DE69018893D1 - EEPROM-Speicherzelle mit verbessertem Schutz gegen Fehler aufgrund von Zelldurchbruch. - Google Patents

EEPROM-Speicherzelle mit verbessertem Schutz gegen Fehler aufgrund von Zelldurchbruch.

Info

Publication number
DE69018893D1
DE69018893D1 DE69018893T DE69018893T DE69018893D1 DE 69018893 D1 DE69018893 D1 DE 69018893D1 DE 69018893 T DE69018893 T DE 69018893T DE 69018893 T DE69018893 T DE 69018893T DE 69018893 D1 DE69018893 D1 DE 69018893D1
Authority
DE
Germany
Prior art keywords
cell
protection against
breakthrough
errors due
eeprom memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69018893T
Other languages
English (en)
Other versions
DE69018893T2 (de
Inventor
Carlo Riva
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
Original Assignee
SGS Thomson Microelectronics SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SRL filed Critical SGS Thomson Microelectronics SRL
Application granted granted Critical
Publication of DE69018893D1 publication Critical patent/DE69018893D1/de
Publication of DE69018893T2 publication Critical patent/DE69018893T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/74—Masking faults in memories by using spares or by reconfiguring using duplex memories, i.e. using dual copies
DE69018893T 1989-08-01 1990-07-09 EEPROM-Speicherzelle mit verbessertem Schutz gegen Fehler aufgrund von Zelldurchbruch. Expired - Fee Related DE69018893T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT8921402A IT1230363B (it) 1989-08-01 1989-08-01 Cella di memoria eeprom, con protezione migliorata da errori dovuti a rottura della cella.

Publications (2)

Publication Number Publication Date
DE69018893D1 true DE69018893D1 (de) 1995-06-01
DE69018893T2 DE69018893T2 (de) 1995-12-21

Family

ID=11181245

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69018893T Expired - Fee Related DE69018893T2 (de) 1989-08-01 1990-07-09 EEPROM-Speicherzelle mit verbessertem Schutz gegen Fehler aufgrund von Zelldurchbruch.

Country Status (5)

Country Link
US (1) US5107461A (de)
EP (1) EP0411347B1 (de)
JP (1) JPH0383297A (de)
DE (1) DE69018893T2 (de)
IT (1) IT1230363B (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5024993A (en) * 1990-05-02 1991-06-18 Microelectronics & Computer Technology Corporation Superconducting-semiconducting circuits, devices and systems
US5617352A (en) * 1995-12-13 1997-04-01 The United States Of America As Represented By The Secretary Of The Navy Non-volatile, bidirectional, electrically programmable integrated memory element implemented using double polysilicon
US6072718A (en) * 1998-02-10 2000-06-06 International Business Machines Corporation Magnetic memory devices having multiple magnetic tunnel junctions therein
EP1281179B1 (de) * 2000-04-14 2004-07-14 Koninklijke Philips Electronics N.V. Halbleiteranordnung
JP4281331B2 (ja) 2002-01-21 2009-06-17 株式会社デンソー 不揮発性半導体記憶装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3593037A (en) * 1970-03-13 1971-07-13 Intel Corp Cell for mos random-acess integrated circuit memory
US3691537A (en) * 1971-05-26 1972-09-12 Gen Electric High speed signal in mos circuits by voltage variable capacitor
IT1198109B (it) * 1986-11-18 1988-12-21 Sgs Microelettronica Spa Cella di memoria eeprom a singolo livello di polisilicio con zona di ossido di tunnel
JPH0640589B2 (ja) * 1987-03-16 1994-05-25 株式会社東芝 不揮発性半導体記憶装置
IT1214246B (it) * 1987-05-27 1990-01-10 Sgs Microelettronica Spa Dispositivo di memoria non volatile ad elevato numero di cicli di modifica.
JPS6432494A (en) * 1987-07-27 1989-02-02 Mitsubishi Electric Corp Non-volatile semiconductor storage device
US4888735A (en) * 1987-12-30 1989-12-19 Elite Semiconductor & Systems Int'l., Inc. ROM cell and array configuration
FR2626401B1 (fr) * 1988-01-26 1990-05-18 Sgs Thomson Microelectronics Memoire eeprom a grille flottante avec transistor de selection de ligne de source
US4961002A (en) * 1989-07-13 1990-10-02 Intel Corporation Synapse cell employing dual gate transistor structure

Also Published As

Publication number Publication date
IT8921402A0 (it) 1989-08-01
DE69018893T2 (de) 1995-12-21
EP0411347A2 (de) 1991-02-06
US5107461A (en) 1992-04-21
EP0411347A3 (en) 1992-03-11
IT1230363B (it) 1991-10-18
EP0411347B1 (de) 1995-04-26
JPH0383297A (ja) 1991-04-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee