DE69029076T2 - Verfahren und Vorrichtung zur Messung des thermischen Diffusionsvermögens mittels AC-Joulescher Heizung - Google Patents

Verfahren und Vorrichtung zur Messung des thermischen Diffusionsvermögens mittels AC-Joulescher Heizung

Info

Publication number
DE69029076T2
DE69029076T2 DE69029076T DE69029076T DE69029076T2 DE 69029076 T2 DE69029076 T2 DE 69029076T2 DE 69029076 T DE69029076 T DE 69029076T DE 69029076 T DE69029076 T DE 69029076T DE 69029076 T2 DE69029076 T2 DE 69029076T2
Authority
DE
Germany
Prior art keywords
measuring
thermal diffusivity
joule heating
joule
heating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69029076T
Other languages
English (en)
Other versions
DE69029076D1 (de
Inventor
Toshimasa Hashimoto
Akira Miyamoto
Kohei Shizuka
Teruo Hyugaji
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AI-PHASE CO.,LTD., TOKIO/TOKYO, JP
Original Assignee
Mitsui Toatsu Chemicals Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsui Toatsu Chemicals Inc filed Critical Mitsui Toatsu Chemicals Inc
Application granted granted Critical
Publication of DE69029076D1 publication Critical patent/DE69029076D1/de
Publication of DE69029076T2 publication Critical patent/DE69029076T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/18Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
DE69029076T 1989-08-30 1990-08-29 Verfahren und Vorrichtung zur Messung des thermischen Diffusionsvermögens mittels AC-Joulescher Heizung Expired - Fee Related DE69029076T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP22364189 1989-08-30
JP22364089 1989-08-30

Publications (2)

Publication Number Publication Date
DE69029076D1 DE69029076D1 (de) 1996-12-12
DE69029076T2 true DE69029076T2 (de) 1997-03-06

Family

ID=26525604

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69029076T Expired - Fee Related DE69029076T2 (de) 1989-08-30 1990-08-29 Verfahren und Vorrichtung zur Messung des thermischen Diffusionsvermögens mittels AC-Joulescher Heizung

Country Status (3)

Country Link
US (1) US5080495A (de)
EP (1) EP0419873B1 (de)
DE (1) DE69029076T2 (de)

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JP2688012B2 (ja) * 1995-05-12 1997-12-08 工業技術院長 熱拡散率測定方法
US6095679A (en) * 1996-04-22 2000-08-01 Ta Instruments Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy
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US6079253A (en) * 1997-12-31 2000-06-27 Honeywell Inc. Method and apparatus for measuring selected properties of a fluid of interest using a single heater element
US6019505A (en) * 1997-12-31 2000-02-01 Honeywell Inc. Time lag approach for measuring thermal conductivity and specific heat
US6223593B1 (en) 1997-12-31 2001-05-01 Honeywell International Inc. Self-oscillating fluid sensor
US6169965B1 (en) 1997-12-31 2001-01-02 Honeywell International Inc. Fluid property and flow sensing via a common frequency generator and FFT
US6331075B1 (en) 1998-05-01 2001-12-18 Administrator, National Aeronautics And Space Administration Device and method for measuring thermal conductivity of thin films
US6393894B1 (en) 1999-07-27 2002-05-28 Honeywell International Inc. Gas sensor with phased heaters for increased sensitivity
US6502459B1 (en) 2000-09-01 2003-01-07 Honeywell International Inc. Microsensor for measuring velocity and angular direction of an incoming air stream
JP3430258B2 (ja) * 2000-10-17 2003-07-28 独立行政法人産業技術総合研究所 熱拡散率と界面熱抵抗の測定方法
US20050002435A1 (en) * 2001-11-19 2005-01-06 Toshimasa Hashimoto Method for thermal analysis and system for thermal analysis
NL1021400C2 (nl) * 2002-09-05 2004-03-08 Tno Werkwijze en inrichting voor het bepalen van een faseovergang van een stof.
US7000452B2 (en) 2002-09-27 2006-02-21 Honeywell International Inc. Phased micro fluid analyzer
US7530257B2 (en) 2002-09-27 2009-05-12 Honeywell International Inc. Phased micro analyzer VIII
US7367216B2 (en) 2002-09-27 2008-05-06 Honeywell International Inc. Phased micro analyzer V, VI
US7104112B2 (en) 2002-09-27 2006-09-12 Honeywell International Inc. Phased micro analyzer IV
EP1422518A1 (de) * 2002-11-20 2004-05-26 Communaute Europeenne Verfahren und System zur Messung des thermischen Diffusionsvermögens
DE10309205A1 (de) * 2003-02-28 2004-09-30 Abb Research Ltd. Verfahren und Schaltung zum Betreiben eines Wärmeleitfähigkeitsdetektors
KR100814414B1 (ko) * 2003-09-01 2008-03-18 학교법인 포항공과대학교 발열량 측정장치 및 방법
US9029028B2 (en) 2003-12-29 2015-05-12 Honeywell International Inc. Hydrogen and electrical power generator
US7578167B2 (en) 2005-05-17 2009-08-25 Honeywell International Inc. Three-wafer channel structure for a fluid analyzer
FR2952182B1 (fr) 2009-10-30 2012-09-21 Commissariat Energie Atomique Procede de caracterisation thermique d'une portion de materiau
US8523312B2 (en) 2010-11-08 2013-09-03 Seagate Technology Llc Detection system using heating element temperature oscillations
EP2591471B1 (de) 2010-11-17 2017-05-10 Seagate Technology LLC Kopfumwandler mit mehreren resistenztemperatursensoren für kopfmediumabstands- und -kontaktdetektion
US8992076B2 (en) * 2010-12-15 2015-03-31 Waters Gmbh Dilatometer for measuring metallic samples
WO2013013134A2 (en) * 2011-07-21 2013-01-24 The Trustees Of Columbia University In The City Of New York Method of collecting and processing electron diffraction data
CN104155336B (zh) * 2014-07-17 2016-08-24 清华大学 同时测定低维材料热导率、热扩散率和热容的方法及系统
US10345130B2 (en) 2016-11-22 2019-07-09 Honeywell International Inc. Airflow sensor with thermal conductivity and diffusivity sensing
CN109557129B (zh) * 2018-10-29 2021-05-11 同济大学 一种薄膜热扩散系数的测量方法
US11835478B2 (en) * 2021-07-29 2023-12-05 Long Victory Instruments Co., Ltd. Method for measuring the transient thermal diffusion performance of a heat dissipation module

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SU838538A1 (ru) * 1979-06-06 1981-06-15 Предприятие П/Я В-2015 Устройство дл дифференциальногоТЕРМичЕСКОгО АНАлизА
SU894512A1 (ru) * 1979-09-26 1981-12-30 Краснодарский политехнический институт Устройство дл определени теплофизических характеристик материалов
DD152204A1 (de) * 1980-07-21 1981-11-18 Juergen Dreyer Messverfahren zur bestimmung des waermedurchlasswiderstandes von ebenen bauwerksteilen
PL139300B1 (en) * 1983-04-27 1987-01-31 Pan Ct Badan Molekularnych I M Method of determination of thermal conductivity and heat storage capacity of materials and apparatus therefor
JPS6036944A (ja) * 1983-08-09 1985-02-26 Rigaku Denki Kk 熱伝導率測定装置
JPS60201224A (ja) * 1984-03-27 1985-10-11 Kyushu Daigaku 多層薄膜熱伝達ゲ−ジ
SU1293606A1 (ru) * 1985-04-08 1987-02-28 Киевский технологический институт легкой промышленности Способ измерени коэффициента температуропроводности материалов и устройство дл его осуществлени
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US4859078A (en) * 1986-02-07 1989-08-22 Massachusetts Institute Of Technology Apparatus for the non-invasive measurement of thermal properties and perfusion rates of biomaterials
JPS6461140A (en) * 1987-09-01 1989-03-08 Mitsubishi Electric Corp Data transmission equipment

Also Published As

Publication number Publication date
EP0419873B1 (de) 1996-11-06
EP0419873A2 (de) 1991-04-03
US5080495A (en) 1992-01-14
EP0419873A3 (en) 1991-07-03
DE69029076D1 (de) 1996-12-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: MITSUI CHEMICALS, INC., TOKIO/TOKYO, JP

8327 Change in the person/name/address of the patent owner

Owner name: AI-PHASE CO.,LTD., TOKIO/TOKYO, JP

8339 Ceased/non-payment of the annual fee