DE69416761D1 - Speicherschutzschaltung für EPROM - Google Patents

Speicherschutzschaltung für EPROM

Info

Publication number
DE69416761D1
DE69416761D1 DE69416761T DE69416761T DE69416761D1 DE 69416761 D1 DE69416761 D1 DE 69416761D1 DE 69416761 T DE69416761 T DE 69416761T DE 69416761 T DE69416761 T DE 69416761T DE 69416761 D1 DE69416761 D1 DE 69416761D1
Authority
DE
Germany
Prior art keywords
eprom
protection circuit
memory protection
memory
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69416761T
Other languages
English (en)
Other versions
DE69416761T2 (de
Inventor
Kiyoshi Fukushima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of DE69416761D1 publication Critical patent/DE69416761D1/de
Application granted granted Critical
Publication of DE69416761T2 publication Critical patent/DE69416761T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/22—Safety or protection circuits preventing unauthorised or accidental access to memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Storage Device Security (AREA)
  • Read Only Memory (AREA)
DE69416761T 1993-09-20 1994-09-20 Speicherschutzschaltung für EPROM Expired - Fee Related DE69416761T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5255298A JPH0793223A (ja) 1993-09-20 1993-09-20 記憶情報保護回路

Publications (2)

Publication Number Publication Date
DE69416761D1 true DE69416761D1 (de) 1999-04-08
DE69416761T2 DE69416761T2 (de) 1999-09-02

Family

ID=17276834

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69416761T Expired - Fee Related DE69416761T2 (de) 1993-09-20 1994-09-20 Speicherschutzschaltung für EPROM

Country Status (4)

Country Link
US (1) US5506806A (de)
EP (1) EP0645774B1 (de)
JP (1) JPH0793223A (de)
DE (1) DE69416761T2 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3487690B2 (ja) * 1995-06-20 2004-01-19 シャープ株式会社 不揮発性半導体記憶装置
US6396368B1 (en) 1999-11-10 2002-05-28 Hrl Laboratories, Llc CMOS-compatible MEM switches and method of making
US7217977B2 (en) * 2004-04-19 2007-05-15 Hrl Laboratories, Llc Covert transformation of transistor properties as a circuit protection method
US6815816B1 (en) * 2000-10-25 2004-11-09 Hrl Laboratories, Llc Implanted hidden interconnections in a semiconductor device for preventing reverse engineering
US6791191B2 (en) 2001-01-24 2004-09-14 Hrl Laboratories, Llc Integrated circuits protected against reverse engineering and method for fabricating the same using vias without metal terminations
US7294935B2 (en) * 2001-01-24 2007-11-13 Hrl Laboratories, Llc Integrated circuits protected against reverse engineering and method for fabricating the same using an apparent metal contact line terminating on field oxide
US6459629B1 (en) * 2001-05-03 2002-10-01 Hrl Laboratories, Llc Memory with a bit line block and/or a word line block for preventing reverse engineering
US6740942B2 (en) * 2001-06-15 2004-05-25 Hrl Laboratories, Llc. Permanently on transistor implemented using a double polysilicon layer CMOS process with buried contact
US6774413B2 (en) * 2001-06-15 2004-08-10 Hrl Laboratories, Llc Integrated circuit structure with programmable connector/isolator
US6897535B2 (en) 2002-05-14 2005-05-24 Hrl Laboratories, Llc Integrated circuit with reverse engineering protection
US6874069B2 (en) * 2002-07-26 2005-03-29 Silicon Storage Technology, Inc. Microcontroller having an embedded non-volatile memory array with read protection for the array or portions thereof
US7049667B2 (en) * 2002-09-27 2006-05-23 Hrl Laboratories, Llc Conductive channel pseudo block process and circuit to inhibit reverse engineering
US6979606B2 (en) * 2002-11-22 2005-12-27 Hrl Laboratories, Llc Use of silicon block process step to camouflage a false transistor
AU2003293540A1 (en) 2002-12-13 2004-07-09 Raytheon Company Integrated circuit modification using well implants
US6879518B1 (en) * 2003-11-21 2005-04-12 Atmel Corporation Embedded memory with security row lock protection
JP2005166184A (ja) * 2003-12-04 2005-06-23 Sharp Corp 半導体記憶装置
EP1603138A1 (de) 2004-04-15 2005-12-07 STMicroelectronics SA Nichtflüchtiger Speicher mit Mittel zur Verfälschung der Auslese von Speicherzellen
US7242063B1 (en) 2004-06-29 2007-07-10 Hrl Laboratories, Llc Symmetric non-intrusive and covert technique to render a transistor permanently non-operable
US8168487B2 (en) * 2006-09-28 2012-05-01 Hrl Laboratories, Llc Programmable connection and isolation of active regions in an integrated circuit using ambiguous features to confuse a reverse engineer
US8871431B2 (en) 2011-08-08 2014-10-28 Timothy Gotsick Laminated flexographic printing sleeves and methods of making the same

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6057597A (ja) * 1983-09-08 1985-04-03 Oki Electric Ind Co Ltd プログラマブルｒｏｍ
JPS6128144A (ja) * 1984-07-18 1986-02-07 Matsushita Electric Ind Co Ltd トレ−ス動作実行装置
JPS6157099A (ja) * 1984-08-28 1986-03-22 Matsushita Electric Ind Co Ltd Ｅｐｒｏｍ書き込み禁止回路
JP2842442B2 (ja) * 1985-04-26 1999-01-06 株式会社日立製作所 マイクロコンピュータ、不揮発性半導体記憶装置、ならびにその書込みおよび消去方法
US4744062A (en) * 1985-04-23 1988-05-10 Hitachi, Ltd. Semiconductor integrated circuit with nonvolatile memory
US4791612A (en) * 1985-12-18 1988-12-13 Fujitsu Limited Data programming circuit for programmable read only memory device
JPS62236053A (ja) * 1986-04-07 1987-10-16 Matsushita Electric Ind Co Ltd Ｅｅｐｒｏｍ読み出し禁止回路
JPH02299039A (ja) * 1989-05-12 1990-12-11 Toshiba Corp 半導体メモリ装置
JPH0520204A (ja) * 1991-07-11 1993-01-29 Matsushita Electric Ind Co Ltd 半導体装置
JP2632104B2 (ja) * 1991-11-07 1997-07-23 三菱電機株式会社 不揮発性半導体記憶装置
US5381369A (en) * 1993-02-05 1995-01-10 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device using a command control system

Also Published As

Publication number Publication date
EP0645774A2 (de) 1995-03-29
JPH0793223A (ja) 1995-04-07
US5506806A (en) 1996-04-09
EP0645774B1 (de) 1999-03-03
DE69416761T2 (de) 1999-09-02
EP0645774A3 (de) 1995-11-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee