DE69124709D1 - Eingebaute Selbstprüfung für Analog-Digitalumsetzer - Google Patents

Eingebaute Selbstprüfung für Analog-Digitalumsetzer

Info

Publication number
DE69124709D1
DE69124709D1 DE69124709T DE69124709T DE69124709D1 DE 69124709 D1 DE69124709 D1 DE 69124709D1 DE 69124709 T DE69124709 T DE 69124709T DE 69124709 T DE69124709 T DE 69124709T DE 69124709 D1 DE69124709 D1 DE 69124709D1
Authority
DE
Germany
Prior art keywords
analog
built
self
test
digital converters
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69124709T
Other languages
English (en)
Other versions
DE69124709T2 (de
Inventor
Michael R Dewitt
George F Cross
R Ramachandran
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
AT&T Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AT&T Corp filed Critical AT&T Corp
Publication of DE69124709D1 publication Critical patent/DE69124709D1/de
Application granted granted Critical
Publication of DE69124709T2 publication Critical patent/DE69124709T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/108—Converters having special provisions for facilitating access for testing purposes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318502—Test of Combinational circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69124709T 1990-03-15 1991-03-06 Eingebaute Selbstprüfung für Analog-Digitalumsetzer Expired - Fee Related DE69124709T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US49407090A 1990-03-15 1990-03-15

Publications (2)

Publication Number Publication Date
DE69124709D1 true DE69124709D1 (de) 1997-03-27
DE69124709T2 DE69124709T2 (de) 1997-05-28

Family

ID=23962905

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69124709T Expired - Fee Related DE69124709T2 (de) 1990-03-15 1991-03-06 Eingebaute Selbstprüfung für Analog-Digitalumsetzer

Country Status (5)

Country Link
US (1) US5132685A (de)
EP (1) EP0447117B1 (de)
JP (1) JP2619988B2 (de)
DE (1) DE69124709T2 (de)
HK (1) HK118497A (de)

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JPH04212524A (ja) * 1990-12-06 1992-08-04 Matsushita Electric Ind Co Ltd 半導体集積回路
US5231314A (en) * 1992-03-02 1993-07-27 National Semiconductor Corporation Programmable timing circuit for integrated circuit device with test access port
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US5483237A (en) * 1994-01-31 1996-01-09 At&T Corp. Method and apparatus for testing a CODEC
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US5568143A (en) * 1994-10-27 1996-10-22 Lucid Technologies Inc Analog to digital conversion system having automatically and dynamically variable resolution range
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US5659312A (en) * 1996-06-14 1997-08-19 Logicvision, Inc. Method and apparatus for testing digital to analog and analog to digital converters
TW364950B (en) * 1996-06-17 1999-07-21 Koninkl Philips Electronics Nv Method of testing an analog-to-digital converter
KR100489144B1 (ko) * 1996-06-17 2005-09-30 코닌클리케 필립스 일렉트로닉스 엔.브이. 아날로그-디지탈컨버터테스트방법및집적회로
TW356596B (en) * 1996-10-16 1999-04-21 Koninl Philips Electronics Nv Testing control signals in A/D converters the invention relates to an integrated circuit containing an A/D converter and a test circuit
US5923676A (en) * 1996-12-20 1999-07-13 Logic Vision, Inc. Bist architecture for measurement of integrated circuit delays
US6161202A (en) * 1997-02-18 2000-12-12 Ee-Signals Gmbh & Co. Kg Method for the monitoring of integrated circuits
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US5909186A (en) * 1997-07-01 1999-06-01 Vlsi Technology Gmbh Methods and apparatus for testing analog-to-digital and digital-to-analog device using digital testers
US5982681A (en) * 1997-10-10 1999-11-09 Lsi Logic Corporation Reconfigurable built-in self test circuit
US6633335B1 (en) * 1998-02-28 2003-10-14 Hyundai Electronics Industries Co., Ltd. CMOS image sensor with testing circuit for verifying operation thereof
JP2002531986A (ja) * 1998-12-03 2002-09-24 コンティネンタル・テーベス・アクチエンゲゼルシヤフト・ウント・コンパニー・オッフェネ・ハンデルスゲゼルシヤフト 安全上重要な用途のためのａ／ｄコンバータを備えた回路装置
US6229465B1 (en) 1999-04-30 2001-05-08 International Business Machines Corporation Built in self test method and structure for analog to digital converter
US6333706B1 (en) 1999-08-02 2001-12-25 International Business Machines Corporation Built-in self-test for analog to digital converter
US6885700B1 (en) 1999-09-23 2005-04-26 University Of Washington Charge-based frequency measurement bist
US6320528B1 (en) 1999-10-15 2001-11-20 Koninklijke Philips Electronics Nv Built-in self test for integrated digital-to-analog converters
US6232759B1 (en) * 1999-10-21 2001-05-15 Credence Systems Corporation Linear ramping digital-to-analog converter for integrated circuit tester
EP1102403A1 (de) * 1999-11-19 2001-05-23 ABB Power Automation AG Funktionsüberwachung eines Wandlers
US6931579B2 (en) 2000-04-28 2005-08-16 Mcgill University Integrated excitation/extraction system for test and measurement
US6323792B1 (en) * 2000-08-28 2001-11-27 National Instruments Corporation Method for correcting analog-to-digital converter (ADC) errors, and apparatus embodying same
JP2002181893A (ja) * 2000-12-11 2002-06-26 Mitsubishi Electric Corp 半導体装置の検査方法および検査装置
US7065740B2 (en) * 2001-08-24 2006-06-20 Microsoft Corporation System and method to automate the management of computer services and programmable devices
JP2003338756A (ja) * 2002-05-21 2003-11-28 Mitsubishi Electric Corp 試験方法および試験回路
US6703952B2 (en) * 2002-06-10 2004-03-09 Adc Dsl Systems, Inc. Testing analog-to-digital and digital-to-analog converters
TWI233495B (en) * 2004-02-11 2005-06-01 Ind Tech Res Inst IC with built-in self-test function and design method thereof
US6933868B1 (en) * 2004-03-02 2005-08-23 Texas Instruments Incorporated Testing of mixed signal integrated circuits generating analog signals from digital data elements
US7599299B2 (en) * 2004-04-30 2009-10-06 Xilinx, Inc. Dynamic reconfiguration of a system monitor (DRPORT)
US7102555B2 (en) * 2004-04-30 2006-09-05 Xilinx, Inc. Boundary-scan circuit used for analog and digital testing of an integrated circuit
TWI241071B (en) * 2004-06-30 2005-10-01 Univ Nat Cheng Kung Test framework and test method of analog to digital converter
US7081841B1 (en) * 2005-04-28 2006-07-25 Lsi Logic Corporation Analog to digital converter built in self test
TWI270254B (en) * 2005-09-16 2007-01-01 Univ Nat Chiao Tung Reprogrammable switched-capacitor input circuit for receiving digital test stimulus signal in analog test
KR100837270B1 (ko) * 2006-06-07 2008-06-11 삼성전자주식회사 스마트 카드 및 그것의 데이터 보안 방법
US20080086781A1 (en) * 2006-10-06 2008-04-10 Stephane Rodgers Method and system for glitch protection in a secure system
US20090219032A1 (en) * 2008-02-28 2009-09-03 Qimonda Ag System and method for determining circuit functionality under varying external operating conditions
US7868796B2 (en) * 2008-09-30 2011-01-11 Freescale Semiconductor, Inc. Self-calibrating data conversion circuitry and method therefor
US7880650B2 (en) * 2008-09-30 2011-02-01 Freescale Semiconductor, Inc. Method and apparatus for testing data converter
US7733258B2 (en) * 2008-09-30 2010-06-08 Freescale Semiconductor, Inc. Data conversion circuitry for converting analog signals to digital signals and vice-versa and method therefor
US7868795B2 (en) * 2008-09-30 2011-01-11 Freescale Semiconductor, Inc. Data conversion circuitry with an extra successive approximation step and method therefor
US7876254B2 (en) * 2008-09-30 2011-01-25 Freescale Semiconductor, Inc. Data conversion circuitry having successive approximation circuitry and method therefor
US8106801B2 (en) 2009-02-12 2012-01-31 Qualcomm, Incorporated Methods and apparatus for built in self test of analog-to-digital convertors
WO2010128541A1 (ja) * 2009-05-07 2010-11-11 パナソニック株式会社 逐次比較型ａ／ｄ変換装置
US8310385B2 (en) * 2009-05-13 2012-11-13 Qualcomm, Incorporated Systems and methods for vector-based analog-to-digital converter sequential testing
US8477052B2 (en) 2011-04-05 2013-07-02 Freescale Semiconductor, Inc. Method and apparatus for self-test of successive approximation register (SAR) A/D converter
FR2990313A1 (fr) * 2012-05-07 2013-11-08 St Microelectronics Grenoble 2 Test de convertisseur analogique-numerique embarque
US9935646B2 (en) 2015-07-17 2018-04-03 Schweitzer Engineering Laboratories, Inc. Systems and methods for identifying a failure in an analog to digital converter
US9698809B1 (en) * 2016-07-19 2017-07-04 Scweitzer Engineering Laboratories, Inc. Systems and methods for analog to digital converter failure identification
US10033400B1 (en) 2017-10-18 2018-07-24 Schweitzer Engineering Laboratories, Inc. Analog-to-digital converter verification using quantization noise properties
US9985646B1 (en) 2017-10-18 2018-05-29 Schweitzer Engineering Laboratories, Inc. Analog-to-digital converter verification using quantization noise properties
DE102017221657A1 (de) * 2017-12-01 2019-06-06 Continental Automotive Gmbh Verfahren zum Durchführen eines Selbsttests einer elektrischen Wandlerschaltung sowie Wandlerschaltung und Fahrzeugleuchte
US11335426B2 (en) * 2020-10-16 2022-05-17 Micron Technology, Inc. Targeted test fail injection

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US3816813A (en) * 1972-01-24 1974-06-11 Spacetac Inc Automatic converter tester
FR2394928A1 (fr) * 1977-06-14 1979-01-12 Mcb Procede de controle de validite des informations fournies par les capteurs numeriques de deplacement et capteurs utilisant ce procede
SE417149B (sv) * 1979-03-30 1981-02-23 Ericsson Telefon Ab L M Overvakningssett och - anordning for signalamplitudomvandlare
US4352160A (en) * 1980-01-21 1982-09-28 The United States Of America As Represented By The Secretary Of The Air Force Statistical method of measuring the differential linearity of an analog/digital converter using a pseudo-random triangle wave stimulus
US4354177A (en) * 1980-11-07 1982-10-12 Fairchild Camera & Instr. Corp. Method and apparatus for calibrating an analog-to-digital converter for a digital-to-analog converter test system
JPS57119259A (en) * 1981-01-19 1982-07-24 Hitachi Ltd Testing method for a/d converter
DE3218066A1 (de) * 1981-07-08 1983-01-27 Siemens AG, 1000 Berlin und 8000 München Verfahren zur pruefung von analog-digital-wandlern und/oder von digital-analog-wandlern oder von nachrichtentechnischen uebertragungsabschnitten, die solche wandler enthalten oder mit ihnen in reihe geschaltet sind, insbsondere zur pruefung von codecs fuer pcm-geraete, sowie vorrichtung zur durchfuehrung des verfahrens
JPS60148227A (ja) * 1984-01-12 1985-08-05 Fujitsu Ltd Ａ／ｄ変換器の試験方法
JPS61137429A (ja) * 1984-12-07 1986-06-25 Matsushita Electric Ind Co Ltd Ａｄ変換器試験回路
JPS6272226A (ja) * 1985-09-26 1987-04-02 Hitachi Ltd Ａ／ｄ変換器試験方式
JPS62136129A (ja) * 1985-12-10 1987-06-19 Matsushita Electric Ind Co Ltd Ａ／ｄコンバ−タの試験方法
DD247334A1 (de) * 1986-03-05 1987-07-01 Mittweida Ing Hochschule Schaltungsanordnung fuer die ermittlung von linearietaets- und monotoniefehlern bei ad-wandlern
DD247384A1 (de) * 1986-03-31 1987-07-08 Leipzig Energiekombinat Verfahren und vorrichtung zur abscheidung von staeuben
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US4897650A (en) * 1988-04-05 1990-01-30 General Electric Company Self-characterizing analog-to-digital converter
US4908621A (en) * 1988-07-06 1990-03-13 Tektronix, Inc. Autocalibrated multistage A/D converter
JP2735076B2 (ja) * 1988-11-28 1998-04-02 富士通株式会社 アナログ／ディジタル変換器の試験方法

Also Published As

Publication number Publication date
EP0447117A3 (en) 1993-07-28
EP0447117B1 (de) 1997-02-19
HK118497A (en) 1997-09-05
EP0447117A2 (de) 1991-09-18
JP2619988B2 (ja) 1997-06-11
DE69124709T2 (de) 1997-05-28
US5132685A (en) 1992-07-21
JPH05291952A (ja) 1993-11-05

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee