DE60301097D1 - Datenspeichervorrichtung - Google Patents

Datenspeichervorrichtung

Info

Publication number
DE60301097D1
DE60301097D1 DE60301097T DE60301097T DE60301097D1 DE 60301097 D1 DE60301097 D1 DE 60301097D1 DE 60301097 T DE60301097 T DE 60301097T DE 60301097 T DE60301097 T DE 60301097T DE 60301097 D1 DE60301097 D1 DE 60301097D1
Authority
DE
Germany
Prior art keywords
storage device
data storage
data
storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60301097T
Other languages
English (en)
Other versions
DE60301097T2 (de
Inventor
Janice H Nickel
Manoj Bhattacharyya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Application granted granted Critical
Publication of DE60301097D1 publication Critical patent/DE60301097D1/de
Publication of DE60301097T2 publication Critical patent/DE60301097T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
    • G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Hall/Mr Elements (AREA)
  • Mram Or Spin Memory Techniques (AREA)
  • Semiconductor Memories (AREA)
DE60301097T 2002-06-17 2003-05-16 Datenspeichervorrichtung Expired - Lifetime DE60301097T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/173,195 US6803616B2 (en) 2002-06-17 2002-06-17 Magnetic memory element having controlled nucleation site in data layer
US173195 2002-06-17

Publications (2)

Publication Number Publication Date
DE60301097D1 true DE60301097D1 (de) 2005-09-01
DE60301097T2 DE60301097T2 (de) 2006-08-31

Family

ID=29717779

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60301097T Expired - Lifetime DE60301097T2 (de) 2002-06-17 2003-05-16 Datenspeichervorrichtung

Country Status (7)

Country Link
US (3) US6803616B2 (de)
EP (1) EP1376600B1 (de)
JP (1) JP4886963B2 (de)
KR (1) KR100972631B1 (de)
CN (1) CN100442384C (de)
DE (1) DE60301097T2 (de)
TW (1) TW200400595A (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6927995B2 (en) * 2001-08-09 2005-08-09 Hewlett-Packard Development Company, L.P. Multi-bit MRAM device with switching nucleation sites
US6803616B2 (en) * 2002-06-17 2004-10-12 Hewlett-Packard Development Company, L.P. Magnetic memory element having controlled nucleation site in data layer
JP2006135292A (ja) * 2004-10-08 2006-05-25 Toshiba Corp 磁気抵抗効果素子
JP4630747B2 (ja) * 2005-07-15 2011-02-09 株式会社東芝 磁気抵抗効果素子及び磁気ランダムアクセスメモリ
JP4594694B2 (ja) * 2004-10-08 2010-12-08 株式会社東芝 磁気抵抗効果素子
JP4657836B2 (ja) * 2005-07-12 2011-03-23 Ｎｅｃトーキン株式会社 インピーダンス素子を用いた磁性薄膜素子
JP2007027415A (ja) 2005-07-15 2007-02-01 Toshiba Corp 磁気記憶装置
US8084835B2 (en) * 2006-10-20 2011-12-27 Avalanche Technology, Inc. Non-uniform switching based non-volatile magnetic based memory
JP2012244051A (ja) * 2011-05-23 2012-12-10 Fujitsu Ltd 磁気抵抗素子及び磁気記憶装置
CN111933789B (zh) * 2020-08-11 2022-07-08 兰州大学 一种多态存储器、其制备方法和存储方法及人工突触器

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0971423A1 (de) 1998-07-10 2000-01-12 Interuniversitair Micro-Elektronica Centrum Vzw Spin-Valve-Struktur und Herstellungsverfahren
US6072717A (en) 1998-09-04 2000-06-06 Hewlett Packard Stabilized magnetic memory cell
JP2000195250A (ja) * 1998-12-24 2000-07-14 Toshiba Corp 磁気メモリ装置
US6185143B1 (en) * 2000-02-04 2001-02-06 Hewlett-Packard Company Magnetic random access memory (MRAM) device including differential sense amplifiers
US6590806B1 (en) 2000-03-09 2003-07-08 Hewlett-Packard Development Company, L.P. Multibit magnetic memory element
US6205053B1 (en) * 2000-06-20 2001-03-20 Hewlett-Packard Company Magnetically stable magnetoresistive memory element
US6317376B1 (en) * 2000-06-20 2001-11-13 Hewlett-Packard Company Reference signal generation for magnetic random access memory devices
US6538921B2 (en) * 2000-08-17 2003-03-25 Nve Corporation Circuit selection of magnetic memory cells and related cell structures
JP4458703B2 (ja) * 2001-03-16 2010-04-28 株式会社東芝 磁気抵抗効果素子、その製造方法、磁気ランダムアクセスメモリ、携帯端末装置、磁気ヘッド及び磁気再生装置
US6803616B2 (en) * 2002-06-17 2004-10-12 Hewlett-Packard Development Company, L.P. Magnetic memory element having controlled nucleation site in data layer
US6570783B1 (en) * 2001-11-15 2003-05-27 Micron Technology, Inc. Asymmetric MRAM cell and bit design for improving bit yield
US6798691B1 (en) * 2002-03-07 2004-09-28 Silicon Magnetic Systems Asymmetric dot shape for increasing select-unselect margin in MRAM devices

Also Published As

Publication number Publication date
EP1376600A1 (de) 2004-01-02
KR20040002557A (ko) 2004-01-07
DE60301097T2 (de) 2006-08-31
US6803616B2 (en) 2004-10-12
CN1469384A (zh) 2004-01-21
US20040062125A1 (en) 2004-04-01
US20040089888A1 (en) 2004-05-13
JP4886963B2 (ja) 2012-02-29
CN100442384C (zh) 2008-12-10
US20030231520A1 (en) 2003-12-18
TW200400595A (en) 2004-01-01
KR100972631B1 (ko) 2010-07-28
JP2004047992A (ja) 2004-02-12
US6905888B2 (en) 2005-06-14
EP1376600B1 (de) 2005-07-27

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: HEWLETT-PACKARD DEVELOPMENT CO., L.P., HOUSTON, TE

8332 No legal effect for de
8370 Indication of lapse of patent is to be deleted
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: SAMSUNG ELECTRONICS CO., LTD., SUWON, GYEONGGI, KR