DE69022637T2 - Verfahren zur Herstellung eines Halbleiterbauelementes auf welchem eine isolierende Shicht eine gleichmässige Dicke hat. - Google Patents

Verfahren zur Herstellung eines Halbleiterbauelementes auf welchem eine isolierende Shicht eine gleichmässige Dicke hat.

Info

Publication number
DE69022637T2
DE69022637T2 DE69022637T DE69022637T DE69022637T2 DE 69022637 T2 DE69022637 T2 DE 69022637T2 DE 69022637 T DE69022637 T DE 69022637T DE 69022637 T DE69022637 T DE 69022637T DE 69022637 T2 DE69022637 T2 DE 69022637T2
Authority
DE
Germany
Prior art keywords
producing
insulating layer
uniform thickness
semiconductor component
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69022637T
Other languages
English (en)
Other versions
DE69022637D1 (de
Inventor
Natsuki Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micron Memory Japan Ltd
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of DE69022637D1 publication Critical patent/DE69022637D1/de
Application granted granted Critical
Publication of DE69022637T2 publication Critical patent/DE69022637T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/76819—Smoothing of the dielectric
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/76802—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/133—Reflow oxides and glasses
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/978—Semiconductor device manufacturing: process forming tapered edges on substrate or adjacent layers
DE69022637T 1989-06-30 1990-07-02 Verfahren zur Herstellung eines Halbleiterbauelementes auf welchem eine isolierende Shicht eine gleichmässige Dicke hat. Expired - Lifetime DE69022637T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1169070A JP2556138B2 (ja) 1989-06-30 1989-06-30 半導体装置の製造方法

Publications (2)

Publication Number Publication Date
DE69022637D1 DE69022637D1 (de) 1995-11-02
DE69022637T2 true DE69022637T2 (de) 1996-03-21

Family

ID=15879770

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69022637T Expired - Lifetime DE69022637T2 (de) 1989-06-30 1990-07-02 Verfahren zur Herstellung eines Halbleiterbauelementes auf welchem eine isolierende Shicht eine gleichmässige Dicke hat.

Country Status (4)

Country Link
US (1) US5169801A (de)
EP (1) EP0406025B1 (de)
JP (1) JP2556138B2 (de)
DE (1) DE69022637T2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5285102A (en) * 1991-07-25 1994-02-08 Texas Instruments Incorporated Method of forming a planarized insulation layer
JPH0541457A (ja) * 1991-08-06 1993-02-19 Nec Corp 半導体装置の製造方法
US5414221A (en) * 1991-12-31 1995-05-09 Intel Corporation Embedded ground plane and shielding structures using sidewall insulators in high frequency circuits having vias
US5323047A (en) * 1992-01-31 1994-06-21 Sgs-Thomson Microelectronics, Inc. Structure formed by a method of patterning a submicron semiconductor layer
JPH05235184A (ja) * 1992-02-26 1993-09-10 Nec Corp 半導体装置の多層配線構造体の製造方法
DE69424388T2 (de) * 1993-12-23 2000-08-31 St Microelectronics Inc Verfahren und Dielektrikumstruktur zur Erleichterung der Metallüberätzung ohne Beschädigung des Zwischendielektrikums
US5449644A (en) * 1994-01-13 1995-09-12 United Microelectronics Corporation Process for contact hole formation using a sacrificial SOG layer
US5565381A (en) * 1994-08-01 1996-10-15 Microchip Technology Incorporated Method of removing sharp edges in a dielectric coating located above a semiconductor substrate and a semiconductor device formed by this method
US5413953A (en) * 1994-09-30 1995-05-09 United Microelectronics Corporation Method for planarizing an insulator on a semiconductor substrate using ion implantation
US5554560A (en) * 1994-09-30 1996-09-10 United Microelectronics Corporation Method for forming a planar field oxide (fox) on substrates for integrated circuit
JP3402022B2 (ja) * 1995-11-07 2003-04-28 三菱電機株式会社 半導体装置の製造方法
US6169026B1 (en) 1995-11-20 2001-01-02 Hyundai Electronics Industries Co., Ltd. Method for planarization of semiconductor device including pumping out dopants from planarization layer separately from flowing said layer
US5817571A (en) * 1996-06-10 1998-10-06 Taiwan Semiconductor Manufacturing Company, Ltd. Multilayer interlevel dielectrics using phosphorus-doped glass
US5973385A (en) * 1996-10-24 1999-10-26 International Business Machines Corporation Method for suppressing pattern distortion associated with BPSG reflow and integrated circuit chip formed thereby
DE19829152A1 (de) * 1998-05-05 1999-11-18 United Microelectronics Corp Doppeltes Damaszierverfahren
JP4943833B2 (ja) * 2006-12-27 2012-05-30 シャープ株式会社 空気調和機

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2040180B2 (de) * 1970-01-22 1977-08-25 Intel Corp, Mountain View, Calif. (V.St.A.) Verfahren zur verhinderung von mechanischen bruechen einer duennen, die oberflaeche eines halbleiterkoerpers ueberdeckende isolierschichten ueberziehenden elektrisch leitenden schicht
US4355454A (en) * 1979-09-05 1982-10-26 Texas Instruments Incorporated Coating device with As2 -O3 -SiO2
US4489481A (en) * 1982-09-20 1984-12-25 Texas Instruments Incorporated Insulator and metallization method for VLSI devices with anisotropically-etched contact holes
JPS60173856A (ja) * 1984-02-10 1985-09-07 Fujitsu Ltd 半導体装置の製造方法
KR900004968B1 (ko) * 1984-02-10 1990-07-12 후지쓰 가부시끼가이샤 반도체장치 제조방법
US4743564A (en) * 1984-12-28 1988-05-10 Kabushiki Kaisha Toshiba Method for manufacturing a complementary MOS type semiconductor device
JPH0693456B2 (ja) * 1985-03-26 1994-11-16 ソニー株式会社 半導体装置の製造方法
US4605470A (en) * 1985-06-10 1986-08-12 Advanced Micro Devices, Inc. Method for interconnecting conducting layers of an integrated circuit device
JPS621246A (ja) * 1985-06-26 1987-01-07 Nec Corp 半導体装置およびその製造方法
US4741926A (en) * 1985-10-29 1988-05-03 Rca Corporation Spin-coating procedure
US4753866A (en) * 1986-02-24 1988-06-28 Texas Instruments Incorporated Method for processing an interlevel dielectric suitable for VLSI metallization schemes
JP2605686B2 (ja) * 1986-04-10 1997-04-30 セイコーエプソン株式会社 半導体装置の製造方法
US4775550A (en) * 1986-06-03 1988-10-04 Intel Corporation Surface planarization method for VLSI technology
US4676867A (en) * 1986-06-06 1987-06-30 Rockwell International Corporation Planarization process for double metal MOS using spin-on glass as a sacrificial layer
US4708770A (en) * 1986-06-19 1987-11-24 Lsi Logic Corporation Planarized process for forming vias in silicon wafers
JPS6386546A (ja) * 1986-09-30 1988-04-16 Pioneer Electronic Corp 多重配線基板の製造方法
JPS6386545A (ja) * 1986-09-30 1988-04-16 Pioneer Electronic Corp 多層配線基板の製造方法
JPS6386547A (ja) * 1986-09-30 1988-04-16 Pioneer Electronic Corp 多重配線基板の製造方法
US4885262A (en) * 1989-03-08 1989-12-05 Intel Corporation Chemical modification of spin-on glass for improved performance in IC fabrication

Also Published As

Publication number Publication date
EP0406025B1 (de) 1995-09-27
EP0406025A3 (de) 1991-02-27
US5169801A (en) 1992-12-08
JPH0334546A (ja) 1991-02-14
DE69022637D1 (de) 1995-11-02
EP0406025A2 (de) 1991-01-02
JP2556138B2 (ja) 1996-11-20

Similar Documents

Publication Publication Date Title
DE69022637D1 (de) Verfahren zur Herstellung eines Halbleiterbauelementes auf welchem eine isolierende Shicht eine gleichmässige Dicke hat.
DE3583183D1 (de) Verfahren zur herstellung eines halbleitersubstrates.
ATE129265T1 (de) Hartschaumstoff sowie verfahren zur herstellung desselben.
DE3889357T2 (de) Verfahren zur Herstellung einer integrierten Kundenwunschschaltung mit isoliertem Gate.
DE59001231D1 (de) Verfahren zur herstellung offenzelliger metallischer strukturen.
DE69009467T2 (de) Dicke, eine Kobalt-Platinschicht aufweisende Magnetfolie und Verfahren zur Herstellung derselben.
DE69018717D1 (de) Verfahren zur Herstellung eines Polyimidfilms.
DE68907795D1 (de) Verfahren zur herstellung von bisphenolen.
DE59007171D1 (de) Verfahren zur herstellung von sclareolid.
DE3888696D1 (de) Verfahren zur herstellung durchkontaktierter leiterplatten.
DE3778278D1 (de) Verfahren zur herstellung eines aromatischen polycarbonats.
DE3779266D1 (de) Verfahren zur herstellung metallischer formkoerper, sowie damit hergestellte formkoerper.
DE69016460T2 (de) Verfahren zur herstellung von 2-ethylhexyl-para-methoxycinnamat.
DE59006073D1 (de) Verfahren zur herstellung von azopigmenten.
DE3581971D1 (de) Verfahren zur herstellung eines oligopeptids.
DE3677769D1 (de) Verfahren zur herstellung einer informationsaufzeichnungsplatte.
DE3767762D1 (de) Verfahren zur herstellung eines olefinpolymers.
DE59001534D1 (de) Verfahren zur herstellung von aminen.
DE3780995T2 (de) Verfahren zur herstellung eines metallischen musters.
DE3887673D1 (de) Verfahren zur Herstellung einer elektrochromen Schicht und elektrochrome Vorrichtung.
DE3884383T2 (de) Verfahren zur herstellung eines eine zweite harmonische erzeugenden elementes.
DE69016366D1 (de) Verfahren zur Herstellung einer antistatischen Schicht.
DE69022720D1 (de) Verfahren zur herstellung von dichloropentafluoropropanen.
DE69004148D1 (de) Verfahren zur Herstellung einer oxydsupraleitenden Schicht.
DE59001780D1 (de) Verfahren zur herstellung von hydroxyanthrachinonen.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NEC CORP., TOKIO/TOKYO, JP

Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP

8327 Change in the person/name/address of the patent owner

Owner name: ELPIDA MEMORY, INC., TOKYO, JP