DE68925877D1 - Gegen weiche Fehler widerstandsfähige Speicherzelle - Google Patents

Gegen weiche Fehler widerstandsfähige Speicherzelle

Info

Publication number
DE68925877D1
DE68925877D1 DE68925877T DE68925877T DE68925877D1 DE 68925877 D1 DE68925877 D1 DE 68925877D1 DE 68925877 T DE68925877 T DE 68925877T DE 68925877 T DE68925877 T DE 68925877T DE 68925877 D1 DE68925877 D1 DE 68925877D1
Authority
DE
Germany
Prior art keywords
memory cell
soft errors
cell resistant
resistant
errors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68925877T
Other languages
English (en)
Other versions
DE68925877T2 (de
Inventor
Theodore W Houston
Terence G W Blake
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of DE68925877D1 publication Critical patent/DE68925877D1/de
Application granted granted Critical
Publication of DE68925877T2 publication Critical patent/DE68925877T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/005Circuit means for protection against loss of information of semiconductor storage devices
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/412Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
    • G11C11/4125Cells incorporating circuit means for protecting against loss of information

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
DE1989625877 1988-12-21 1989-12-11 Gegen weiche Fehler widerstandsfähige Speicherzelle Expired - Fee Related DE68925877T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US28854188A 1988-12-21 1988-12-21

Publications (2)

Publication Number Publication Date
DE68925877D1 true DE68925877D1 (de) 1996-04-11
DE68925877T2 DE68925877T2 (de) 1996-08-01

Family

ID=23107573

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1989625877 Expired - Fee Related DE68925877T2 (de) 1988-12-21 1989-12-11 Gegen weiche Fehler widerstandsfähige Speicherzelle

Country Status (3)

Country Link
EP (1) EP0375226B1 (de)
JP (1) JP3076349B2 (de)
DE (1) DE68925877T2 (de)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5452477A (en) * 1977-10-03 1979-04-25 Mitsubishi Electric Corp Semiconductor device
JPS5674960A (en) * 1979-11-22 1981-06-20 Toshiba Corp Semiconductor integrated circuit
JPS57152591A (en) * 1981-03-13 1982-09-20 Nec Corp Semiconductor memory cell
JPS61260668A (ja) * 1985-05-15 1986-11-18 Seiko Epson Corp 半導体装置
DE3684214D1 (de) * 1985-09-30 1992-04-16 Honeywell Inc Strahlungsfeste speicherzelle.
US4805148A (en) * 1985-11-22 1989-02-14 Diehl Nagle Sherra E High impendance-coupled CMOS SRAM for improved single event immunity
US4760557A (en) * 1986-09-05 1988-07-26 General Electric Company Radiation hard memory cell circuit with high inverter impedance ratio

Also Published As

Publication number Publication date
DE68925877T2 (de) 1996-08-01
EP0375226A3 (de) 1992-04-01
EP0375226B1 (de) 1996-03-06
EP0375226A2 (de) 1990-06-27
JPH02270192A (ja) 1990-11-05
JP3076349B2 (ja) 2000-08-14

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee