HK118497A - Built-in self test for analog to digital converters - Google Patents

Built-in self test for analog to digital converters

Info

Publication number
HK118497A
HK118497A HK118497A HK118497A HK118497A HK 118497 A HK118497 A HK 118497A HK 118497 A HK118497 A HK 118497A HK 118497 A HK118497 A HK 118497A HK 118497 A HK118497 A HK 118497A
Authority
HK
Hong Kong
Prior art keywords
analog
built
digital converters
self test
self
Prior art date
Application number
HK118497A
Other languages
English (en)
Inventor
Michael R Dewitt
George F Cross Jr
R Ramachandran
Original Assignee
At & T Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by At & T Corp filed Critical At & T Corp
Publication of HK118497A publication Critical patent/HK118497A/xx

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/108—Converters having special provisions for facilitating access for testing purposes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318502—Test of Combinational circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
HK118497A 1990-03-15 1997-06-26 Built-in self test for analog to digital converters HK118497A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US49407090A 1990-03-15 1990-03-15

Publications (1)

Publication Number Publication Date
HK118497A true HK118497A (en) 1997-09-05

Family

ID=23962905

Family Applications (1)

Application Number Title Priority Date Filing Date
HK118497A HK118497A (en) 1990-03-15 1997-06-26 Built-in self test for analog to digital converters

Country Status (5)

Country Link
US (1) US5132685A (xx)
EP (1) EP0447117B1 (xx)
JP (1) JP2619988B2 (xx)
DE (1) DE69124709T2 (xx)
HK (1) HK118497A (xx)

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US6703952B2 (en) * 2002-06-10 2004-03-09 Adc Dsl Systems, Inc. Testing analog-to-digital and digital-to-analog converters
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US7102555B2 (en) * 2004-04-30 2006-09-05 Xilinx, Inc. Boundary-scan circuit used for analog and digital testing of an integrated circuit
US7599299B2 (en) * 2004-04-30 2009-10-06 Xilinx, Inc. Dynamic reconfiguration of a system monitor (DRPORT)
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US7081841B1 (en) * 2005-04-28 2006-07-25 Lsi Logic Corporation Analog to digital converter built in self test
TWI270254B (en) * 2005-09-16 2007-01-01 Univ Nat Chiao Tung Reprogrammable switched-capacitor input circuit for receiving digital test stimulus signal in analog test
KR100837270B1 (ko) * 2006-06-07 2008-06-11 삼성전자주식회사 스마트 카드 및 그것의 데이터 보안 방법
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US7733258B2 (en) * 2008-09-30 2010-06-08 Freescale Semiconductor, Inc. Data conversion circuitry for converting analog signals to digital signals and vice-versa and method therefor
US7880650B2 (en) * 2008-09-30 2011-02-01 Freescale Semiconductor, Inc. Method and apparatus for testing data converter
US7868796B2 (en) * 2008-09-30 2011-01-11 Freescale Semiconductor, Inc. Self-calibrating data conversion circuitry and method therefor
US7868795B2 (en) * 2008-09-30 2011-01-11 Freescale Semiconductor, Inc. Data conversion circuitry with an extra successive approximation step and method therefor
US7876254B2 (en) * 2008-09-30 2011-01-25 Freescale Semiconductor, Inc. Data conversion circuitry having successive approximation circuitry and method therefor
US8106801B2 (en) 2009-02-12 2012-01-31 Qualcomm, Incorporated Methods and apparatus for built in self test of analog-to-digital convertors
WO2010128541A1 (ja) * 2009-05-07 2010-11-11 パナソニック株式会社 逐次比較型ａ／ｄ変換装置
US8310385B2 (en) * 2009-05-13 2012-11-13 Qualcomm, Incorporated Systems and methods for vector-based analog-to-digital converter sequential testing
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FR2990313A1 (fr) * 2012-05-07 2013-11-08 St Microelectronics Grenoble 2 Test de convertisseur analogique-numerique embarque
US9935646B2 (en) 2015-07-17 2018-04-03 Schweitzer Engineering Laboratories, Inc. Systems and methods for identifying a failure in an analog to digital converter
US9698809B1 (en) * 2016-07-19 2017-07-04 Scweitzer Engineering Laboratories, Inc. Systems and methods for analog to digital converter failure identification
US9985646B1 (en) 2017-10-18 2018-05-29 Schweitzer Engineering Laboratories, Inc. Analog-to-digital converter verification using quantization noise properties
US10033400B1 (en) 2017-10-18 2018-07-24 Schweitzer Engineering Laboratories, Inc. Analog-to-digital converter verification using quantization noise properties
DE102017221657A1 (de) * 2017-12-01 2019-06-06 Continental Automotive Gmbh Verfahren zum Durchführen eines Selbsttests einer elektrischen Wandlerschaltung sowie Wandlerschaltung und Fahrzeugleuchte
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Also Published As

Publication number Publication date
EP0447117A2 (en) 1991-09-18
EP0447117B1 (en) 1997-02-19
DE69124709D1 (de) 1997-03-27
DE69124709T2 (de) 1997-05-28
JP2619988B2 (ja) 1997-06-11
EP0447117A3 (en) 1993-07-28
US5132685A (en) 1992-07-21
JPH05291952A (ja) 1993-11-05

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)