DE60327781D1 - Magnetmesseinrichtung - Google Patents

Magnetmesseinrichtung

Info

Publication number
DE60327781D1
DE60327781D1 DE60327781T DE60327781T DE60327781D1 DE 60327781 D1 DE60327781 D1 DE 60327781D1 DE 60327781 T DE60327781 T DE 60327781T DE 60327781 T DE60327781 T DE 60327781T DE 60327781 D1 DE60327781 D1 DE 60327781D1
Authority
DE
Germany
Prior art keywords
measuring device
magnetic measuring
magnetic
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60327781T
Other languages
English (en)
Inventor
William F Witcraft
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell International Inc
Original Assignee
Honeywell International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell International Inc filed Critical Honeywell International Inc
Application granted granted Critical
Publication of DE60327781D1 publication Critical patent/DE60327781D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09Magnetoresistive devices
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/11Magnetic recording head
    • Y10T428/1193Magnetic recording head with interlaminar component [e.g., adhesion layer, etc.]

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
DE60327781T 2002-07-23 2003-07-23 Magnetmesseinrichtung Expired - Fee Related DE60327781D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/201,381 US7037604B2 (en) 2002-07-23 2002-07-23 Magnetic sensing device
PCT/US2003/023389 WO2004015437A1 (en) 2002-07-23 2003-07-23 Magnetic sensing device

Publications (1)

Publication Number Publication Date
DE60327781D1 true DE60327781D1 (de) 2009-07-09

Family

ID=30769637

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60327781T Expired - Fee Related DE60327781D1 (de) 2002-07-23 2003-07-23 Magnetmesseinrichtung

Country Status (8)

Country Link
US (1) US7037604B2 (de)
EP (1) EP1540362B1 (de)
JP (1) JP2005534193A (de)
CN (1) CN1672058A (de)
AU (1) AU2003265301A1 (de)
CA (1) CA2493438A1 (de)
DE (1) DE60327781D1 (de)
WO (1) WO2004015437A1 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040037818A1 (en) * 1998-07-30 2004-02-26 Brand Stephen J. Treatment for diabetes
US7239000B2 (en) * 2003-04-15 2007-07-03 Honeywell International Inc. Semiconductor device and magneto-resistive sensor integration
US6883241B2 (en) * 2003-07-31 2005-04-26 Medtronic, Inc. Compass-based indicator with magnetic shielding
US7126330B2 (en) * 2004-06-03 2006-10-24 Honeywell International, Inc. Integrated three-dimensional magnetic sensing device and method to fabricate an integrated three-dimensional magnetic sensing device
KR20060021649A (ko) * 2004-09-03 2006-03-08 엘지전자 주식회사 고밀도 미세 패턴의 단락 도선 위치 검출을 위한 자기 센서
US7064558B1 (en) * 2004-12-16 2006-06-20 Honeywell International Inc. Millivolt output circuit for use with programmable sensor compensation integrated circuits
DE102005047414B4 (de) 2005-02-21 2012-01-05 Infineon Technologies Ag Magnetoresistives Sensormodul und Verfahren zum Herstellen desselben
US7545662B2 (en) * 2005-03-25 2009-06-09 Taiwan Semiconductor Manufacturing Co., Ltd. Method and system for magnetic shielding in semiconductor integrated circuit
DE602005017900D1 (de) * 2005-10-10 2010-01-07 Infineon Technologies Sensonor Niederfrequenzempfänger mit Magnetfelddetektor
TWI295102B (en) * 2006-01-13 2008-03-21 Ind Tech Res Inst Multi-functional substrate structure
SG135077A1 (en) * 2006-02-27 2007-09-28 Nanyang Polytechnic Apparatus and method for non-invasively sensing pulse rate and blood flow anomalies
BRPI0605714B1 (pt) * 2006-03-07 2018-06-26 José Gouveia Abrunhosa Jorge Dispositivo e processo para detecção de materiais magnéticos em sistemas antifurtos de tecnologia eletromagnética
EP2360489B1 (de) * 2010-02-04 2013-04-17 Nxp B.V. Magnetfeldsensor
TWI443360B (zh) * 2011-02-22 2014-07-01 Voltafield Technology Corp 磁阻感測器及其製造方法
TWI467821B (zh) * 2010-12-31 2015-01-01 Voltafield Technology Corp 磁阻感測器及其製造方法
US20140347047A1 (en) * 2011-02-22 2014-11-27 Voltafield Technology Corporation Magnetoresistive sensor
ITTO20120614A1 (it) * 2012-07-11 2014-01-12 St Microelectronics Srl Sensore magnetoresistivo integrato multistrato e relativo metodo di fabbricazione
WO2014156108A1 (ja) * 2013-03-26 2014-10-02 旭化成エレクトロニクス株式会社 磁気センサ及びその磁気検出方法
DE202013003631U1 (de) * 2013-04-18 2013-04-26 Steiner-Optik Gmbh Batteriefachschirmung
US9497846B2 (en) * 2013-10-24 2016-11-15 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Plasma generator using spiral conductors
US10180341B2 (en) * 2013-10-24 2019-01-15 The United States Of America As Represented By The Administrator Of Nasa Multi-layer wireless sensor construct for use at electrically-conductive material surfaces
US10193228B2 (en) 2013-10-24 2019-01-29 The United States Of America As Represented By The Administrator Of Nasa Antenna for near field sensing and far field transceiving
CN103647022B (zh) * 2013-12-25 2016-04-27 杭州士兰集成电路有限公司 各向异性磁阻传感器垂直结构及其制造方法
US10145906B2 (en) 2015-12-17 2018-12-04 Analog Devices Global Devices, systems and methods including magnetic structures
CN106229406A (zh) * 2016-10-10 2016-12-14 杭州士兰集成电路有限公司 集成型磁开关及其制造方法
US10591320B2 (en) * 2017-12-11 2020-03-17 Nxp B.V. Magnetoresistive sensor with stray field cancellation and systems incorporating same

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5041780A (en) 1988-09-13 1991-08-20 California Institute Of Technology Integrable current sensors
JPH02129882U (de) 1989-03-31 1990-10-25
US5247278A (en) * 1991-11-26 1993-09-21 Honeywell Inc. Magnetic field sensing device
US5570015A (en) 1992-02-05 1996-10-29 Mitsubishi Denki Kabushiki Kaisha Linear positional displacement detector for detecting linear displacement of a permanent magnet as a change in direction of magnetic sensor unit
US5757591A (en) * 1996-11-25 1998-05-26 International Business Machines Corporation Magnetoresistive read/inductive write magnetic head assembly fabricated with silicon on hard insulator for improved durability and electrostatic discharge protection and method for manufacturing same
US5902690A (en) * 1997-02-25 1999-05-11 Motorola, Inc. Stray magnetic shielding for a non-volatile MRAM
US6404191B2 (en) * 1997-08-08 2002-06-11 Nve Corporation Read heads in planar monolithic integrated circuit chips
US5898548A (en) * 1997-10-24 1999-04-27 International Business Machines Corporation Shielded magnetic tunnel junction magnetoresistive read head
JPH11154309A (ja) * 1997-11-20 1999-06-08 Sony Corp 磁気抵抗効果型磁気ヘッド
US6048739A (en) * 1997-12-18 2000-04-11 Honeywell Inc. Method of manufacturing a high density magnetic memory device
US6072382A (en) * 1998-01-06 2000-06-06 Nonvolatile Electronics, Incorporated Spin dependent tunneling sensor
KR20020060704A (ko) 1999-10-05 2002-07-18 추후 자기저항 헤드의 정전기 방전 보호용 기판 집적 장치 및방법
US6462541B1 (en) 1999-11-12 2002-10-08 Nve Corporation Uniform sense condition magnetic field sensor using differential magnetoresistance
US6452253B1 (en) * 2000-08-31 2002-09-17 Micron Technology, Inc. Method and apparatus for magnetic shielding of an integrated circuit
US6717241B1 (en) * 2000-08-31 2004-04-06 Micron Technology, Inc. Magnetic shielding for integrated circuits
US6515352B1 (en) * 2000-09-25 2003-02-04 Micron Technology, Inc. Shielding arrangement to protect a circuit from stray magnetic fields
JP3659898B2 (ja) * 2000-11-27 2005-06-15 Tdk株式会社 薄膜磁気ヘッドおよびその製造方法
JP2002184945A (ja) * 2000-12-11 2002-06-28 Fuji Electric Co Ltd 磁気素子一体型半導体デバイス
US6724027B2 (en) * 2002-04-18 2004-04-20 Hewlett-Packard Development Company, L.P. Magnetic shielding for MRAM devices
US6936763B2 (en) * 2002-06-28 2005-08-30 Freescale Semiconductor, Inc. Magnetic shielding for electronic circuits which include magnetic materials

Also Published As

Publication number Publication date
AU2003265301A1 (en) 2004-02-25
US20040019272A1 (en) 2004-01-29
CA2493438A1 (en) 2004-02-19
EP1540362B1 (de) 2009-05-27
EP1540362A1 (de) 2005-06-15
US7037604B2 (en) 2006-05-02
WO2004015437A1 (en) 2004-02-19
JP2005534193A (ja) 2005-11-10
CN1672058A (zh) 2005-09-21

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee