DE602005009174D1 - Ekarten an testsysteme - Google Patents

Ekarten an testsysteme

Info

Publication number
DE602005009174D1
DE602005009174D1 DE602005009174T DE602005009174T DE602005009174D1 DE 602005009174 D1 DE602005009174 D1 DE 602005009174D1 DE 602005009174 T DE602005009174 T DE 602005009174T DE 602005009174 T DE602005009174 T DE 602005009174T DE 602005009174 D1 DE602005009174 D1 DE 602005009174D1
Authority
DE
Germany
Prior art keywords
carrier module
instrument cards
cards
test system
standard
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE602005009174T
Other languages
English (en)
Inventor
Eric Barr Kushnick
Yasuo Furukawa
Lawrence Kraus
James Getchell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE602005009174D1 publication Critical patent/DE602005009174D1/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Liquid Developers In Electrophotography (AREA)
DE602005009174T 2004-05-21 2005-05-20 Ekarten an testsysteme Expired - Fee Related DE602005009174D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US57312104P 2004-05-21 2004-05-21
US10/912,848 US7362089B2 (en) 2004-05-21 2004-08-06 Carrier module for adapting non-standard instrument cards to test systems
PCT/JP2005/009708 WO2005114236A1 (en) 2004-05-21 2005-05-20 Carrier module for adapting non-standard instrument cards to test systems

Publications (1)

Publication Number Publication Date
DE602005009174D1 true DE602005009174D1 (de) 2008-10-02

Family

ID=34968273

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005009174T Expired - Fee Related DE602005009174D1 (de) 2004-05-21 2005-05-20 Ekarten an testsysteme

Country Status (7)

Country Link
US (3) US7362089B2 (de)
EP (1) EP1747475B1 (de)
JP (1) JP2007518061A (de)
AT (1) ATE405847T1 (de)
DE (1) DE602005009174D1 (de)
TW (1) TW200608033A (de)
WO (1) WO2005114236A1 (de)

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CN103645648A (zh) * 2013-12-20 2014-03-19 江苏锐天信息科技有限公司 一种基于pxi架构的航空总线接口仿真设备
CN104077200B (zh) * 2014-06-27 2017-07-14 北京计算机技术及应用研究所 一种脱离于主机的cpci模块独立测试装置
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CN104614668A (zh) * 2015-02-27 2015-05-13 北京精密机电控制设备研究所 一种电路板测试系统
US10429437B2 (en) * 2015-05-28 2019-10-01 Keysight Technologies, Inc. Automatically generated test diagram
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EP3580575A4 (de) * 2017-02-10 2020-08-19 Checksum LLC Funktionstestgerät für leiterplatten sowie zugehörige systeme und verfahren
CN106997005B (zh) * 2017-02-17 2020-05-15 上海裕达实业有限公司 高精度热控回路阻值测试方法
CN107733520B (zh) * 2017-10-17 2020-01-14 北京空间技术研制试验中心 卫星地面s波段信号转发器
CN108776295A (zh) * 2018-06-06 2018-11-09 北京中航科电测控技术股份有限公司 一种高效etap自动化测试系统
KR102583174B1 (ko) * 2018-06-12 2023-09-26 삼성전자주식회사 테스트 인터페이스 보드, 이를 포함하는 테스트 시스템 및 이의 동작 방법
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CN110673014A (zh) * 2019-09-11 2020-01-10 天津市英贝特航天科技有限公司 一种便携式cpci总线板卡的测试设备
TWI779458B (zh) * 2020-02-28 2022-10-01 日商愛德萬測試股份有限公司 用於任意全資料奇特扇區大小支援之軟體為主解決方案
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CN113253096A (zh) * 2021-05-26 2021-08-13 深圳众城卓越科技有限公司 一种印刷电路自动检测系统及检测方法
CN113867308A (zh) * 2021-08-30 2021-12-31 航天东方红卫星有限公司 一种便携式小卫星并行采集控制终端
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Also Published As

Publication number Publication date
US20080157805A1 (en) 2008-07-03
EP1747475B1 (de) 2008-08-20
EP1747475A1 (de) 2007-01-31
ATE405847T1 (de) 2008-09-15
US7463018B2 (en) 2008-12-09
US7362089B2 (en) 2008-04-22
JP2007518061A (ja) 2007-07-05
US20050261856A1 (en) 2005-11-24
TW200608033A (en) 2006-03-01
US20080157804A1 (en) 2008-07-03
WO2005114236A1 (en) 2005-12-01

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Legal Events

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee