DE69033029D1 - Verbesserte elektrische verbindungen für ic-chip-tester - Google Patents

Verbesserte elektrische verbindungen für ic-chip-tester

Info

Publication number
DE69033029D1
DE69033029D1 DE69033029T DE69033029T DE69033029D1 DE 69033029 D1 DE69033029 D1 DE 69033029D1 DE 69033029 T DE69033029 T DE 69033029T DE 69033029 T DE69033029 T DE 69033029T DE 69033029 D1 DE69033029 D1 DE 69033029D1
Authority
DE
Germany
Prior art keywords
electrical connections
improved electrical
chip tester
tester
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69033029T
Other languages
English (en)
Other versions
DE69033029T2 (de
Inventor
Arun Shah
David Mcclung
Albert Hopfer
Richard Lindeman
Saeed Zafar
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cinch Connectors Inc
Original Assignee
Labinal Components and Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Labinal Components and Systems Inc filed Critical Labinal Components and Systems Inc
Publication of DE69033029D1 publication Critical patent/DE69033029D1/de
Application granted granted Critical
Publication of DE69033029T2 publication Critical patent/DE69033029T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/32—Holders for supporting the complete device in operation, i.e. detachable fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE69033029T 1989-06-09 1990-05-14 Verbesserte elektrische verbindungen für ic-chip-tester Expired - Fee Related DE69033029T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US36434389A 1989-06-09 1989-06-09
PCT/US1990/002875 WO1990015517A1 (en) 1989-06-09 1990-05-14 Improved electrical connectors and ic chip tester embodying same

Publications (2)

Publication Number Publication Date
DE69033029D1 true DE69033029D1 (de) 1999-05-06
DE69033029T2 DE69033029T2 (de) 1999-08-12

Family

ID=23434082

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69033029T Expired - Fee Related DE69033029T2 (de) 1989-06-09 1990-05-14 Verbesserte elektrische verbindungen für ic-chip-tester

Country Status (6)

Country Link
EP (1) EP0428681B1 (de)
JP (1) JP2891539B2 (de)
CA (1) CA1320546C (de)
DE (1) DE69033029T2 (de)
ES (1) ES2130122T3 (de)
WO (1) WO1990015517A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04162382A (ja) * 1990-10-25 1992-06-05 Canon Inc Ｉｃソケット
EP0689241A2 (de) * 1991-10-17 1995-12-27 Fujitsu Limited Halter für Halbleiterteil
JP2894431B2 (ja) * 1995-11-15 1999-05-24 日本電気株式会社 ベアチップソケット
FR2786275B1 (fr) * 1998-11-20 2001-02-02 Adeunis R F Equipement de test pour des composants electroniques radiofrequences ou numeriques rapides
DE10309103A1 (de) * 2003-02-28 2004-09-09 Bayerische Motoren Werke Ag Elektrischer Steckverbinder
JP4863130B2 (ja) 2009-05-22 2012-01-25 山一電機株式会社 基板接続用コネクタ、それを備える半導体装置用ソケット、ケーブル用コネクタ、および、ボードツーボードコネクタ
KR102002518B1 (ko) * 2018-04-27 2019-07-22 이승용 Fpcb 및 디스플레이 패널 테스트용 테스트 소켓 및 테스트 장치
US11350525B2 (en) * 2020-05-18 2022-05-31 Nuvoton Technology Corporation Method and apparatus for mounting a DUT on a test board without use of socket or solder
KR102606908B1 (ko) * 2020-12-23 2023-11-24 (주)마이크로컨텍솔루션 반도체 칩 테스트 소켓
KR102551966B1 (ko) * 2023-01-04 2023-07-06 주식회사 피엠티 프로브 카드의 지지 어셈블리

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4431404Y1 (de) * 1967-01-20 1969-12-24
US4029375A (en) * 1976-06-14 1977-06-14 Electronic Engineering Company Of California Miniature electrical connector
US4236776A (en) * 1978-08-24 1980-12-02 Augat Inc. Electrical contact with improved means for solder wicking and degassing
US4581679A (en) * 1983-05-31 1986-04-08 Trw Inc. Multi-element circuit construction
DK291184D0 (da) * 1984-06-13 1984-06-13 Boeegh Petersen Allan Fremgangsmaade og indretning til test af kredsloebsplader
US4620761A (en) * 1985-01-30 1986-11-04 Texas Instruments Incorporated High density chip socket
JPS62165958A (ja) * 1986-01-17 1987-07-22 Hitachi Vlsi Eng Corp 半導体装置の電気特性測定用ソケツト
GB2189657B (en) * 1986-04-25 1990-02-14 Plessey Co Plc Improvements in or relating to electrical contactors
BE1000697A6 (fr) * 1987-10-28 1989-03-14 Irish Transformers Ltd Appareil pour tester des circuits electriques integres.

Also Published As

Publication number Publication date
EP0428681A4 (en) 1992-07-22
EP0428681B1 (de) 1999-03-31
JP2891539B2 (ja) 1999-05-17
WO1990015517A1 (en) 1990-12-13
EP0428681A1 (de) 1991-05-29
JPH04501192A (ja) 1992-02-27
DE69033029T2 (de) 1999-08-12
ES2130122T3 (es) 1999-07-01
CA1320546C (en) 1993-07-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: CINCH CONNECTORS, INC., LOMBARD, ILL., US

8339 Ceased/non-payment of the annual fee