DE68922341T2 - Anordnung zur Erleichterung des Testens einer logischen Schaltung. - Google Patents
Anordnung zur Erleichterung des Testens einer logischen Schaltung.Info
- Publication number
- DE68922341T2 DE68922341T2 DE68922341T DE68922341T DE68922341T2 DE 68922341 T2 DE68922341 T2 DE 68922341T2 DE 68922341 T DE68922341 T DE 68922341T DE 68922341 T DE68922341 T DE 68922341T DE 68922341 T2 DE68922341 T2 DE 68922341T2
- Authority
- DE
- Germany
- Prior art keywords
- testing
- facilitate
- arrangement
- logic circuit
- logic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2226—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test ALU
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63154016A JP2937326B2 (ja) | 1988-06-22 | 1988-06-22 | 論理回路のテスト容易化回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE68922341D1 DE68922341D1 (de) | 1995-06-01 |
DE68922341T2 true DE68922341T2 (de) | 1995-10-05 |
Family
ID=15575067
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE68922341T Expired - Fee Related DE68922341T2 (de) | 1988-06-22 | 1989-06-22 | Anordnung zur Erleichterung des Testens einer logischen Schaltung. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4965511A (de) |
EP (1) | EP0347908B1 (de) |
JP (1) | JP2937326B2 (de) |
KR (1) | KR920001083B1 (de) |
DE (1) | DE68922341T2 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0419105B1 (de) * | 1989-09-21 | 1997-08-13 | Texas Instruments Incorporated | Integrierte Schaltung, die an der Oberfläche eines Halbleitersubstrats angeordnet ist, und Verfahren zur Herstellung derselben |
JP2937440B2 (ja) * | 1990-08-21 | 1999-08-23 | 株式会社東芝 | 集積回路検査装置 |
JP3474214B2 (ja) * | 1992-10-22 | 2003-12-08 | 株式会社東芝 | 論理回路及びこの論理回路を備えたテスト容易化回路 |
US5787096A (en) * | 1996-04-23 | 1998-07-28 | Micron Technology, Inc. | Circuit and method for testing an integrated circuit |
US5727001A (en) * | 1996-08-14 | 1998-03-10 | Micron Technology, Inc. | Circuit and method for testing an integrated circuit |
US6365991B1 (en) * | 1999-11-29 | 2002-04-02 | Stmicroelectronics, Inc. | Method and structure for measurement of a multiple-power-source device during a test mode |
US6581019B1 (en) * | 2000-03-20 | 2003-06-17 | Koninklijke Philips Electronics N.V. | Computer-system-on-a-chip with test-mode addressing of normally off-bus input/output ports |
JP2002139557A (ja) * | 2000-11-02 | 2002-05-17 | Mitsubishi Electric Corp | 半導体装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3790885A (en) * | 1972-03-27 | 1974-02-05 | Ibm | Serial test patterns for mosfet testing |
US3959770A (en) * | 1974-10-21 | 1976-05-25 | Stanford Research Institute | Method and apparatus for error compensation in multichannel systems |
US4404519A (en) * | 1980-12-10 | 1983-09-13 | International Business Machine Company | Testing embedded arrays in large scale integrated circuits |
US4571724A (en) * | 1983-03-23 | 1986-02-18 | Data I/O Corporation | System for testing digital logic devices |
US4577318A (en) * | 1983-11-14 | 1986-03-18 | Burroughs Corporation | Self testing detection system for comparing digital signal transition times |
-
1988
- 1988-06-22 JP JP63154016A patent/JP2937326B2/ja not_active Expired - Fee Related
-
1989
- 1989-06-22 EP EP89111373A patent/EP0347908B1/de not_active Expired - Lifetime
- 1989-06-22 US US07/370,046 patent/US4965511A/en not_active Expired - Lifetime
- 1989-06-22 KR KR1019890008650A patent/KR920001083B1/ko not_active IP Right Cessation
- 1989-06-22 DE DE68922341T patent/DE68922341T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0347908A3 (de) | 1991-04-10 |
KR910001782A (ko) | 1991-01-31 |
US4965511A (en) | 1990-10-23 |
DE68922341D1 (de) | 1995-06-01 |
JPH01320545A (ja) | 1989-12-26 |
EP0347908A2 (de) | 1989-12-27 |
EP0347908B1 (de) | 1995-04-26 |
KR920001083B1 (ko) | 1992-02-01 |
JP2937326B2 (ja) | 1999-08-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |