DE69024669D1 - Elektrische Verbinderstruktur und Verfahren, einen elektrischen Verbindungsaufbau zu erhalten - Google Patents
Elektrische Verbinderstruktur und Verfahren, einen elektrischen Verbindungsaufbau zu erhaltenInfo
- Publication number
- DE69024669D1 DE69024669D1 DE69024669T DE69024669T DE69024669D1 DE 69024669 D1 DE69024669 D1 DE 69024669D1 DE 69024669 T DE69024669 T DE 69024669T DE 69024669 T DE69024669 T DE 69024669T DE 69024669 D1 DE69024669 D1 DE 69024669D1
- Authority
- DE
- Germany
- Prior art keywords
- obtaining
- connector structure
- electrical
- electrical connection
- electrical connector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/50—Multistep manufacturing processes of assemblies consisting of devices, each device being of a type provided for in group H01L27/00 or H01L29/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/563—Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3431—Leadless components
- H05K3/3436—Leadless components having an array of bottom contacts, e.g. pad grid array or ball grid array components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/8119—Arrangement of the bump connectors prior to mounting
- H01L2224/81191—Arrangement of the bump connectors prior to mounting wherein the bump connectors are disposed only on the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/8138—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/81399—Material
- H01L2224/814—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/10234—Metallic balls
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10954—Other details of electrical connections
- H05K2201/10977—Encapsulated connections
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10954—Other details of electrical connections
- H05K2201/10992—Using different connection materials, e.g. different solders, for the same connection
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/04—Soldering or other types of metallurgic bonding
- H05K2203/041—Solder preforms in the shape of solder balls
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Engineering & Computer Science (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Combinations Of Printed Boards (AREA)
- Manufacturing Of Electrical Connectors (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/555,120 US5060844A (en) | 1990-07-18 | 1990-07-18 | Interconnection structure and test method |
PCT/US1990/005962 WO1992002039A1 (en) | 1990-07-18 | 1990-10-17 | Improved interconnection structure and test method |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69024669D1 true DE69024669D1 (de) | 1996-02-15 |
DE69024669T2 DE69024669T2 (de) | 1996-07-04 |
Family
ID=24216049
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69024669T Expired - Fee Related DE69024669T2 (de) | 1990-07-18 | 1990-10-17 | Elektrische Verbinderstruktur und Verfahren, einen elektrischen Verbindungsaufbau zu erhalten |
Country Status (5)
Country | Link |
---|---|
US (1) | US5060844A (de) |
EP (1) | EP0550432B1 (de) |
JP (1) | JP2567993B2 (de) |
DE (1) | DE69024669T2 (de) |
WO (1) | WO1992002039A1 (de) |
Families Citing this family (102)
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---|---|---|---|---|
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US5261155A (en) * | 1991-08-12 | 1993-11-16 | International Business Machines Corporation | Method for bonding flexible circuit to circuitized substrate to provide electrical connection therebetween using different solders |
US5186383A (en) * | 1991-10-02 | 1993-02-16 | Motorola, Inc. | Method for forming solder bump interconnections to a solder-plated circuit trace |
US5255839A (en) * | 1992-01-02 | 1993-10-26 | Motorola, Inc. | Method for solder application and reflow |
US5222014A (en) * | 1992-03-02 | 1993-06-22 | Motorola, Inc. | Three-dimensional multi-chip pad array carrier |
US5163605A (en) * | 1992-04-30 | 1992-11-17 | Allied-Signal Inc. | Method for mounting components to a circuit board |
US5234149A (en) * | 1992-08-28 | 1993-08-10 | At&T Bell Laboratories | Debondable metallic bonding method |
US5221038A (en) * | 1992-10-05 | 1993-06-22 | Motorola, Inc. | Method for forming tin-indium or tin-bismuth solder connection having increased melting temperature |
KR960005042B1 (ko) * | 1992-11-07 | 1996-04-18 | 금성일렉트론주식회사 | 반도체 펙케지 |
US5324569A (en) * | 1993-02-26 | 1994-06-28 | Hewlett-Packard Company | Composite transversely plastic interconnect for microchip carrier |
US5275330A (en) * | 1993-04-12 | 1994-01-04 | International Business Machines Corp. | Solder ball connect pad-on-via assembly process |
US5401913A (en) * | 1993-06-08 | 1995-03-28 | Minnesota Mining And Manufacturing Company | Electrical interconnections between adjacent circuit board layers of a multi-layer circuit board |
US5371328A (en) * | 1993-08-20 | 1994-12-06 | International Business Machines Corporation | Component rework |
US5442852A (en) * | 1993-10-26 | 1995-08-22 | Pacific Microelectronics Corporation | Method of fabricating solder ball array |
US5591941A (en) * | 1993-10-28 | 1997-01-07 | International Business Machines Corporation | Solder ball interconnected assembly |
US5435482A (en) * | 1994-02-04 | 1995-07-25 | Lsi Logic Corporation | Integrated circuit having a coplanar solder ball contact array |
US5540377A (en) * | 1994-07-15 | 1996-07-30 | Ito; Carl T. | Solder ball placement machine |
US5629835A (en) * | 1994-07-19 | 1997-05-13 | Olin Corporation | Metal ball grid array package with improved thermal conductivity |
US5532612A (en) * | 1994-07-19 | 1996-07-02 | Liang; Louis H. | Methods and apparatus for test and burn-in of integrated circuit devices |
JPH0846136A (ja) * | 1994-07-26 | 1996-02-16 | Fujitsu Ltd | 半導体装置 |
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US5773195A (en) * | 1994-12-01 | 1998-06-30 | International Business Machines Corporation | Cap providing flat surface for DCA and solder ball attach and for sealing plated through holes, multi-layer electronic structures including the cap, and a process of forming the cap and for forming multi-layer electronic structures including the cap |
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EP2624034A1 (de) | 2012-01-31 | 2013-08-07 | Fci | Abbaubare optische Kupplungsvorrichtung |
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USD718253S1 (en) | 2012-04-13 | 2014-11-25 | Fci Americas Technology Llc | Electrical cable connector |
US8944831B2 (en) | 2012-04-13 | 2015-02-03 | Fci Americas Technology Llc | Electrical connector having ribbed ground plate with engagement members |
US9257778B2 (en) | 2012-04-13 | 2016-02-09 | Fci Americas Technology | High speed electrical connector |
USD727268S1 (en) | 2012-04-13 | 2015-04-21 | Fci Americas Technology Llc | Vertical electrical connector |
USD727852S1 (en) | 2012-04-13 | 2015-04-28 | Fci Americas Technology Llc | Ground shield for a right angle electrical connector |
US9543703B2 (en) | 2012-07-11 | 2017-01-10 | Fci Americas Technology Llc | Electrical connector with reduced stack height |
USD751507S1 (en) | 2012-07-11 | 2016-03-15 | Fci Americas Technology Llc | Electrical connector |
USD745852S1 (en) | 2013-01-25 | 2015-12-22 | Fci Americas Technology Llc | Electrical connector |
USD720698S1 (en) | 2013-03-15 | 2015-01-06 | Fci Americas Technology Llc | Electrical cable connector |
TWI760230B (zh) * | 2020-06-09 | 2022-04-01 | 台灣愛司帝科技股份有限公司 | 晶片檢測方法、晶片檢測結構以及晶片承載結構 |
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GB1353671A (en) * | 1971-06-10 | 1974-05-22 | Int Computers Ltd | Methods of forming circuit interconnections |
JPS5034743A (de) * | 1973-07-31 | 1975-04-03 | ||
US4012832A (en) * | 1976-03-12 | 1977-03-22 | Sperry Rand Corporation | Method for non-destructive removal of semiconductor devices |
JPS53149763A (en) * | 1977-06-01 | 1978-12-27 | Citizen Watch Co Ltd | Mounting method of semiconductor integrate circuit |
JPS5446365A (en) * | 1977-09-20 | 1979-04-12 | Nippon Electric Co | Hybrid integrated circuit device |
US4376505A (en) * | 1981-01-05 | 1983-03-15 | Western Electric Co., Inc. | Methods for applying solder to an article |
JPS58103198A (ja) * | 1981-12-15 | 1983-06-20 | シャープ株式会社 | 電子部品の取付け方法 |
US4545610A (en) * | 1983-11-25 | 1985-10-08 | International Business Machines Corporation | Method for forming elongated solder connections between a semiconductor device and a supporting substrate |
JPS6187396A (ja) * | 1984-10-05 | 1986-05-02 | 株式会社日立製作所 | 電子回路装置とその製造方法 |
US4604644A (en) * | 1985-01-28 | 1986-08-05 | International Business Machines Corporation | Solder interconnection structure for joining semiconductor devices to substrates that have improved fatigue life, and process for making |
DE3676832D1 (de) * | 1985-02-15 | 1991-02-21 | Ibm | Loetverbindung zwischen chip und substrat und verfahren zur herstellung. |
US4585157A (en) * | 1985-04-04 | 1986-04-29 | General Motors Corporation | Tape bonding of two integrated circuits into one tape frame |
JPS61271319A (ja) * | 1985-05-24 | 1986-12-01 | Shin Etsu Chem Co Ltd | 半導体封止用エポキシ樹脂組成物 |
US4661192A (en) * | 1985-08-22 | 1987-04-28 | Motorola, Inc. | Low cost integrated circuit bonding process |
DE3684602D1 (de) * | 1986-10-08 | 1992-04-30 | Ibm | Verfahren zum herstellen von loetkontakten fuer ein keramisches modul ohne steckerstifte. |
US4749120A (en) * | 1986-12-18 | 1988-06-07 | Matsushita Electric Industrial Co., Ltd. | Method of connecting a semiconductor device to a wiring board |
JPH0750759B2 (ja) * | 1988-07-01 | 1995-05-31 | シャープ株式会社 | 半導体装置 |
JPH0666358B2 (ja) * | 1989-01-03 | 1994-08-24 | モトローラ・インコーポレーテッド | 高密度ソルダ・バンプの製造方法と高密度ソルダ・バンプ用基板ソケット |
-
1990
- 1990-07-18 US US07/555,120 patent/US5060844A/en not_active Expired - Lifetime
- 1990-10-17 WO PCT/US1990/005962 patent/WO1992002039A1/en active IP Right Grant
- 1990-10-17 EP EP90915908A patent/EP0550432B1/de not_active Expired - Lifetime
- 1990-10-17 DE DE69024669T patent/DE69024669T2/de not_active Expired - Fee Related
- 1990-10-17 JP JP2515040A patent/JP2567993B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69024669T2 (de) | 1996-07-04 |
EP0550432A1 (de) | 1993-07-14 |
JP2567993B2 (ja) | 1996-12-25 |
JPH05508736A (ja) | 1993-12-02 |
EP0550432B1 (de) | 1996-01-03 |
WO1992002039A1 (en) | 1992-02-06 |
US5060844A (en) | 1991-10-29 |
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