DE69008623D1 - Verfahren und Vorrichtung zur Untersuchung von Oberflächenfehlern. - Google Patents

Verfahren und Vorrichtung zur Untersuchung von Oberflächenfehlern.

Info

Publication number
DE69008623D1
DE69008623D1 DE69008623T DE69008623T DE69008623D1 DE 69008623 D1 DE69008623 D1 DE 69008623D1 DE 69008623 T DE69008623 T DE 69008623T DE 69008623 T DE69008623 T DE 69008623T DE 69008623 D1 DE69008623 D1 DE 69008623D1
Authority
DE
Germany
Prior art keywords
surface defects
examining surface
examining
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69008623T
Other languages
English (en)
Other versions
DE69008623T2 (de
Inventor
Sean Patrick Joseph Maguire
Kandiah Sivayoganathan
Velupillai Balendran
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jaguar Land Rover Ltd
Original Assignee
Jaguar Cars Ltd
Jaguar Land Rover Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB898915093A external-priority patent/GB8915093D0/en
Priority claimed from GB898920358A external-priority patent/GB8920358D0/en
Application filed by Jaguar Cars Ltd, Jaguar Land Rover Ltd filed Critical Jaguar Cars Ltd
Publication of DE69008623D1 publication Critical patent/DE69008623D1/de
Application granted granted Critical
Publication of DE69008623T2 publication Critical patent/DE69008623T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4726—Detecting scatter at 90°
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/556—Measuring separately scattering and specular
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/103—Scanning by mechanical motion of stage

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
DE69008623T 1989-06-30 1990-06-15 Verfahren und Vorrichtung zur Untersuchung von Oberflächenfehlern. Expired - Lifetime DE69008623T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB898915093A GB8915093D0 (en) 1989-06-30 1989-06-30 Methods of inspecting surfaces for defects
GB898920358A GB8920358D0 (en) 1989-09-08 1989-09-08 Methods of inspecting surfaces for defects

Publications (2)

Publication Number Publication Date
DE69008623D1 true DE69008623D1 (de) 1994-06-09
DE69008623T2 DE69008623T2 (de) 1994-08-18

Family

ID=26295564

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69008623T Expired - Lifetime DE69008623T2 (de) 1989-06-30 1990-06-15 Verfahren und Vorrichtung zur Untersuchung von Oberflächenfehlern.

Country Status (4)

Country Link
US (1) US5086232A (de)
EP (1) EP0405806B1 (de)
JP (1) JP2931640B2 (de)
DE (1) DE69008623T2 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2692355B1 (fr) * 1992-06-10 1997-06-20 Valinox Dispositif et procede de detection au defile de defauts de surface sur des produits longs metalliques.
US5878153A (en) * 1994-06-24 1999-03-02 Ford Global Technologies, Inc. Method for monitoring coating adhesion propensity based on surface morphology
US5844801A (en) * 1994-12-08 1998-12-01 Honda Giken Kogyo Kabushiki Kaisha Method of inspecting and manufacturing vehicle body
KR100267665B1 (ko) * 1997-08-28 2001-01-15 하나와 요시카즈 표면검사장치
AU4277501A (en) * 2000-03-24 2001-10-03 Olympus Optical Co., Ltd. Apparatus for detecting defect
GB2376068A (en) * 2001-05-31 2002-12-04 Millennium Venture Holdings Lt Method and apparatus of in-process inspection
DE50307761D1 (de) * 2003-04-03 2007-09-06 Erwin Pristner Vorrichtung zum Erfassen, Bestimmen und Dokumentieren von Schäden, insbesondere durch plötzliche Ereignisse verursachte Deformationen an lackierten Oberflächen
US7362450B2 (en) * 2005-12-23 2008-04-22 Xerox Corporation Specular surface flaw detection
FR2908514B1 (fr) * 2006-11-10 2009-04-17 Peugeot Citroen Automobiles Sa Procede et installation de controle de la qualite de pieces
DE102009009272B4 (de) * 2009-02-17 2013-02-28 Siemens Aktiengesellschaft Qualitätsprüfung für Rotorblätter einer Windenergieanlage
JP4685971B2 (ja) * 2009-09-24 2011-05-18 株式会社ケー・デー・イー 検査システム及び検査方法
JP5649549B2 (ja) 2011-10-13 2015-01-07 株式会社シマノ 自転車用駆動ユニット
KR101416383B1 (ko) 2012-11-16 2014-07-16 현대자동차 주식회사 차량용 도어 검사 시스템 및 그 제어방법
FR3028867B1 (fr) * 2014-11-26 2016-12-09 Intelligence Artificielle Applications Procede et dispositif de detection d'ensemencement et installation automatisee d'ensemencement equipee d'un tel dispositif de detection
DE202018103274U1 (de) 2018-06-11 2018-06-22 ATB Blank GmbH Vorrichtung zur Oberflächeninspektion eines Kraftfahrzeugs
DE102018113919A1 (de) 2018-06-11 2019-12-12 ATB Blank GmbH Vorrichtung zur Oberflächeninspektion eines Kraftfahrzeugs und Verfahren hierzu
EP3881058A1 (de) * 2018-11-14 2021-09-22 3M Innovative Properties Company Verfahren und system zur charakterisierung von oberflächengleichförmigkeit
CN111650201B (zh) * 2020-07-15 2023-06-06 Oppo（重庆）智能科技有限公司 检测装置及检测方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5357087A (en) * 1976-11-04 1978-05-24 Oki Electric Ind Co Ltd Flaw detecting system
DE2827704C3 (de) * 1978-06-23 1981-03-19 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung der Lichtaustrittswinkel
JPS58204350A (ja) * 1982-05-24 1983-11-29 Kawasaki Steel Corp 金属物体表面探傷方法
JPS59108903A (ja) * 1982-12-14 1984-06-23 Kawasaki Steel Corp 電縫管のシ−ム位置検出方法
GB2133871A (en) * 1982-12-23 1984-08-01 Austin Rover Group Apparatus for a method of inspecting automotive components
GB2159271B (en) * 1984-04-27 1988-05-18 Nissan Motor Surface flaw detecting method and apparatus
JPS6262205A (ja) * 1985-09-13 1987-03-18 Toray Ind Inc 物体の表面凹凸検査方法
US4759074A (en) * 1986-10-28 1988-07-19 General Motors Corporation Method for automatically inspecting parts utilizing machine vision and system utilizing same
DE3637477A1 (de) * 1986-11-04 1988-05-11 Wacker Chemitronic Verfahren und vorrichtung zur ermittlung der qualitaet von oberflaechen, insbesondere von halbleiterscheiben
US4853777A (en) * 1987-07-07 1989-08-01 Ashland Oil, Inc. Method for evaluating smooth surfaces
JPH0820371B2 (ja) * 1988-01-21 1996-03-04 株式会社ニコン 欠陥検査装置及び欠陥検査方法
US4966455A (en) * 1988-12-05 1990-10-30 Union Camp Corporation Real time mottle measuring device and method

Also Published As

Publication number Publication date
JP2931640B2 (ja) 1999-08-09
US5086232A (en) 1992-02-04
EP0405806A2 (de) 1991-01-02
EP0405806B1 (de) 1994-05-04
EP0405806A3 (en) 1991-04-24
DE69008623T2 (de) 1994-08-18
JPH0342559A (ja) 1991-02-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8330 Complete renunciation