DE68928510D1 - Verfahren zur Messung der Periode eines Oberflächenfehlers - Google Patents

Verfahren zur Messung der Periode eines Oberflächenfehlers

Info

Publication number
DE68928510D1
DE68928510D1 DE68928510T DE68928510T DE68928510D1 DE 68928510 D1 DE68928510 D1 DE 68928510D1 DE 68928510 T DE68928510 T DE 68928510T DE 68928510 T DE68928510 T DE 68928510T DE 68928510 D1 DE68928510 D1 DE 68928510D1
Authority
DE
Germany
Prior art keywords
measuring
period
surface defect
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68928510T
Other languages
English (en)
Other versions
DE68928510T2 (de
Inventor
Takeshi C O Fuji Photo Fi Kiso
Takanori C O Fuji Photo Masuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Application granted granted Critical
Publication of DE68928510D1 publication Critical patent/DE68928510D1/de
Publication of DE68928510T2 publication Critical patent/DE68928510T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8922—Periodic flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N2021/8909—Scan signal processing specially adapted for inspection of running sheets
    • G01N2021/8912—Processing using lane subdivision

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE68928510T 1988-09-09 1989-09-08 Verfahren zur Messung der Periode eines Oberflächenfehlers Expired - Fee Related DE68928510T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63226190A JPH0786474B2 (ja) 1988-09-09 1988-09-09 欠陥周期の測定方法

Publications (2)

Publication Number Publication Date
DE68928510D1 true DE68928510D1 (de) 1998-02-05
DE68928510T2 DE68928510T2 (de) 1998-04-16

Family

ID=16841298

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68928510T Expired - Fee Related DE68928510T2 (de) 1988-09-09 1989-09-08 Verfahren zur Messung der Periode eines Oberflächenfehlers

Country Status (4)

Country Link
US (1) US4982600A (de)
EP (1) EP0358236B1 (de)
JP (1) JPH0786474B2 (de)
DE (1) DE68928510T2 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0475454A3 (en) * 1990-09-14 1992-10-14 Fuji Photo Film Co., Ltd. Defect inspection system
JP2535257B2 (ja) * 1991-05-07 1996-09-18 新日本製鐵株式会社 ストリップの表面欠陥検査装置
US5508622A (en) * 1994-12-14 1996-04-16 Gatzlaff; Harold Coating defect detector system
US5678447A (en) * 1996-04-17 1997-10-21 Eastman Kodak Company On-line web planarity measurement apparatus and method
FR2770646B1 (fr) * 1997-11-06 1999-12-17 Eastman Kodak Co Procede d'identification de defauts d'une enduction
AU1353899A (en) * 1997-11-27 1999-06-16 Hoogovens Staal Bv Process and device for producing a strip-like material avoiding repeated surfacedefects
EP0927887A1 (de) * 1997-12-17 1999-07-07 Zellweger Luwa Ag Verfahren zur Erkennung periodischer Fehler in einem längsbewegten Prüfgut
US6895811B2 (en) * 2001-12-14 2005-05-24 Shawmut Corporation Detection of small holes in laminates
US7623699B2 (en) * 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
US7176475B2 (en) 2004-11-16 2007-02-13 Omron Corporation Adjusting apparatus, production processing system, and method of controlling adjusting apparatus
US7748259B2 (en) * 2006-12-15 2010-07-06 General Electric Company Systems and methods for solid oxide fuel cell surface analysis
US8175739B2 (en) * 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
US7542821B2 (en) * 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US20090028417A1 (en) * 2007-07-26 2009-01-29 3M Innovative Properties Company Fiducial marking for multi-unit process spatial synchronization
US7493678B1 (en) * 2007-09-13 2009-02-24 Ming-Tse Chen Method of inspecting cloth
US7781622B2 (en) * 2008-01-25 2010-08-24 Council Of Scientific & Industrial Research Process for direct hydroxylation of aromatic hydrocarbons
JP5453861B2 (ja) * 2008-03-31 2014-03-26 Ｊｆｅスチール株式会社 周期性欠陥検出装置及びその方法
US7937233B2 (en) * 2008-04-17 2011-05-03 3M Innovative Properties Company Preferential defect marking on a web
TWI420098B (zh) * 2008-07-18 2013-12-21 Asahi Glass Co Ltd A defect inspection apparatus and method using the image data for defect inspection, a method for manufacturing the same, and a recording medium
US7797133B2 (en) * 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
KR100905519B1 (ko) * 2009-03-11 2009-07-01 와이즈플래닛(주) 비쥬얼 엔코더를 이용하여 컨베이어상에서 이동하는 패널의결함 위치 정합성을 제공하는 방법
US8935104B2 (en) * 2010-03-10 2015-01-13 3M Innovative Properties Company Application-specific repeat defect detection in web manufacturing processes
DE102011083405A1 (de) * 2010-12-21 2012-06-21 Sms Siemag Ag Verfahren und Vorrichtung zur Oberflächeninspektion von Bandstücken
CN103507408A (zh) * 2013-09-19 2014-01-15 安庆市康明纳包装有限公司 一种印刷机的自动检测装置
JP6062396B2 (ja) * 2014-06-16 2017-01-18 Ckd株式会社 検査システム及びｐｔｐ包装機
DE102017108495A1 (de) 2017-04-21 2018-10-25 Windmöller & Hölscher Kg Überwachungsverfahren zur Überwachung eines Abwickelprozesses, Abwickelvorrichtung sowie Abwickelsystem
US10501274B2 (en) 2017-07-06 2019-12-10 Honeywell International Inc. Continuous web sheet defect analytics, classification and remediation for enhancing equipment efficiency and throughput

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1150424A (fr) * 1956-05-03 1958-01-13 Procédé et appareil pour le contrôle de l'irrégularité de courants de matières textiles ou similaires
US3112642A (en) * 1960-05-06 1963-12-03 Republic Steel Corp Apparatus for measuring surface roughness
US3971272A (en) * 1963-10-01 1976-07-27 Zellweger, Ltd. Regulation of electronically operated quality control equipment
US3377828A (en) * 1963-12-02 1968-04-16 Republic Steel Corp Method of rolling metal strip to control surface roughness
DE1245605B (de) * 1964-10-20 1967-07-27 Janez Peklenik Dr Ing Verfahren und Vorrichtung zur Kenngroessenermittlung bei stochastischen Prozessen
GB1207241A (en) * 1967-03-30 1970-09-30 Sumitomo Metal Ind Method of and apparatus for detecting local irregularities in strip and for controlling the evenness of strip
US3633211A (en) * 1969-10-17 1972-01-04 American Electronic Lab Inspection recorder means
JPS4935091A (de) * 1972-08-01 1974-04-01
US3835332A (en) * 1973-06-04 1974-09-10 Eastman Kodak Co Inspection apparatus for detecting defects in a web
JPS5112154A (en) * 1974-07-22 1976-01-30 Nippon Kokan Kk Hyomenheitandosokuteihoho
DE2525560C2 (de) * 1975-06-07 1991-04-18 Fritz 7347 Bad Überkingen Stahlecker Wartungseinrichtung die längs einer eine Vielzahl von nebeneinander angeordneten Spinnstellen aufweisenden Offenend-Spinnmaschine verfahrbar ist
DE2550814C3 (de) * 1975-11-12 1979-08-09 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Zeilentastvorrichtung für Materialbahnen zur Fehlstellenermittlung
US4134684A (en) * 1977-01-18 1979-01-16 Intex Corp. Repeat defect detector system
US4348114A (en) * 1979-12-07 1982-09-07 Ciba-Geigy Ag Method of inspecting coated web material to detect the presence of downlines thereon
SU939929A1 (ru) * 1980-04-08 1982-06-30 Калининский филиал Всесоюзного научно-исследовательского института вагоностроения Устройство дл измерени волнистости
JPS58156842A (ja) * 1982-03-15 1983-09-17 Toshiba Corp ロ−ル疵検出装置
SE459013B (sv) * 1987-09-22 1989-05-29 Svenska Traeforskningsinst Saett foer maetning av variationer i egenskaper hos en kontinuerligt loepande pappersbana
US4958307A (en) * 1987-11-20 1990-09-18 Kabushiki Kaisha Toshiba Roll mark inspection apparatus

Also Published As

Publication number Publication date
JPH0786474B2 (ja) 1995-09-20
JPH0274852A (ja) 1990-03-14
DE68928510T2 (de) 1998-04-16
US4982600A (en) 1991-01-08
EP0358236A2 (de) 1990-03-14
EP0358236B1 (de) 1997-12-29
EP0358236A3 (de) 1991-05-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee