DE69317075D1 - Integrierte Pufferschaltung mit gesteuerten Anstiegs- und Abfallszeiten - Google Patents

Integrierte Pufferschaltung mit gesteuerten Anstiegs- und Abfallszeiten

Info

Publication number
DE69317075D1
DE69317075D1 DE69317075T DE69317075T DE69317075D1 DE 69317075 D1 DE69317075 D1 DE 69317075D1 DE 69317075 T DE69317075 T DE 69317075T DE 69317075 T DE69317075 T DE 69317075T DE 69317075 D1 DE69317075 D1 DE 69317075D1
Authority
DE
Germany
Prior art keywords
buffer circuit
fall times
integrated buffer
controlled rise
rise
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69317075T
Other languages
English (en)
Other versions
DE69317075T2 (de
Inventor
Thaddeus John Gabara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
AT&T Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AT&T Corp filed Critical AT&T Corp
Publication of DE69317075D1 publication Critical patent/DE69317075D1/de
Application granted granted Critical
Publication of DE69317075T2 publication Critical patent/DE69317075T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
    • H03K17/145—Modifications for compensating variations of physical values, e.g. of temperature in field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00346—Modifications for eliminating interference or parasitic voltages or currents
    • H03K19/00361—Modifications for eliminating interference or parasitic voltages or currents in field effect transistor circuits
DE69317075T 1992-06-23 1993-06-17 Integrierte Pufferschaltung mit gesteuerten Anstiegs- und Abfallszeiten Expired - Lifetime DE69317075T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/902,614 US5311084A (en) 1992-06-23 1992-06-23 Integrated circuit buffer with controlled rise/fall time

Publications (2)

Publication Number Publication Date
DE69317075D1 true DE69317075D1 (de) 1998-04-02
DE69317075T2 DE69317075T2 (de) 1998-06-18

Family

ID=25416114

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69317075T Expired - Lifetime DE69317075T2 (de) 1992-06-23 1993-06-17 Integrierte Pufferschaltung mit gesteuerten Anstiegs- und Abfallszeiten

Country Status (6)

Country Link
US (1) US5311084A (de)
EP (1) EP0576204B1 (de)
JP (1) JP2778901B2 (de)
KR (1) KR960013853B1 (de)
DE (1) DE69317075T2 (de)
HK (1) HK1004357A1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5345195A (en) * 1992-10-22 1994-09-06 United Memories, Inc. Low power Vcc and temperature independent oscillator
US5657456A (en) * 1993-06-18 1997-08-12 Digital Equipment Corporation Semiconductor process power supply voltage and temperature compensated integrated system bus driver rise and fall time
US5677642A (en) * 1994-11-01 1997-10-14 At&T Global Information Solutions Company Signal generator with supply voltage tolerance
EP0735687A3 (de) * 1995-03-31 1998-03-25 STMicroelectronics, Inc. Ausgangstreiber mit programmierbaren Treiberparametern
US5606275A (en) * 1995-09-05 1997-02-25 Motorola, Inc. Buffer circuit having variable output impedance
JP3650460B2 (ja) * 1996-03-06 2005-05-18 株式会社アドバンテスト 温度補正付きドライバ回路
US5742193A (en) * 1996-10-24 1998-04-21 Sgs-Thomson Microelectronics, Inc. Driver circuit including preslewing circuit for improved slew rate control
US5959481A (en) * 1997-02-18 1999-09-28 Rambus Inc. Bus driver circuit including a slew rate indicator circuit having a one shot circuit
JP3177960B2 (ja) 1998-02-18 2001-06-18 日本電気株式会社 信号変化加速バス駆動回路
US6088415A (en) * 1998-02-23 2000-07-11 National Semiconductor Corporation Apparatus and method to adaptively equalize duty cycle distortion
JP2000295094A (ja) * 1999-04-07 2000-10-20 Mitsubishi Electric Corp バッファ回路およびそれを用いた電位検出回路
US6329835B1 (en) * 2000-02-23 2001-12-11 Pericom Semiconductor Corp. Quiet output buffers with neighbor sensing of wide bus and control signals
US6420920B1 (en) * 2000-08-28 2002-07-16 Micron Technology, Inc. Method and apparatus for phase-splitting a clock signal
EP1286469A1 (de) * 2001-07-31 2003-02-26 Infineon Technologies AG Ausgangstreiber für integrierte Schaltungen und ein Verfahren zur Steuerung der Ausgangsimpedanz einer integrierter Schaltung
KR100811413B1 (ko) * 2001-09-28 2008-03-07 주식회사 케이티 가변용량 버퍼를 가진 재생 중계기
DE50206743D1 (de) * 2002-02-27 2006-06-14 Ego Elektro Geraetebau Gmbh Elektrische Schaltung für ein kapazitives Sensorelement
US7567063B1 (en) * 2004-05-05 2009-07-28 National Semiconductor Corporation System and method for minimizing power consumption of a reference voltage circuit
US7262637B2 (en) * 2005-03-22 2007-08-28 Micron Technology, Inc. Output buffer and method having a supply voltage insensitive slew rate
KR101245832B1 (ko) 2006-05-23 2013-03-21 삼성전자주식회사 장애물을 감지하는 장치 및 방법

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4563595A (en) * 1983-10-27 1986-01-07 National Semiconductor Corporation CMOS Schmitt trigger circuit for TTL logic levels
US4567378A (en) * 1984-06-13 1986-01-28 International Business Machines Corporation Driver circuit for controlling signal rise and fall in field effect transistor processors
US4820937A (en) * 1985-09-19 1989-04-11 Xilinx, Incorporated TTL/CMOS compatible input buffer
US4823029A (en) * 1987-06-25 1989-04-18 American Telephone And Telegraph Company At&T Bell Laboratories Noise controlled output buffer
JP2796103B2 (ja) * 1987-10-14 1998-09-10 エルエスアイ ロジック コーポレーション ２モードドライバ回路
US4782252A (en) * 1987-12-08 1988-11-01 Advanced Micro Devices, Inc. Output current control circuit for reducing ground bounce noise
US5061863A (en) * 1989-05-16 1991-10-29 Kabushiki Kaisha Toyoda Jidoshokki Seisakusho Transistor provided with a current detecting function
US4972101A (en) * 1989-09-19 1990-11-20 Digital Equipment Corporation Noise reduction in CMOS driver using capacitor discharge to generate a control voltage
US5021684A (en) * 1989-11-09 1991-06-04 Intel Corporation Process, supply, temperature compensating CMOS output buffer
JPH03169273A (ja) * 1989-11-22 1991-07-22 Mitsubishi Electric Corp スイッチングデバイス駆動回路
DE4018754A1 (de) * 1990-06-12 1991-12-19 Bosch Gmbh Robert Schaltung zur begrenzung der signalanstiegsgeschwindigkeit von ausgangssignalen integrierter schaltkreise
US5214320A (en) * 1992-06-12 1993-05-25 Smos Systems, Inc. System and method for reducing ground bounce in integrated circuit output buffers

Also Published As

Publication number Publication date
US5311084A (en) 1994-05-10
KR960013853B1 (ko) 1996-10-10
DE69317075T2 (de) 1998-06-18
EP0576204B1 (de) 1998-02-25
EP0576204A1 (de) 1993-12-29
HK1004357A1 (en) 1998-11-20
JP2778901B2 (ja) 1998-07-23
JPH0659757A (ja) 1994-03-04

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Legal Events

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