FR2786275B1 - Equipement de test pour des composants electroniques radiofrequences ou numeriques rapides - Google Patents

Equipement de test pour des composants electroniques radiofrequences ou numeriques rapides

Info

Publication number
FR2786275B1
FR2786275B1 FR9814859A FR9814859A FR2786275B1 FR 2786275 B1 FR2786275 B1 FR 2786275B1 FR 9814859 A FR9814859 A FR 9814859A FR 9814859 A FR9814859 A FR 9814859A FR 2786275 B1 FR2786275 B1 FR 2786275B1
Authority
FR
France
Prior art keywords
electronic components
test equipment
digital electronic
fast radio
radio
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9814859A
Other languages
English (en)
Other versions
FR2786275A1 (fr
Inventor
Pascal Champaney
Herve Vincent
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Adeunis RF SA
Original Assignee
Adeunis RF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Adeunis RF SA filed Critical Adeunis RF SA
Priority to FR9814859A priority Critical patent/FR2786275B1/fr
Publication of FR2786275A1 publication Critical patent/FR2786275A1/fr
Application granted granted Critical
Publication of FR2786275B1 publication Critical patent/FR2786275B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
FR9814859A 1998-11-20 1998-11-20 Equipement de test pour des composants electroniques radiofrequences ou numeriques rapides Expired - Fee Related FR2786275B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9814859A FR2786275B1 (fr) 1998-11-20 1998-11-20 Equipement de test pour des composants electroniques radiofrequences ou numeriques rapides

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9814859A FR2786275B1 (fr) 1998-11-20 1998-11-20 Equipement de test pour des composants electroniques radiofrequences ou numeriques rapides

Publications (2)

Publication Number Publication Date
FR2786275A1 FR2786275A1 (fr) 2000-05-26
FR2786275B1 true FR2786275B1 (fr) 2001-02-02

Family

ID=9533185

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9814859A Expired - Fee Related FR2786275B1 (fr) 1998-11-20 1998-11-20 Equipement de test pour des composants electroniques radiofrequences ou numeriques rapides

Country Status (1)

Country Link
FR (1) FR2786275B1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH695122A5 (fr) * 2002-02-20 2005-12-15 Ismeca Semiconductor Holding Système d'actionnement de contacteur de composants électroniques comprenant un mécanisme de contrôle de la force de contact.
CN108127955A (zh) * 2018-01-03 2018-06-08 深圳市信维通信股份有限公司 一种冷压与rf测试合并的天线生产治具

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1320546C (fr) * 1989-06-09 1993-07-20 Arun Jayantilal Shah Connecteurs electriques et testeur de puces de circuits integres utilisant ces connecteurs
DE4136752A1 (de) * 1991-11-08 1993-05-13 Deutsche Aerospace Vorrichtung zum messen der elektrischen eigenschaften eines einzelnen in einem gehaeuse angeordneten leistungstransistors

Also Published As

Publication number Publication date
FR2786275A1 (fr) 2000-05-26

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Legal Events

Date Code Title Description
TP Transmission of property
ST Notification of lapse

Effective date: 20110801