kombiniert mit raman-spektroskopie |
DE102014103360A1 (de) * | 2014-03-12 | 2015-09-17 | Leibniz-Institut Für Neue Materialien Gemeinnützige Gmbh | Vorrichtung für die korrelative Raster-Transmissionselektronenmikroskopie (STEM) und Lichtmikroskopie |
CZ305388B6 (cs) | 2014-03-26 | 2015-08-26 | Tescan Orsay Holding, A.S. | Analytický systém s Ramanovým mikroskopem a elektronovým mikroskopem |
DE102014108331A1 (de) | 2014-06-13 | 2015-12-17 | Leibniz-Institut Für Neue Materialien Gemeinnützige Gesellschaft Mit Beschränkter Haftung | Spezifische Proteinmarkierung sowie Verfahren zur Identifizierung der statistischen Verteilung der Proteinstöchiometrie |
DE102014108825A1 (de) | 2014-06-24 | 2015-12-24 | Leibniz-Institut Für Neue Materialien Gemeinnützige Gesellschaft Mit Beschränkter Haftung | Vorrichtung und Verfahren für die stöchiometrische Analyse von Proben |
US11454540B2 (en) * | 2019-07-12 | 2022-09-27 | Biospex, Inc. | Wearable spectroscopy using filtered sensor |
US11326944B2 (en) | 2019-07-12 | 2022-05-10 | Biospex, Inc. | Wearable spectrometer with filtered sensor |
WO2021021656A1 (en) | 2019-07-26 | 2021-02-04 | The Board Of Trustees Of The Leland Stanford Junior University | Sub-wavelength raman imaging with combined optical and electron excitation |
CN112485235B (zh) * | 2020-11-13 | 2022-02-18 | 中国科学院物理研究所 | 具备超快时间分辨光谱能力的透射电子显微镜样品杆系统和应用 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2055772A1 (de) * | 1969-08-13 | 1971-04-30 | Sopelem | |
DE3037983C2 (de) * | 1980-10-08 | 1983-03-31 | Fa. Carl Zeiss, 7920 Heidenheim | Verfahren und Vorrichtung zur lichtinduzierten rastermikroskopischen Darstellung von Probenparametern in ihrer räumlichen Verteilung |
GB2130433B (en) * | 1982-03-05 | 1986-02-05 | Jeol Ltd | Scanning electron microscope with as optical microscope |
FR2596863B1 (fr) * | 1986-04-07 | 1988-06-17 | Centre Nat Rech Scient | Dispositif de microscopie analytique, propre a former a la fois une sonde raman et une sonde electronique |
US4917462A (en) * | 1988-06-15 | 1990-04-17 | Cornell Research Foundation, Inc. | Near field scanning optical microscopy |
GB9112343D0 (en) * | 1991-06-08 | 1991-07-31 | Renishaw Transducer Syst | Surface analysis apparatus |
US4929041A (en) * | 1989-01-09 | 1990-05-29 | Johnston Pump/General Valve, Inc. | Cathodoluminescence system for use in a scanning electron microscope including means for controlling optical fiber aperture |
US5272330A (en) * | 1990-11-19 | 1993-12-21 | At&T Bell Laboratories | Near field scanning optical microscope having a tapered waveguide |
US5218195A (en) * | 1991-06-25 | 1993-06-08 | Fuji Photo Film Co., Ltd. | Scanning microscope, scanning width detecting device, and magnification indicating apparatus |
US5362964A (en) * | 1993-07-30 | 1994-11-08 | Electroscan Corporation | Environmental scanning electron microscope |
US5412211A (en) * | 1993-07-30 | 1995-05-02 | Electroscan Corporation | Environmental scanning electron microscope |
US5473157A (en) * | 1994-03-22 | 1995-12-05 | At&T Corp. | Variable temperature near-field optical microscope |
-
1994
- 1994-01-24 NL NL9400111A patent/NL9400111A/nl unknown
-
1995
- 1995-01-24 US US08/682,601 patent/US5811804A/en not_active Expired - Lifetime
- 1995-01-24 AT AT95905795T patent/ATE170331T1/de not_active IP Right Cessation
- 1995-01-24 DK DK95905795T patent/DK0766869T3/da active
- 1995-01-24 ES ES95905795T patent/ES2122530T3/es not_active Expired - Lifetime
- 1995-01-24 AU AU14271/95A patent/AU1427195A/en not_active Abandoned
- 1995-01-24 EP EP95905795A patent/EP0766869B1/de not_active Expired - Lifetime
- 1995-01-24 DE DE69504347T patent/DE69504347T2/de not_active Expired - Lifetime
- 1995-01-24 WO PCT/NL1995/000033 patent/WO1995020242A1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
DE69504347T2 (de) | 1999-04-29 |
NL9400111A (nl) | 1995-09-01 |
AU1427195A (en) | 1995-08-08 |
WO1995020242A1 (en) | 1995-07-27 |
US5811804A (en) | 1998-09-22 |
DK0766869T3 (da) | 1999-05-25 |
ES2122530T3 (es) | 1998-12-16 |
EP0766869B1 (de) | 1998-08-26 |
ATE170331T1 (de) | 1998-09-15 |
EP0766869A1 (de) | 1997-04-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |