DE60306164D1 - Verfahren und kontrolllogik zum ansteuern von mehreren taps (test access ports) über einen einzigen tap - Google Patents

Verfahren und kontrolllogik zum ansteuern von mehreren taps (test access ports) über einen einzigen tap

Info

Publication number
DE60306164D1
DE60306164D1 DE60306164T DE60306164T DE60306164D1 DE 60306164 D1 DE60306164 D1 DE 60306164D1 DE 60306164 T DE60306164 T DE 60306164T DE 60306164 T DE60306164 T DE 60306164T DE 60306164 D1 DE60306164 D1 DE 60306164D1
Authority
DE
Germany
Prior art keywords
control logic
access ports
test access
single tap
testing multiple
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60306164T
Other languages
English (en)
Other versions
DE60306164T2 (de
Inventor
C Moyer
William Bruce
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP USA Inc
Original Assignee
Freescale Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Freescale Semiconductor Inc filed Critical Freescale Semiconductor Inc
Publication of DE60306164D1 publication Critical patent/DE60306164D1/de
Application granted granted Critical
Publication of DE60306164T2 publication Critical patent/DE60306164T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE60306164T 2002-05-29 2003-05-09 Verfahren und kontrolllogik zum ansteuern von mehreren taps (test access ports) über einen einzigen tap Expired - Lifetime DE60306164T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US157094 2002-05-29
US10/157,094 US7185251B2 (en) 2002-05-29 2002-05-29 Method and apparatus for affecting a portion of an integrated circuit
PCT/US2003/014513 WO2003102747A2 (en) 2002-05-29 2003-05-09 Method and control circuitry for accessing multiple taps (test access ports) via a single tap

Publications (2)

Publication Number Publication Date
DE60306164D1 true DE60306164D1 (de) 2006-07-27
DE60306164T2 DE60306164T2 (de) 2006-11-09

Family

ID=29582387

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60306164T Expired - Lifetime DE60306164T2 (de) 2002-05-29 2003-05-09 Verfahren und kontrolllogik zum ansteuern von mehreren taps (test access ports) über einen einzigen tap

Country Status (9)

Country Link
US (2) US7185251B2 (de)
EP (1) EP1520182B1 (de)
JP (2) JP5091387B2 (de)
KR (1) KR20050007565A (de)
CN (1) CN100449321C (de)
AU (1) AU2003230355A1 (de)
DE (1) DE60306164T2 (de)
TW (2) TWI301234B (de)
WO (1) WO2003102747A2 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7185251B2 (en) * 2002-05-29 2007-02-27 Freescale Semiconductor, Inc. Method and apparatus for affecting a portion of an integrated circuit
US7552360B2 (en) 2005-03-21 2009-06-23 Texas Instruments Incorporated Debug and test system with format select register circuitry
US20090307545A1 (en) * 2004-12-20 2009-12-10 Koninklijke Philips Electronics N.V. Testable multiprocessor system and a method for testing a processor system
US9104894B2 (en) * 2005-12-16 2015-08-11 Hewlett-Packard Development Company, L.P. Hardware enablement using an interface
KR100825790B1 (ko) * 2006-11-07 2008-04-29 삼성전자주식회사 데이터를 압축시키는 테스트 콘트롤러를 채용한 테스트시스템, 데이터 압축 회로 및 테스트 방법
US7877653B2 (en) * 2007-05-09 2011-01-25 Texas Instruments Incorporated Address and TMS gating circuitry for TAP control circuit
US8015462B2 (en) 2007-05-11 2011-09-06 Renesas Electronics Corporation Test circuit
US8037355B2 (en) * 2007-06-07 2011-10-11 Texas Instruments Incorporated Powering up adapter and scan test logic TAP controllers
US7657805B2 (en) 2007-07-02 2010-02-02 Sun Microsystems, Inc. Integrated circuit with blocking pin to coordinate entry into test mode
JP5832535B2 (ja) * 2010-07-29 2015-12-16 日本テキサス・インスツルメンツ株式会社 アット・スピード・テストアクセスポート動作の改善
US8694844B2 (en) 2010-07-29 2014-04-08 Texas Instruments Incorporated AT speed TAP with dual port router and command circuit
JP5772326B2 (ja) * 2011-07-15 2015-09-02 富士通セミコンダクター株式会社 半導体集積回路及びその設計方法
JP6051509B2 (ja) 2011-10-31 2016-12-27 ソニー株式会社 発電制御システム、発電制御プログラムおよび電子機器
US9323633B2 (en) * 2013-03-28 2016-04-26 Stmicroelectronics, Inc. Dual master JTAG method, circuit, and system
GB2520991A (en) * 2013-12-06 2015-06-10 Ibm An integrated circuit chip and a method for testing thereof

Family Cites Families (28)

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US5189675A (en) * 1988-06-22 1993-02-23 Kabushiki Kaisha Toshiba Self-diagnostic circuit for logic circuit block
DE68923086T2 (de) * 1989-08-25 1996-01-25 Philips Electronics Nv Verfahren zum Testen von hierarchisch organisierten integrierten Schaltungen und integrierte Schaltungen, geeignet für einen solchen Test.
US5228045A (en) * 1990-08-06 1993-07-13 Ncr Corporation Test driver for connecting a standard test port integrated circuit chip to a controlling computer
US5355369A (en) * 1991-04-26 1994-10-11 At&T Bell Laboratories High-speed integrated circuit testing with JTAG
US5377198A (en) * 1991-11-27 1994-12-27 Ncr Corporation (Nka At&T Global Information Solutions Company JTAG instruction error detection
US5343478A (en) * 1991-11-27 1994-08-30 Ncr Corporation Computer system configuration via test bus
US5423050A (en) * 1991-11-27 1995-06-06 Ncr Corporation Intermodule test across system bus utilizing serial test bus
US5325368A (en) * 1991-11-27 1994-06-28 Ncr Corporation JTAG component description via nonvolatile memory
JPH05264664A (ja) * 1992-03-17 1993-10-12 Fujitsu Ltd 半導体集積回路
EP0855654B1 (de) * 1992-06-17 2004-04-07 Texas Instruments Incorporated Hierarchisches Verbindungsverfahren und -gerät
JP3297220B2 (ja) 1993-10-29 2002-07-02 株式会社東芝 半導体装置の製造方法および半導体装置
JP3207727B2 (ja) 1995-10-03 2001-09-10 株式会社東芝 半導体集積回路およびその応用装置
JP4020462B2 (ja) * 1996-08-30 2007-12-12 テキサス インスツルメンツ インコーポレイテツド テストインタフェースを含む集積回路及びテストインタフェースを使用する方法
EP0826974B1 (de) * 1996-08-30 2005-10-19 Texas Instruments Incorporated Vorrichtung zur Prüfung von integrierten Schaltungen
US6405335B1 (en) * 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
US6041176A (en) 1998-02-27 2000-03-21 Texas Instruments Incorporated Emulation devices utilizing state machines
US6115763A (en) * 1998-03-05 2000-09-05 International Business Machines Corporation Multi-core chip providing external core access with regular operation function interface and predetermined service operation services interface comprising core interface units and masters interface unit
US6378090B1 (en) * 1998-04-24 2002-04-23 Texas Instruments Incorporated Hierarchical test access port architecture for electronic circuits including embedded core having built-in test access port
US6334198B1 (en) * 1999-04-01 2001-12-25 Koninklijke Philips Electronics N.V. (Kpenv) Method and arrangement for controlling multiply-activated test access port control modules
US6311302B1 (en) * 1999-04-01 2001-10-30 Philips Semiconductor, Inc. Method and arrangement for hierarchical control of multiple test access port control modules
US6385749B1 (en) 1999-04-01 2002-05-07 Koninklijke Philips Electronics N.V. (Kpenv) Method and arrangement for controlling multiple test access port control modules
US6631504B2 (en) * 2000-01-18 2003-10-07 Cadence Design Systems, Inc Hierarchical test circuit structure for chips with multiple circuit blocks
US6760876B1 (en) * 2000-04-04 2004-07-06 Silicon Graphics, Inc. Scan interface chip (SIC) system and method for scan testing electronic systems
US6754863B1 (en) * 2000-04-04 2004-06-22 Silicon Graphics, Inc. Scan interface chip (SIC) system and method for scan testing electronic systems
US6813739B1 (en) * 2000-04-04 2004-11-02 Silicon Graphics, Inc. Scan interface chip (SIC) system and method for scan testing electronic systems
US6961884B1 (en) * 2000-06-12 2005-11-01 Altera Corporation JTAG mirroring circuitry and methods
JP4401039B2 (ja) * 2001-06-13 2010-01-20 株式会社ルネサステクノロジ 半導体集積回路
US7185251B2 (en) * 2002-05-29 2007-02-27 Freescale Semiconductor, Inc. Method and apparatus for affecting a portion of an integrated circuit

Also Published As

Publication number Publication date
TWI301234B (en) 2008-09-21
TW200407698A (en) 2004-05-16
EP1520182B1 (de) 2006-06-14
DE60306164T2 (de) 2006-11-09
WO2003102747A3 (en) 2004-03-04
CN1656386A (zh) 2005-08-17
US7581151B2 (en) 2009-08-25
TWI358633B (en) 2012-02-21
TW200741436A (en) 2007-11-01
JP2011069840A (ja) 2011-04-07
JP2005527918A (ja) 2005-09-15
JP5275333B2 (ja) 2013-08-28
JP5091387B2 (ja) 2012-12-05
AU2003230355A8 (en) 2003-12-19
US7185251B2 (en) 2007-02-27
US20030226080A1 (en) 2003-12-04
US20070150782A1 (en) 2007-06-28
EP1520182A2 (de) 2005-04-06
AU2003230355A1 (en) 2003-12-19
KR20050007565A (ko) 2005-01-19
CN100449321C (zh) 2009-01-07
WO2003102747A2 (en) 2003-12-11

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