DE68910243D1 - Messen des Betriebsverhaltens von integrierten Schaltungen in Chipform. - Google Patents

Messen des Betriebsverhaltens von integrierten Schaltungen in Chipform.

Info

Publication number
DE68910243D1
DE68910243D1 DE89480112T DE68910243T DE68910243D1 DE 68910243 D1 DE68910243 D1 DE 68910243D1 DE 89480112 T DE89480112 T DE 89480112T DE 68910243 T DE68910243 T DE 68910243T DE 68910243 D1 DE68910243 D1 DE 68910243D1
Authority
DE
Germany
Prior art keywords
measuring
integrated circuits
operating behavior
chip form
behavior
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE89480112T
Other languages
English (en)
Other versions
DE68910243T2 (de
Inventor
Dennis Thomas Cox
David Leroy Guertin
Charles Luther Johnson
Bruce George Rudolph
Mark Elliot Turner
Robert Russell Williams
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE68910243D1 publication Critical patent/DE68910243D1/de
Application granted granted Critical
Publication of DE68910243T2 publication Critical patent/DE68910243T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00369—Modifications for compensating variations of temperature, supply voltage or other physical parameters
    • H03K19/00384—Modifications for compensating variations of temperature, supply voltage or other physical parameters in field effect transistor circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
DE89480112T 1988-09-02 1989-07-12 Messen des Betriebsverhaltens von integrierten Schaltungen in Chipform. Expired - Fee Related DE68910243T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/240,853 US4939389A (en) 1988-09-02 1988-09-02 VLSI performance compensation for off-chip drivers and clock generation

Publications (2)

Publication Number Publication Date
DE68910243D1 true DE68910243D1 (de) 1993-12-02
DE68910243T2 DE68910243T2 (de) 1994-05-05

Family

ID=22908207

Family Applications (1)

Application Number Title Priority Date Filing Date
DE89480112T Expired - Fee Related DE68910243T2 (de) 1988-09-02 1989-07-12 Messen des Betriebsverhaltens von integrierten Schaltungen in Chipform.

Country Status (4)

Country Link
US (1) US4939389A (de)
EP (1) EP0357532B1 (de)
JP (1) JP2650113B2 (de)
DE (1) DE68910243T2 (de)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5099196A (en) * 1990-11-09 1992-03-24 Dell Usa Corporation On-chip integrated circuit speed selection
EP0510221A1 (de) * 1991-04-23 1992-10-28 Siemens Aktiengesellschaft Anordnung zur Optimierung des Betriebsverhaltens von MOS-Treiberstufen in taktgesteuerten digitalen Schaltungen
WO1993006657A1 (en) * 1991-09-23 1993-04-01 Digital Equipment Corporation Update synchronizer
US5337254A (en) * 1991-12-16 1994-08-09 Hewlett-Packard Company Programmable integrated circuit output pad
US5254891A (en) * 1992-04-20 1993-10-19 International Business Machines Corporation BICMOS ECL circuit suitable for delay regulation
US5359234A (en) * 1993-02-01 1994-10-25 Codex, Corp. Circuit and method of sensing process and temperature variation in an integrated circuit
US5621335A (en) * 1995-04-03 1997-04-15 Texas Instruments Incorporated Digitally controlled output buffer to incrementally match line impedance and maintain slew rate independent of capacitive output loading
US5546023A (en) * 1995-06-26 1996-08-13 Intel Corporation Daisy chained clock distribution scheme
US5705942A (en) * 1995-09-29 1998-01-06 Intel Corporation Method and apparatus for locating and improving critical speed paths in VLSI integrated circuits
US5818263A (en) * 1995-09-29 1998-10-06 Intel Corporation Method and apparatus for locating and improving race conditions in VLSI integrated circuits
US6018465A (en) * 1996-12-31 2000-01-25 Intel Corporation Apparatus for mounting a chip package to a chassis of a computer
US6137688A (en) 1996-12-31 2000-10-24 Intel Corporation Apparatus for retrofit mounting a VLSI chip to a computer chassis for current supply
US5959481A (en) 1997-02-18 1999-09-28 Rambus Inc. Bus driver circuit including a slew rate indicator circuit having a one shot circuit
WO1998036497A1 (en) * 1997-02-18 1998-08-20 Rambus, Inc. Bus driver circuit including a slew rate indicator circuit having a series of delay elements
US6002280A (en) * 1997-04-24 1999-12-14 Mitsubishi Semiconductor America, Inc. Adaptable output phase delay compensation circuit and method thereof
US6870419B1 (en) * 1997-08-29 2005-03-22 Rambus Inc. Memory system including a memory device having a controlled output driver characteristic
US6094075A (en) 1997-08-29 2000-07-25 Rambus Incorporated Current control technique
US6058496A (en) * 1997-10-21 2000-05-02 International Business Machines Corporation Self-timed AC CIO wrap method and apparatus
US6646953B1 (en) * 2000-07-06 2003-11-11 Rambus Inc. Single-clock, strobeless signaling system
US7051130B1 (en) 1999-10-19 2006-05-23 Rambus Inc. Integrated circuit device that stores a value representative of a drive strength setting
US6321282B1 (en) 1999-10-19 2001-11-20 Rambus Inc. Apparatus and method for topography dependent signaling
US6629256B1 (en) 2000-04-04 2003-09-30 Texas Instruments Incorporated Apparatus for and method of generating a clock from an available clock of arbitrary frequency
US6335638B1 (en) 2000-06-29 2002-01-01 Pericom Semiconductor Corp. Triple-slope clock driver for reduced EMI
US7079775B2 (en) 2001-02-05 2006-07-18 Finisar Corporation Integrated memory mapped controller circuit for fiber optics transceiver
US6735543B2 (en) 2001-11-29 2004-05-11 International Business Machines Corporation Method and apparatus for testing, characterizing and tuning a chip interface
US7119549B2 (en) * 2003-02-25 2006-10-10 Rambus Inc. Output calibrator with dynamic precision
US7039891B2 (en) * 2003-08-27 2006-05-02 Lsi Logic Corporation Method of clock driven cell placement and clock tree synthesis for integrated circuit design
US7330080B1 (en) 2004-11-04 2008-02-12 Transmeta Corporation Ring based impedance control of an output driver
JP5124904B2 (ja) * 2005-03-14 2013-01-23 日本電気株式会社 半導体試験方法及び半導体装置
US7688536B2 (en) * 2007-05-23 2010-03-30 International Business Machines Corporation Variable power write driver circuit
US20090039048A1 (en) * 2007-08-06 2009-02-12 Tien Linsheng W Venting System and the Use Thereof
US8239810B2 (en) 2010-11-11 2012-08-07 International Business Machines Corporation Method and system for optimizing a device with current source models
KR101898150B1 (ko) * 2011-10-25 2018-09-13 에스케이하이닉스 주식회사 집적회로 칩 및 이를 포함하는 시스템
CN105051640A (zh) 2012-09-07 2015-11-11 弗吉尼亚大学专利基金会以弗吉尼亚大学许可＆合资集团名义经营 低功率时钟源
TWI684773B (zh) * 2018-12-28 2020-02-11 瑞昱半導體股份有限公司 電路運作速度偵測電路

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2855724A1 (de) * 1978-12-22 1980-07-03 Ibm Deutschland Verfahren und vorrichtung zur angleichung der unterschiedlichen signalverzoegerungszeiten von halbleiterchips
US4346343A (en) * 1980-05-16 1982-08-24 International Business Machines Corporation Power control means for eliminating circuit to circuit delay differences and providing a desired circuit delay
JPS5772429A (en) * 1980-10-22 1982-05-06 Toshiba Corp Semiconductor integrated circuit device
US4383216A (en) * 1981-01-29 1983-05-10 International Business Machines Corporation AC Measurement means for use with power control means for eliminating circuit to circuit delay differences
JPS57197831A (en) * 1981-05-29 1982-12-04 Nec Corp Integration circuit chip
US4494021A (en) * 1982-08-30 1985-01-15 Xerox Corporation Self-calibrated clock and timing signal generator for MOS/VLSI circuitry
US4514647A (en) * 1983-08-01 1985-04-30 At&T Bell Laboratories Chipset synchronization arrangement
US4684897A (en) * 1984-01-03 1987-08-04 Raytheon Company Frequency correction apparatus
US4641048A (en) * 1984-08-24 1987-02-03 Tektronix, Inc. Digital integrated circuit propagation delay time controller
US4623805A (en) * 1984-08-29 1986-11-18 Burroughs Corporation Automatic signal delay adjustment apparatus
US4737670A (en) * 1984-11-09 1988-04-12 Lsi Logic Corporation Delay control circuit
JPS61286768A (ja) * 1985-06-13 1986-12-17 Hitachi Ltd テスト装置
JPS62249081A (ja) * 1986-04-21 1987-10-30 Nec Corp 半導体集積回路
JPS62265579A (ja) * 1986-05-13 1987-11-18 Nec Corp テスト回路
US4691124A (en) * 1986-05-16 1987-09-01 Motorola, Inc. Self-compensating, maximum speed integrated circuit
DE3677986D1 (de) * 1986-10-21 1991-04-11 Ibm Verfahren zur digitalen regelung der flankensteilheit der ausgangssignale von leistungsverstaerkern der fuer einen computer bestimmten halbleiterchips mit hochintegrierten schaltungen.
US4818901A (en) * 1987-07-20 1989-04-04 Harris Corporation Controlled switching CMOS output buffer

Also Published As

Publication number Publication date
EP0357532A2 (de) 1990-03-07
DE68910243T2 (de) 1994-05-05
JPH02284080A (ja) 1990-11-21
EP0357532A3 (en) 1990-06-13
US4939389A (en) 1990-07-03
JP2650113B2 (ja) 1997-09-03
EP0357532B1 (de) 1993-10-27

Similar Documents

Publication Publication Date Title
DE68910243T2 (de) Messen des Betriebsverhaltens von integrierten Schaltungen in Chipform.
DE68921269T2 (de) Integrierte Prüfschaltung.
KR900012345A (ko) 집적 회로 칩
DK213989A (da) Integreret kredsloebskort
DE68924452T2 (de) Packungsstruktur für integrierte Schaltungen.
DE3750770D1 (de) Integrierte Schaltung in Hauptscheibentechnik.
KR890015413A (ko) 반도체 집적회로
DE68921088D1 (de) Integrierte Halbleiterschaltung.
DE68920603T2 (de) Gehäuse von integrierten Schaltungen und Herstellungsverfahren.
DE68914178T2 (de) Elektroumstrahlprüfung von elektronischen Komponenten.
KR900012359A (ko) 집적회로 칩
DE3675236D1 (de) Kontaktloses testen von integrierten schaltungen.
DE68915136D1 (de) Integrierte Halbleiterspeicherschaltung.
DE68916093D1 (de) Integrierte Schaltung.
DE68918568D1 (de) Integrierte Speicherschaltung.
DE3667547D1 (de) Kontaktloses pruefen integrierter schaltungen.
DE68929104T2 (de) Integrierte Halbleiterschaltung
DE68925616D1 (de) Adressenübergangsabfühlschaltung
DE68915284T2 (de) Testen von schaltungen.
DE68912794D1 (de) Integrierte Halbleiterschaltung.
DE68910445D1 (de) Integrierter Halbleiterschaltkreis.
DE68924876D1 (de) Integrierte Halbleiterschaltungen.
DE3687785T2 (de) Integrierte schaltungen.
DE68929148T2 (de) Integrierte Halbleiterschaltung
DE68928096D1 (de) Integrierter Halbleiterschaltkreis

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee