DE68923531T2 - Verfahren und vorrichtung zum speicherselbsttest. - Google Patents
Verfahren und vorrichtung zum speicherselbsttest.Info
- Publication number
- DE68923531T2 DE68923531T2 DE68923531T DE68923531T DE68923531T2 DE 68923531 T2 DE68923531 T2 DE 68923531T2 DE 68923531 T DE68923531 T DE 68923531T DE 68923531 T DE68923531 T DE 68923531T DE 68923531 T2 DE68923531 T2 DE 68923531T2
- Authority
- DE
- Germany
- Prior art keywords
- memory
- series
- data
- data words
- generating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/36—Data generation devices, e.g. data inverters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/20—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits using counters or linear-feedback shift registers [LFSR]
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Debugging And Monitoring (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US17669988A | 1988-04-01 | 1988-04-01 | |
| PCT/US1989/001036 WO1989009471A2 (en) | 1988-04-01 | 1989-03-15 | Memory selftest method and apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE68923531D1 DE68923531D1 (de) | 1995-08-24 |
| DE68923531T2 true DE68923531T2 (de) | 1996-04-04 |
Family
ID=22645472
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE68923531T Expired - Fee Related DE68923531T2 (de) | 1988-04-01 | 1989-03-15 | Verfahren und vorrichtung zum speicherselbsttest. |
Country Status (5)
| Country | Link |
|---|---|
| EP (1) | EP0366757B1 (de) |
| JP (1) | JP2740899B2 (de) |
| CA (1) | CA1304821C (de) |
| DE (1) | DE68923531T2 (de) |
| WO (1) | WO1989009471A2 (de) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10135583B4 (de) * | 2001-07-20 | 2004-05-06 | Infineon Technologies Ag | Datengenerator zur Erzeugung von Testdaten für wortorientierte Halbleiterspeicher |
| DE102004051344A1 (de) * | 2004-10-21 | 2006-05-04 | Infineon Technologies Ag | Halbleiter-Bauelement-Test-Einrichtung mit Schieberegister, sowie Halbleiter-Bauelement-Test-Verfahren |
| DE102004051346A1 (de) * | 2004-10-21 | 2006-05-04 | Infineon Technologies Ag | Halbleiter-Bauelement-Test-Einrichtung, insbesondere Daten-Zwischenspeicher-Bauelement mit Halbleiter-Bauelement-Test-Einrichtung, sowie Halbleiter-Bauelement-Test-Verfahren |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0441088A1 (de) * | 1990-01-24 | 1991-08-14 | International Business Machines Corporation | In Speicherkarte-residenter Diagnosetest |
| US5274648A (en) * | 1990-01-24 | 1993-12-28 | International Business Machines Corporation | Memory card resident diagnostic testing |
| JP3849884B2 (ja) * | 1995-06-09 | 2006-11-22 | 富士通株式会社 | ２進数の１つのシーケンスを生成する装置、記憶モジュール内の障害に対するテストを行う方法、および記憶モジュールに対するテストを行うシステム |
| US6477673B1 (en) * | 1999-07-30 | 2002-11-05 | Stmicroelectronics, Inc. | Structure and method with which to generate data background patterns for testing random-access-memories |
| CN111044886B (zh) * | 2019-12-09 | 2022-05-13 | 北京时代民芯科技有限公司 | 一种ddr2/3 phy bist数据通道测试向量生成方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5831762B2 (ja) * | 1974-08-21 | 1983-07-08 | 横河電機株式会社 | ランダムシンゴウハツセイカイロ |
| JPS5199439A (de) * | 1975-02-28 | 1976-09-02 | Fujitsu Ltd | |
| US4293950A (en) * | 1978-04-03 | 1981-10-06 | Nippon Telegraph And Telephone Public Corporation | Test pattern generating apparatus |
| JPS54132145A (en) * | 1978-04-06 | 1979-10-13 | Nec Corp | False random code generator |
| DE3069611D1 (en) * | 1979-12-27 | 1984-12-13 | Fujitsu Ltd | Apparatus and method for testing semiconductor memory devices |
| JPS58101515A (ja) * | 1981-12-14 | 1983-06-16 | Agency Of Ind Science & Technol | 最大周期列信号の初期値設定回路 |
| JPS59166879A (ja) * | 1983-03-14 | 1984-09-20 | Nec Corp | 集積回路装置 |
| US4715034A (en) * | 1985-03-04 | 1987-12-22 | John Fluke Mfg. Co., Inc. | Method of and system for fast functional testing of random access memories |
-
1989
- 1989-03-15 WO PCT/US1989/001036 patent/WO1989009471A2/en active IP Right Grant
- 1989-03-15 EP EP89905305A patent/EP0366757B1/de not_active Expired - Lifetime
- 1989-03-15 DE DE68923531T patent/DE68923531T2/de not_active Expired - Fee Related
- 1989-03-31 CA CA000595325A patent/CA1304821C/en not_active Expired - Fee Related
- 1989-03-31 JP JP1081369A patent/JP2740899B2/ja not_active Expired - Lifetime
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10135583B4 (de) * | 2001-07-20 | 2004-05-06 | Infineon Technologies Ag | Datengenerator zur Erzeugung von Testdaten für wortorientierte Halbleiterspeicher |
| DE102004051344A1 (de) * | 2004-10-21 | 2006-05-04 | Infineon Technologies Ag | Halbleiter-Bauelement-Test-Einrichtung mit Schieberegister, sowie Halbleiter-Bauelement-Test-Verfahren |
| DE102004051346A1 (de) * | 2004-10-21 | 2006-05-04 | Infineon Technologies Ag | Halbleiter-Bauelement-Test-Einrichtung, insbesondere Daten-Zwischenspeicher-Bauelement mit Halbleiter-Bauelement-Test-Einrichtung, sowie Halbleiter-Bauelement-Test-Verfahren |
| US7415649B2 (en) | 2004-10-21 | 2008-08-19 | Infineon Technologies Ag | Semi-conductor component test device with shift register, and semi-conductor component test procedure |
| US7421629B2 (en) | 2004-10-21 | 2008-09-02 | Infineon Technologies Ag | Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2740899B2 (ja) | 1998-04-15 |
| DE68923531D1 (de) | 1995-08-24 |
| WO1989009471A2 (en) | 1989-10-05 |
| WO1989009471A3 (en) | 1989-11-16 |
| EP0366757A1 (de) | 1990-05-09 |
| EP0366757B1 (de) | 1995-07-19 |
| JPH0277860A (ja) | 1990-03-16 |
| CA1304821C (en) | 1992-07-07 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |