DE69028588D1 - Teilchengrössenanalyse unter benutzung der polarisierten differentiellen streuintensität - Google Patents

Teilchengrössenanalyse unter benutzung der polarisierten differentiellen streuintensität

Info

Publication number
DE69028588D1
DE69028588D1 DE69028588T DE69028588T DE69028588D1 DE 69028588 D1 DE69028588 D1 DE 69028588D1 DE 69028588 T DE69028588 T DE 69028588T DE 69028588 T DE69028588 T DE 69028588T DE 69028588 D1 DE69028588 D1 DE 69028588D1
Authority
DE
Germany
Prior art keywords
scattering
particle size
size analysis
screen intensity
scattered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69028588T
Other languages
English (en)
Other versions
DE69028588T2 (de
Inventor
Steven Bott
W Hart
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beckman Coulter Inc
Original Assignee
Coulter Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coulter Electronics Inc filed Critical Coulter Electronics Inc
Application granted granted Critical
Publication of DE69028588D1 publication Critical patent/DE69028588D1/de
Publication of DE69028588T2 publication Critical patent/DE69028588T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4792—Polarisation of scatter light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE69028588T 1989-03-03 1990-03-01 Teilchengrössenanalyse unter benutzung der polarisierten differentiellen streuintensität Expired - Lifetime DE69028588T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/319,480 US4953978A (en) 1989-03-03 1989-03-03 Particle size analysis utilizing polarization intensity differential scattering
PCT/US1990/001139 WO1990010215A1 (en) 1989-03-03 1990-03-01 Particle size analysis utilizing polarization intensity differential scattering

Publications (2)

Publication Number Publication Date
DE69028588D1 true DE69028588D1 (de) 1996-10-24
DE69028588T2 DE69028588T2 (de) 1997-04-17

Family

ID=23242412

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69028588T Expired - Lifetime DE69028588T2 (de) 1989-03-03 1990-03-01 Teilchengrössenanalyse unter benutzung der polarisierten differentiellen streuintensität

Country Status (6)

Country Link
US (1) US4953978A (de)
EP (1) EP0413812B1 (de)
JP (1) JP2930710B2 (de)
AT (1) ATE143138T1 (de)
DE (1) DE69028588T2 (de)
WO (1) WO1990010215A1 (de)

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JP3285309B2 (ja) * 1996-03-26 2002-05-27 株式会社堀場製作所 光検出器
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US10620105B2 (en) * 2004-03-06 2020-04-14 Michael Trainer Methods and apparatus for determining characteristics of particles from scattered light
US8634072B2 (en) * 2004-03-06 2014-01-21 Michael Trainer Methods and apparatus for determining characteristics of particles
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US7612871B2 (en) 2004-09-01 2009-11-03 Honeywell International Inc Frequency-multiplexed detection of multiple wavelength light for flow cytometry
JP4227991B2 (ja) * 2005-12-28 2009-02-18 トヨタ自動車株式会社 排ガス分析装置および排ガス分析方法
FR2897003B1 (fr) * 2006-02-03 2008-04-11 Realisations Tech S E R T Sarl Procede de controle de l'ecoulement d'un adjuvant de coulee d'un metal fondu
JP4594277B2 (ja) 2006-05-31 2010-12-08 トヨタ自動車株式会社 排ガス分析装置におけるセンサユニット
JP4732277B2 (ja) 2006-08-23 2011-07-27 トヨタ自動車株式会社 ガス分析装置及びガス分析方法
WO2009063322A2 (en) * 2007-08-15 2009-05-22 Malvern Instruments Ltd Broad-range spectrometer
EP2333516A4 (de) * 2008-09-26 2017-11-08 Horiba, Ltd. Vorrichtung zur messung der physikalischen eigenschaften von partikeln
JP5517000B2 (ja) * 2009-10-16 2014-06-11 国立大学法人群馬大学 粒径計測装置、及び粒径計測方法
KR101805941B1 (ko) * 2010-03-10 2017-12-06 베크만 컬터, 인코포레이티드 입자 분석기에서의 펄스 파라미터 발생
WO2012036794A2 (en) * 2010-08-01 2012-03-22 Array Optronix, Inc. Photodetectors with light incident surface and contact surface and applications thereof
GB2494733A (en) * 2011-09-14 2013-03-20 Malvern Instr Ltd Measuring particle size distribution by light scattering
RU2485481C1 (ru) * 2011-12-16 2013-06-20 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Южно-Российский государственный университет экономики и сервиса" (ФГБОУ ВПО "ЮРГУЭС") Способ анализа взвешенных частиц
RU2503947C1 (ru) * 2012-04-23 2014-01-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Южно-Российский государственный университет экономики и сервиса" (ФГБОУ ВПО "ЮРГУЭС") Способ анализа взвешенных частиц
EP2869054A1 (de) * 2013-11-05 2015-05-06 Malvern Instruments Limited Verbesserungen in Zusammenhang mit Partikelcharakterisierung
EP2869055A1 (de) * 2013-11-05 2015-05-06 Malvern Instruments Limited Verbesserungen in Zusammenhang mit Partikelcharakterisierung
WO2016063364A1 (ja) * 2014-10-22 2016-04-28 株式会社日立ハイテクノロジーズ 細胞計測機構及びそれを有する細胞培養装置並びに細胞計測方法
US10386284B2 (en) 2016-01-29 2019-08-20 JianFeng Zhang Device and method for measurement of dispersed objects using fluorescent and non-fluorescent imaging with laser
EP3279635B1 (de) 2016-08-04 2022-06-01 Malvern Panalytical Limited Verfahren, prozessor und maschinenlesbares, nicht-transientes speichermedium zur characterisierung von partikeln suspendiert in einem flüssigen dispergens
US10591422B2 (en) * 2017-10-05 2020-03-17 Honeywell International Inc. Apparatus and method for increasing dynamic range of a particle sensor
US10359350B1 (en) * 2018-01-23 2019-07-23 Hai Lin Method and system for particle characterization in harsh environments
WO2019202648A1 (ja) * 2018-04-16 2019-10-24 株式会社島津製作所 光散乱検出装置
FR3090874B1 (fr) * 2018-12-21 2022-05-27 Commissariat Energie Atomique Détecteur optique de particules
FR3100333B1 (fr) * 2019-09-03 2021-09-17 Cordouan Tech Sas Dispositif et procédé de détermination de paramètres caractéristiques des dimensions de nanoparticules
RU2767953C1 (ru) * 2021-06-26 2022-03-22 федеральное государственное бюджетное образовательное учреждение высшего образования «Донской государственный технический университет», (ДГТУ) Устройство анализа взвешенных частиц

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Also Published As

Publication number Publication date
DE69028588T2 (de) 1997-04-17
US4953978A (en) 1990-09-04
EP0413812B1 (de) 1996-09-18
JPH03505131A (ja) 1991-11-07
EP0413812A4 (en) 1992-06-24
JP2930710B2 (ja) 1999-08-03
ATE143138T1 (de) 1996-10-15
WO1990010215A1 (en) 1990-09-07
EP0413812A1 (de) 1991-02-27

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Legal Events

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Owner name: COULTER INTERNATIONAL CORP., MIAMI, FLA., US