DE69408709T2 - Photoempfindliche Harzzusammensetzung - Google Patents
Photoempfindliche HarzzusammensetzungInfo
- Publication number
- DE69408709T2 DE69408709T2 DE69408709T DE69408709T DE69408709T2 DE 69408709 T2 DE69408709 T2 DE 69408709T2 DE 69408709 T DE69408709 T DE 69408709T DE 69408709 T DE69408709 T DE 69408709T DE 69408709 T2 DE69408709 T2 DE 69408709T2
- Authority
- DE
- Germany
- Prior art keywords
- resin composition
- photosensitive resin
- photosensitive
- composition
- resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/12—Nitrogen compound containing
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Materials For Photolithography (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10248293 | 1993-04-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69408709D1 DE69408709D1 (de) | 1998-04-09 |
DE69408709T2 true DE69408709T2 (de) | 1998-10-01 |
Family
ID=14328677
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69408709T Expired - Fee Related DE69408709T2 (de) | 1993-04-28 | 1994-03-28 | Photoempfindliche Harzzusammensetzung |
Country Status (4)
Country | Link |
---|---|
US (1) | US6197475B1 (de) |
EP (1) | EP0622682B1 (de) |
KR (1) | KR100246113B1 (de) |
DE (1) | DE69408709T2 (de) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1930522B (zh) * | 2004-03-12 | 2013-06-12 | 东丽株式会社 | 正型感光性树脂组合物、使用该组合物的浮雕图形以及固体成象元件 |
EP1637927A1 (de) | 2004-09-02 | 2006-03-22 | Fuji Photo Film Co., Ltd. | Positiv arbeitende Resistzusammensetzung und Verfahren zur Herstellung von Mustern unter Verwendung dieser Zusammensetzung |
JP4580841B2 (ja) | 2005-08-16 | 2010-11-17 | 富士フイルム株式会社 | ポジ型レジスト組成物及びそれを用いたパターン形成方法 |
JP4905786B2 (ja) | 2007-02-14 | 2012-03-28 | 富士フイルム株式会社 | レジスト組成物及びそれを用いたパターン形成方法 |
US7592118B2 (en) | 2007-03-27 | 2009-09-22 | Fujifilm Corporation | Positive resist composition and pattern forming method using the same |
US8182975B2 (en) | 2007-03-28 | 2012-05-22 | Fujifilm Corporation | Positive resist composition and pattern forming method using the same |
JP5039622B2 (ja) | 2007-03-30 | 2012-10-03 | 富士フイルム株式会社 | ポジ型レジスト組成物及びこれを用いたパターン形成方法 |
JP4982228B2 (ja) | 2007-03-30 | 2012-07-25 | 富士フイルム株式会社 | ポジ型レジスト組成物及びこれを用いたパターン形成方法 |
JP4547448B2 (ja) | 2007-08-10 | 2010-09-22 | 富士フイルム株式会社 | ポジ型レジスト組成物及びそれを用いたパターン形成方法 |
JP4911469B2 (ja) | 2007-09-28 | 2012-04-04 | 富士フイルム株式会社 | レジスト組成物及びこれを用いたパターン形成方法 |
JP5397017B2 (ja) * | 2009-05-25 | 2014-01-22 | 株式会社リコー | ポリアミド酸及びポリイミド |
TWI600966B (zh) | 2014-02-21 | 2017-10-01 | 東京威力科創股份有限公司 | 光敏化學增幅型光阻材料及使用該光阻材料之圖案形成方法、半導體器件、光微影用光罩,以及奈米壓印用模板 |
JP6774814B2 (ja) | 2015-08-20 | 2020-10-28 | 国立大学法人大阪大学 | 化学増幅型レジスト材料及びパターン形成方法 |
JP6512994B2 (ja) | 2015-08-20 | 2019-05-15 | 国立大学法人大阪大学 | 化学増幅型レジスト材料 |
JP6809843B2 (ja) | 2015-08-20 | 2021-01-06 | 国立大学法人大阪大学 | パターン形成方法 |
JP6507958B2 (ja) | 2015-09-10 | 2019-05-08 | Jsr株式会社 | 化学増幅型レジスト材料及びレジストパターン形成方法 |
JP2017054116A (ja) | 2015-09-10 | 2017-03-16 | Jsr株式会社 | レジストパターン形成方法 |
US9989849B2 (en) | 2015-11-09 | 2018-06-05 | Jsr Corporation | Chemically amplified resist material and resist pattern-forming method |
US10018911B2 (en) | 2015-11-09 | 2018-07-10 | Jsr Corporation | Chemically amplified resist material and resist pattern-forming method |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4515887A (en) * | 1983-08-29 | 1985-05-07 | General Electric Company | Photopatternable dielectric compositions, method for making and use |
JPH03136054A (ja) * | 1989-10-23 | 1991-06-10 | Sony Corp | ネガ型フォトレジスト組成物 |
US5650261A (en) * | 1989-10-27 | 1997-07-22 | Rohm And Haas Company | Positive acting photoresist comprising a photoacid, a photobase and a film forming acid-hardening resin system |
DE69030643T2 (de) * | 1989-11-30 | 1997-09-25 | Sumitomo Bakelite Co | Lichtempfindliche Harzzusammensetzung und ihre Verwendung zur Herstellung eines Halbleiterapparats |
US5114826A (en) * | 1989-12-28 | 1992-05-19 | Ibm Corporation | Photosensitive polyimide compositions |
EP0502400B1 (de) * | 1991-03-05 | 1997-09-17 | Nitto Denko Corporation | Hitzebeständige, positiv arbeitende Photoresistzusammensetzung, lichtempfindliches Substrat, und Verfahren zur Herstellung eines hitzebeständigen positiven Musters |
US5206117A (en) * | 1991-08-14 | 1993-04-27 | Labadie Jeffrey W | Photosensitive polyamic alkyl ester composition and process for its use |
DE69324942T2 (de) * | 1992-02-14 | 1999-10-07 | Shipley Co | Strahlungsempfindliche Zusammensetzungen und Verfahren |
-
1994
- 1994-03-28 EP EP94302204A patent/EP0622682B1/de not_active Expired - Lifetime
- 1994-03-28 DE DE69408709T patent/DE69408709T2/de not_active Expired - Fee Related
- 1994-04-27 KR KR1019940009007A patent/KR100246113B1/ko not_active IP Right Cessation
- 1994-04-28 US US08/234,861 patent/US6197475B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69408709D1 (de) | 1998-04-09 |
EP0622682A1 (de) | 1994-11-02 |
EP0622682B1 (de) | 1998-03-04 |
US6197475B1 (en) | 2001-03-06 |
KR100246113B1 (ko) | 2000-06-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |