DE69120517D1 - Verfahren und Vorrichtung zur Untersuchung von durchsichtigen Objekten auf Fehler - Google Patents
Verfahren und Vorrichtung zur Untersuchung von durchsichtigen Objekten auf FehlerInfo
- Publication number
- DE69120517D1 DE69120517D1 DE69120517T DE69120517T DE69120517D1 DE 69120517 D1 DE69120517 D1 DE 69120517D1 DE 69120517 T DE69120517 T DE 69120517T DE 69120517 T DE69120517 T DE 69120517T DE 69120517 D1 DE69120517 D1 DE 69120517D1
- Authority
- DE
- Germany
- Prior art keywords
- defects
- transparent objects
- examining
- examining transparent
- objects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9036—Investigating the presence of flaws or contamination in a container or its contents using arrays of emitters or receivers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
- G01N2021/8832—Structured background, e.g. for transparent objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8877—Proximity analysis, local statistics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
Landscapes
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2411634A JPH06100555B2 (ja) | 1990-12-19 | 1990-12-19 | 透明物体の欠陥検査方法とその装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69120517D1 true DE69120517D1 (de) | 1996-08-01 |
DE69120517T2 DE69120517T2 (de) | 1996-12-19 |
Family
ID=18520604
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69120517T Expired - Fee Related DE69120517T2 (de) | 1990-12-19 | 1991-12-17 | Verfahren und Vorrichtung zur Untersuchung von durchsichtigen Objekten auf Fehler |
Country Status (7)
Country | Link |
---|---|
US (1) | US5216481A (de) |
EP (1) | EP0491555B1 (de) |
JP (1) | JPH06100555B2 (de) |
KR (1) | KR0166593B1 (de) |
AU (1) | AU647558B2 (de) |
CA (1) | CA2057670A1 (de) |
DE (1) | DE69120517T2 (de) |
Families Citing this family (69)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5243400A (en) * | 1992-04-27 | 1993-09-07 | Owens-Brockway Glass Container Inc. | Inspection of transparent containers |
JP2795595B2 (ja) * | 1992-06-26 | 1998-09-10 | セントラル硝子株式会社 | 透明板状体の欠点検出方法 |
JP3212389B2 (ja) * | 1992-10-26 | 2001-09-25 | 株式会社キリンテクノシステム | 固体上の異物検査方法 |
JPH0785061B2 (ja) * | 1993-04-12 | 1995-09-13 | 東洋ガラス株式会社 | 透明ガラス容器の裾底部の異物検査装置 |
US5442446A (en) * | 1994-08-19 | 1995-08-15 | Owens-Brockaway Glass Container Inc. | Inspection of transparent containers |
US6122048A (en) * | 1994-08-26 | 2000-09-19 | Pressco Technology Inc. | Integral field lens illumination for video inspection |
US5486692A (en) * | 1994-10-19 | 1996-01-23 | Emhart Glass Machinery Investments Inc. | Glassware inspection machine comprising diffused light sources and two-dimensional cameras |
US6148097A (en) * | 1995-06-07 | 2000-11-14 | Asahi Kogaku Kogyo Kabushiki Kaisha | Optical member inspecting apparatus and method of inspection thereof |
US5592286A (en) * | 1995-03-08 | 1997-01-07 | Alltrista Corporation | Container flange inspection system using an annular lens |
US5699152A (en) * | 1995-04-03 | 1997-12-16 | Alltrista Corporation | Electro-optical inspection system and method |
US5847822A (en) * | 1995-08-29 | 1998-12-08 | Asahi Kogaku Kogyo Kabushiki Kaisha | Optical element inspecting apparatus |
US5835207A (en) * | 1995-10-02 | 1998-11-10 | Asahi Kogaku Kogyo Kabushiki Kaisha | Optical member inspecting apparatus |
US5828500A (en) * | 1995-10-11 | 1998-10-27 | Asahi Kogaku Kogyo Kabushiki Kaisha | Optical element inspecting apparatus |
JP2976869B2 (ja) * | 1995-12-28 | 1999-11-10 | 日産自動車株式会社 | 表面欠陥検査装置 |
US5805279A (en) * | 1996-01-11 | 1998-09-08 | Alltrista Corporation | Method and apparatus for illuminating and imaging a can end coated with sealing material |
US6587581B1 (en) * | 1997-01-10 | 2003-07-01 | Hitachi, Ltd. | Visual inspection method and apparatus therefor |
US6034766A (en) * | 1997-03-05 | 2000-03-07 | Asahi Kogaku Kogyo Kabushiki Kaisha | Optical member inspection apparatus |
DE19741384A1 (de) * | 1997-09-19 | 1999-03-25 | Heuft Systemtechnik Gmbh | Verfahren zum Erkennen von diffus streuenden Materialien, Verunreinigungen und sonstigen Fehlern bei transparenten Gegenständen |
WO1999027491A1 (en) * | 1997-11-20 | 1999-06-03 | Cornell Research Foundation, Inc. | A fast method and system for determining local properties of striped patterns |
US6618495B1 (en) * | 1998-02-19 | 2003-09-09 | Emhart Glass, S.A. | Container inspection machine |
US7781723B1 (en) * | 1998-02-19 | 2010-08-24 | Emhart Glass S.A. | Container inspection machine using light source having spatially cyclically continuously varying intensity |
DE19813073A1 (de) * | 1998-03-25 | 1999-09-30 | Laser Sorter Gmbh | Verfahren und Vorrichtung zur Bestimmung der optischen Qualität und zur Detektion von Fehlern von Flachglas und anderen optisch transparenten Materialien, insbesondere von Drips, Fäden und Linien |
JP4147682B2 (ja) * | 1998-04-27 | 2008-09-10 | 旭硝子株式会社 | 被検物の欠点検査方法および検査装置 |
EP1006350A1 (de) * | 1998-11-30 | 2000-06-07 | Kirin Techno-System Corporation | Verfahren zur Detektion von Fehlern in Flaschen |
JP3284462B2 (ja) * | 1998-11-30 | 2002-05-20 | 株式会社キリンテクノシステム | 壜胴部の欠陥検出方法 |
US6208412B1 (en) * | 1999-06-14 | 2001-03-27 | Visteon Global Technologies, Inc. | Method and apparatus for determining optical quality |
DE10006663B4 (de) * | 2000-02-15 | 2006-10-05 | Metronom Ag | Verfahren zur Vermessung von langwelligen Oberflächenstrukturen |
US6424414B1 (en) * | 2000-10-16 | 2002-07-23 | Agr International, Inc. | Method and apparatus for detecting refractive defects in transparent containers |
DE60223956T3 (de) † | 2001-03-14 | 2011-05-19 | Hitachi Information & Control Solutions, Ltd., Hitachi | Untersuchungsgerät und System zur Untersuchung von Fremdkörpern in mit Flüssigkeit gefüllten Behältern |
US6532064B1 (en) * | 2001-10-16 | 2003-03-11 | Baader-Canpolar Inc. | Automatic inspection apparatus and method for simultaneous detection of anomalies in a 3-dimensional translucent object |
JP4072466B2 (ja) * | 2002-12-27 | 2008-04-09 | 日本板硝子株式会社 | 板状体の光学的歪みを評価する装置および方法 |
DE102004025948B3 (de) * | 2004-05-27 | 2006-03-16 | Krieg, Gunther, Prof. Dr.-Ing. | Verfahren und Vorrichtung zum Untersuchen von lichtdurchlässigen Objekten |
EP1866625A4 (de) * | 2005-04-06 | 2010-12-29 | Corning Inc | Glasprüfungssystem und verfahren zu seiner verwendung |
TWI255337B (en) * | 2005-05-20 | 2006-05-21 | Primax Electronics Ltd | Method and device for judging the quality of an optical element |
DE602005012163D1 (de) | 2005-09-09 | 2009-02-12 | Sacmi | Verfahren und vorrichtung zur optischen inspektion eines gegenstands |
JP4671848B2 (ja) * | 2005-11-29 | 2011-04-20 | セントラル硝子株式会社 | ガラス板の折割切断不良の検出方法 |
JP4801457B2 (ja) * | 2006-02-02 | 2011-10-26 | 株式会社リコー | 表面欠陥検査装置、表面欠陥検査方法及び表面欠陥検査プログラム |
DE102006025312A1 (de) * | 2006-05-31 | 2007-12-06 | GM Global Technology Operations, Inc., Detroit | Verfahren und Anordnung zur Erfassung der optischen Qualität einer transparenten Scheibe |
CN101382502B (zh) * | 2007-09-07 | 2011-07-27 | 鸿富锦精密工业(深圳)有限公司 | 表面污点检测系统及其检测方法 |
DE102008053876A1 (de) * | 2008-10-30 | 2010-05-06 | Khs Ag | Flaschennaht- und Embossingausrichtung |
DE102009020919A1 (de) * | 2009-05-12 | 2010-11-18 | Krones Ag | Vorrichtung zum Erkennen von Erhebungen und/oder Vertiefungen auf Flaschen, insbesondere in einer Etikettiermaschine |
DE102010012570A1 (de) * | 2010-03-23 | 2011-09-29 | Krones Ag | Vorrichtung und Verfahren zum Untersuchen von befüllten Behältnissen auf Fremdkörper |
FR2958751B1 (fr) * | 2010-04-13 | 2012-05-25 | Iris Inspection Machines | Procede de detection de defauts dans des articles verriers et installation pour la mise en oeuvre dudit procede |
FR2959864B1 (fr) * | 2010-05-06 | 2013-01-18 | Altatech Semiconductor | Dispositif et procede d'inspection de plaquettes semi-conductrices en mouvement. |
DE102010037448A1 (de) * | 2010-09-10 | 2012-03-15 | Wincor Nixdorf International Gmbh | Verfahren und Vorrichtung zur Erfassung von Leergutbehältern |
DE102010043632B4 (de) * | 2010-11-09 | 2017-08-24 | Krones Aktiengesellschaft | Verfahren zur Funktionskontrolle einer Inspektionsvorrichtung und Vorrichtung zur Inspektion eines Produktsstroms |
DE102011002269A1 (de) * | 2011-04-26 | 2012-10-31 | Wincor Nixdorf International Gmbh | Erfassungs- und Kalibriereinheit für Leergutrücknahmeautomaten und Verfahren zur Kalibrierung |
DE102011083377A1 (de) | 2011-09-26 | 2013-03-28 | Krones Aktiengesellschaft | Vorrichtung und Verfahren zum Ausrichten von Behältern |
FR2993662B1 (fr) | 2012-07-23 | 2015-05-15 | Msc & Sgcc | Procede et installation pour la detection notamment de defauts refractants |
US20140286563A1 (en) * | 2013-03-19 | 2014-09-25 | Industrial Video Solutions, Inc. | Accurate detection of low-contrast defects in transparent material |
US9329304B2 (en) | 2014-03-06 | 2016-05-03 | Microsoft Technology Licensing, Llc | Translucent object presence and condition detection based on detected light intensity |
JP6350158B2 (ja) * | 2014-09-16 | 2018-07-04 | 株式会社リコー | 撮像装置、媒体種別判定装置および画像形成装置 |
JP6471437B2 (ja) * | 2014-09-16 | 2019-02-20 | 株式会社リコー | 撮像装置、測色装置および画像形成装置 |
JP6373743B2 (ja) * | 2014-12-05 | 2018-08-15 | コマツNtc株式会社 | 面の評価方法および面の評価装置 |
US20160178535A1 (en) * | 2014-12-17 | 2016-06-23 | Xerox Corporation | Inspection Device And Method |
JP7046819B2 (ja) * | 2016-02-24 | 2022-04-04 | ベクトン ディキンソン フランス | 透明シリンダを検査するためのシステムおよび方法 |
BR102016028266A2 (pt) | 2016-12-01 | 2018-06-19 | Autaza Tecnologia Ltda - Epp | Método e sistema para a inspeção automática de qualidade de materiais |
JP6913811B2 (ja) * | 2017-02-06 | 2021-08-04 | 東洋ガラス株式会社 | ガラスびんの検査装置 |
US20190238796A1 (en) | 2017-05-11 | 2019-08-01 | Jacob Nathaniel Allen | Object Inspection System And Method For Inspecting An Object |
US10402963B2 (en) * | 2017-08-24 | 2019-09-03 | Kla-Tencor Corporation | Defect detection on transparent or translucent wafers |
US10580615B2 (en) | 2018-03-06 | 2020-03-03 | Globalfoundries Inc. | System and method for performing failure analysis using virtual three-dimensional imaging |
JP6988592B2 (ja) * | 2018-03-13 | 2022-01-05 | オムロン株式会社 | 画像検査装置、画像検査方法及び画像検査プログラム |
CN111179248B (zh) * | 2019-12-27 | 2023-06-09 | 深港产学研基地 | 一种透明平滑曲面缺陷识别方法及检测装置 |
CN112179287B (zh) * | 2020-08-19 | 2022-01-11 | 成都飞机工业(集团)有限责任公司 | 一种基于多视光源的快速测量装置及测量方法 |
BR102020024851A2 (pt) * | 2020-12-04 | 2022-06-21 | Autaza Tecnologia Ltda - Epp | Métodos e sistemas para a inspeção de qualidade de materiais e de superfícies tridimensionais em ambiente virtual |
CN117546008A (zh) * | 2021-06-22 | 2024-02-09 | 视泰科技控股公司 | 检查半透明物体的系统和方法 |
DE102022200614A1 (de) | 2022-01-20 | 2023-07-20 | Rodenstock Gmbh | Vorrichtung zur Untersuchung eines transparenten Werkstückes sowie die Verwendung einer solchen Vorrichtung als telezentrisches Messystem in Transmission |
DE102022104990A1 (de) | 2022-03-03 | 2023-09-07 | Emhart Glass Sa | VORRICHTUNG UND VERFAHREN ZUM INSPIZIEREN VON GEFÄßEN |
CN115937052B (zh) * | 2023-03-14 | 2023-05-16 | 四川福莱宝生物科技有限公司 | 一种凝胶电泳图像的处理方法、装置、设备及介质 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5546172A (en) * | 1978-09-29 | 1980-03-31 | Kirin Brewery Co Ltd | Detector for foreign material |
DE3237511A1 (de) * | 1982-10-09 | 1984-04-12 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München | Verfahren zur pruefung von glaserzeugnissen |
JPS61100604A (ja) * | 1984-10-24 | 1986-05-19 | Hajime Sangyo Kk | 表面検査装置 |
US4691231A (en) * | 1985-10-01 | 1987-09-01 | Vistech Corporation | Bottle inspection system |
DE68923653T2 (de) * | 1988-05-30 | 1996-01-18 | Kirin Techno Syst Yokohama | Verfahren und Vorrichtung zur Prüfung der Seitenwände von Flaschen. |
-
1990
- 1990-12-19 JP JP2411634A patent/JPH06100555B2/ja not_active Expired - Lifetime
-
1991
- 1991-12-13 CA CA002057670A patent/CA2057670A1/en not_active Abandoned
- 1991-12-17 EP EP91311715A patent/EP0491555B1/de not_active Expired - Lifetime
- 1991-12-17 AU AU89773/91A patent/AU647558B2/en not_active Ceased
- 1991-12-17 DE DE69120517T patent/DE69120517T2/de not_active Expired - Fee Related
- 1991-12-17 US US07/808,620 patent/US5216481A/en not_active Expired - Fee Related
- 1991-12-18 KR KR1019910023354A patent/KR0166593B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
AU8977391A (en) | 1992-06-25 |
KR0166593B1 (ko) | 1999-05-01 |
EP0491555A1 (de) | 1992-06-24 |
JPH04220551A (ja) | 1992-08-11 |
DE69120517T2 (de) | 1996-12-19 |
JPH06100555B2 (ja) | 1994-12-12 |
US5216481A (en) | 1993-06-01 |
KR920012905A (ko) | 1992-07-28 |
EP0491555B1 (de) | 1996-06-26 |
CA2057670A1 (en) | 1992-06-20 |
AU647558B2 (en) | 1994-03-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |