DE60126032D1 - Inspektionseichblock und dessen produktion - Google Patents

Inspektionseichblock und dessen produktion

Info

Publication number
DE60126032D1
DE60126032D1 DE60126032T DE60126032T DE60126032D1 DE 60126032 D1 DE60126032 D1 DE 60126032D1 DE 60126032 T DE60126032 T DE 60126032T DE 60126032 T DE60126032 T DE 60126032T DE 60126032 D1 DE60126032 D1 DE 60126032D1
Authority
DE
Germany
Prior art keywords
production
inspection cabin
cabin
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60126032T
Other languages
English (en)
Other versions
DE60126032T2 (de
Inventor
Susumu Asanuma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Asanuma Giken Co Ltd
Original Assignee
Asanuma Giken Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asanuma Giken Co Ltd filed Critical Asanuma Giken Co Ltd
Publication of DE60126032D1 publication Critical patent/DE60126032D1/de
Application granted granted Critical
Publication of DE60126032T2 publication Critical patent/DE60126032T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE60126032T 2000-02-22 2001-02-13 Inspektionseichblock und dessen produktion Expired - Lifetime DE60126032T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2000044187 2000-02-22
JP2000044187 2000-02-22
JP2001028999A JP3462180B2 (ja) 2000-02-22 2001-02-06 検査用マスタブロック及びその製造方法
JP2001028999 2001-02-06
PCT/JP2001/000965 WO2001063205A1 (fr) 2000-02-22 2001-02-13 Bloc principal de controle et procede de production dudit bloc

Publications (2)

Publication Number Publication Date
DE60126032D1 true DE60126032D1 (de) 2007-03-08
DE60126032T2 DE60126032T2 (de) 2007-08-16

Family

ID=26585819

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60126032T Expired - Lifetime DE60126032T2 (de) 2000-02-22 2001-02-13 Inspektionseichblock und dessen produktion

Country Status (10)

Country Link
US (1) US6782730B2 (de)
EP (1) EP1189020B1 (de)
JP (1) JP3462180B2 (de)
KR (1) KR100491268B1 (de)
CN (1) CN1209600C (de)
AU (1) AU761188B2 (de)
CA (2) CA2369888C (de)
DE (1) DE60126032T2 (de)
TW (1) TW522219B (de)
WO (1) WO2001063205A1 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3905771B2 (ja) 2001-03-02 2007-04-18 株式会社ミツトヨ 測定機の校正方法及び装置
JP3837503B2 (ja) * 2002-05-09 2006-10-25 独立行政法人産業技術総合研究所 ３次元座標評価ゲージ
JP2004333368A (ja) * 2003-05-09 2004-11-25 Photron Ltd 移動物体撮影系の三次元定数取得用キャリブレーション治具
DE202005014635U1 (de) * 2005-09-15 2007-02-01 Jeromin, Johannes Kalibrierlehre zur Kalibrierung eines Messschiebers
US7353609B2 (en) * 2006-05-19 2008-04-08 Boeing Company Hole location method and apparatus
JP5192794B2 (ja) * 2007-12-01 2013-05-08 株式会社浅沼技研 Ｎｃ加工機用寸法標準器
US7895879B2 (en) * 2007-12-06 2011-03-01 International Business Machines Corporation Sample holder for holding samples at pre-determined angles
DE102008024808B3 (de) * 2008-05-23 2009-11-26 Bundesrepublik Deutschland, vertr. d. d. Bundesministerium für Wirtschaft und Technologie, dieses vertr. d. d. Präsidenten der Physikalisch-Technischen Bundesanstalt Geometrienormal und Verfahren zum Herastellen eines Millimeterbereich-Längennormals
DE102009045515B3 (de) * 2009-10-09 2011-03-03 Dreier Lasermesstechnik Gmbh Vorrichtung zur Überprüfung der Genauigkeit von Werkzeugmaschinen und Messeinrichtungen
GB201003363D0 (en) * 2010-03-01 2010-04-14 Renishaw Plc Measurement method and apparatus
JP5837360B2 (ja) * 2010-10-27 2015-12-24 株式会社浅沼技研 ３次元測定機検証用長尺ゲージ
EP2681506B1 (de) * 2011-03-01 2014-11-26 Sintokogio, Ltd. Standardkubus
JP5289507B2 (ja) * 2011-05-26 2013-09-11 本田技研工業株式会社 座標系整合方法
CN104101275B (zh) * 2013-04-10 2016-12-28 富泰华工业（深圳）有限公司 检测装置
EP3004796B1 (de) * 2013-05-27 2017-03-22 Carl Zeiss Industrielle Messtechnik GmbH Vorrichtung und verfahren zur kalibrierung eines koordinatenmessgeräts
US9952044B2 (en) * 2015-02-02 2018-04-24 Rolls-Royce North American Technologies, Inc. Multi-axis calibration block
US10757394B1 (en) 2015-11-09 2020-08-25 Cognex Corporation System and method for calibrating a plurality of 3D sensors with respect to a motion conveyance
US11562502B2 (en) 2015-11-09 2023-01-24 Cognex Corporation System and method for calibrating a plurality of 3D sensors with respect to a motion conveyance
US10812778B1 (en) 2015-11-09 2020-10-20 Cognex Corporation System and method for calibrating one or more 3D sensors mounted on a moving manipulator
US10065319B2 (en) * 2015-11-30 2018-09-04 Delta Electronics, Inc. Tool calibration apparatus of robot manipulator
DE102015226387B4 (de) 2015-12-21 2023-07-27 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zur Durchführung von Messungen mit einem Prüfelement in einem Koordinatenmessgerät oder einer Werkzeugmaschine
US10845192B2 (en) * 2017-09-13 2020-11-24 Shawn Thomas Lause Machine tool test fixture
CN109672878A (zh) * 2017-10-13 2019-04-23 康耐视公司 对校准物体两相对侧成像的视觉系统的场校准系统和方法
US11293745B2 (en) 2018-06-28 2022-04-05 Asanuma Giken Co., Ltd. Inspection master
JP6631984B1 (ja) 2019-06-25 2020-01-15 株式会社浅沼技研 検査マスタ

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5980708A (ja) 1982-10-29 1984-05-10 Nippon Steel Corp 混銑車の不定形耐火物築造法
JPS5980708U (ja) * 1982-11-24 1984-05-31 株式会社ミツトヨ 三次元測定機の原点ブロツク支持台
DE3823684C1 (de) * 1988-07-13 1989-05-18 Uranit Gmbh, 5170 Juelich, De
EP0362626B1 (de) * 1988-10-03 1993-02-10 Firma Carl Zeiss Prüfkörper für Koordinatenmessgeräte
GB8906287D0 (en) * 1989-03-18 1989-05-04 Renishaw Plc Probe calibration
JP2858926B2 (ja) 1990-10-24 1999-02-17 ファナック株式会社 機械の静的精度計測用のマスター計測装置
US5400638A (en) * 1992-01-14 1995-03-28 Korea Institute Of Science And Technology Calibration system for compensation of arm length variation of an industrial robot due to peripheral temperature change
IT1261383B (it) * 1993-12-21 1996-05-20 Antonio Critelli Metodo di misura dimensionale e campione di riferimento per l'attuazione di tale metodo.
DE19507805A1 (de) 1995-03-06 1996-09-12 Eugen Dr Ing Trapet Prüfkörper für Koordinatenmeßgeräte und Werkzeugmaschinen
DE19611617C2 (de) * 1996-03-23 2003-03-20 Henrik Herklotz Prüfeinrichtung zur Ermittlung geometrischer Abweichungen von taktilen Koordinatenmessgeräten, bestehend aus einem Präzisions-Prüfkörper und einer eindeutig zugehörigen Tasterkonfiguration
JP3215325B2 (ja) 1996-06-07 2001-10-02 株式会社東京精密 測定機の校正方法及びその装置
DE19644712A1 (de) 1996-10-28 1998-05-07 Eugen Dr Trapet Kugelquader
JPH1144527A (ja) * 1997-07-25 1999-02-16 Asanuma Giken:Kk 寸法計測機とその計測精度確認方法

Also Published As

Publication number Publication date
EP1189020A4 (de) 2002-05-15
AU3226501A (en) 2001-09-03
EP1189020B1 (de) 2007-01-17
CN1209600C (zh) 2005-07-06
JP3462180B2 (ja) 2003-11-05
EP1189020A1 (de) 2002-03-20
CA2369888A1 (en) 2001-08-30
US20020157449A1 (en) 2002-10-31
WO2001063205A1 (fr) 2001-08-30
KR100491268B1 (ko) 2005-05-24
CN1358268A (zh) 2002-07-10
TW522219B (en) 2003-03-01
CA2583935C (en) 2009-09-29
US6782730B2 (en) 2004-08-31
DE60126032T2 (de) 2007-08-16
JP2001311618A (ja) 2001-11-09
CA2583935A1 (en) 2001-08-30
KR20020010135A (ko) 2002-02-02
AU761188B2 (en) 2003-05-29
CA2369888C (en) 2008-05-06

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Legal Events

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8364 No opposition during term of opposition