DE69132335D1 - Verfahren und Vorrichtung zum Erlangen von zerstörungsfreien Messungen an Objekten mit regelmässigen Formen - Google Patents

Verfahren und Vorrichtung zum Erlangen von zerstörungsfreien Messungen an Objekten mit regelmässigen Formen

Info

Publication number
DE69132335D1
DE69132335D1 DE69132335T DE69132335T DE69132335D1 DE 69132335 D1 DE69132335 D1 DE 69132335D1 DE 69132335 T DE69132335 T DE 69132335T DE 69132335 T DE69132335 T DE 69132335T DE 69132335 D1 DE69132335 D1 DE 69132335D1
Authority
DE
Germany
Prior art keywords
objects
regular shapes
obtaining non
destructive measurements
destructive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69132335T
Other languages
English (en)
Other versions
DE69132335T2 (de
Inventor
Ira Lon Morgan
Robert H Rice
Joseph E Bolger
Donald G Schindler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Integrated Diagnostic Measurement Corp
Original Assignee
Integrated Diagnostic Measurement Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Integrated Diagnostic Measurement Corp filed Critical Integrated Diagnostic Measurement Corp
Publication of DE69132335D1 publication Critical patent/DE69132335D1/de
Application granted granted Critical
Publication of DE69132335T2 publication Critical patent/DE69132335T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21B—ROLLING OF METAL
    • B21B37/00—Control devices or methods specially adapted for metal-rolling mills or the work produced thereby
    • B21B37/78—Control of tube rolling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21B—ROLLING OF METAL
    • B21B2261/00—Product parameters
    • B21B2261/20—Temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Pulmonology (AREA)
  • Theoretical Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Electromagnetism (AREA)
  • Mechanical Engineering (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Radiation Pyrometers (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Extrusion Moulding Of Plastics Or The Like (AREA)
  • Control Of Non-Electrical Variables (AREA)
  • General Factory Administration (AREA)
DE69132335T 1990-05-31 1991-05-30 Verfahren und Vorrichtung zum Erlangen von zerstörungsfreien Messungen an Objekten mit regelmässigen Formen Expired - Fee Related DE69132335T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/531,454 US5379237A (en) 1990-05-31 1990-05-31 Automated system for controlling the quality of regularly-shaped products during their manufacture

Publications (2)

Publication Number Publication Date
DE69132335D1 true DE69132335D1 (de) 2000-08-24
DE69132335T2 DE69132335T2 (de) 2001-02-01

Family

ID=24117705

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69132335T Expired - Fee Related DE69132335T2 (de) 1990-05-31 1991-05-30 Verfahren und Vorrichtung zum Erlangen von zerstörungsfreien Messungen an Objekten mit regelmässigen Formen
DE69112773T Expired - Fee Related DE69112773T2 (de) 1990-05-31 1991-05-30 Automatisches system für die qualitätskontrolle geometrisch regelmässig geformter produkte während ihrer erzeugung.

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69112773T Expired - Fee Related DE69112773T2 (de) 1990-05-31 1991-05-30 Automatisches system für die qualitätskontrolle geometrisch regelmässig geformter produkte während ihrer erzeugung.

Country Status (8)

Country Link
US (2) US5379237A (de)
EP (2) EP0664437B1 (de)
JP (1) JPH05502301A (de)
AU (1) AU8085391A (de)
CA (1) CA2064572A1 (de)
DE (2) DE69132335T2 (de)
ES (1) ES2078527T3 (de)
WO (1) WO1991019164A1 (de)

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CN102818810B (zh) * 2012-05-08 2015-11-25 西安筑波科技有限公司 X射线无损探伤设备
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CN110609245B (zh) * 2019-10-09 2024-02-27 广西思晔自动化科技有限公司 一种榨蔗量微磁测量控制方法及其装置
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CN113418940B (zh) * 2021-06-24 2023-03-14 电子科技大学 一种基于x射线示踪颗粒的检测方法及检测装置
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Also Published As

Publication number Publication date
EP0664437B1 (de) 2000-07-19
CA2064572A1 (en) 1991-12-12
DE69112773D1 (de) 1995-10-12
DE69112773T2 (de) 1996-06-13
EP0485572A1 (de) 1992-05-20
WO1991019164A1 (en) 1991-12-12
AU8085391A (en) 1991-12-31
EP0664437A2 (de) 1995-07-26
ES2078527T3 (es) 1995-12-16
EP0485572B1 (de) 1995-09-06
JPH05502301A (ja) 1993-04-22
EP0664437A3 (de) 1997-10-15
US5379237A (en) 1995-01-03
US5608660A (en) 1997-03-04
DE69132335T2 (de) 2001-02-01

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Legal Events

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8339 Ceased/non-payment of the annual fee