DE60034731D1 - Kompensationsstruktur für einen Verbindungsdraht beim Hochfrequenzbetrieb - Google Patents

Kompensationsstruktur für einen Verbindungsdraht beim Hochfrequenzbetrieb

Info

Publication number
DE60034731D1
DE60034731D1 DE60034731T DE60034731T DE60034731D1 DE 60034731 D1 DE60034731 D1 DE 60034731D1 DE 60034731 T DE60034731 T DE 60034731T DE 60034731 T DE60034731 T DE 60034731T DE 60034731 D1 DE60034731 D1 DE 60034731D1
Authority
DE
Germany
Prior art keywords
connecting wire
frequency operation
compensation structure
compensation
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60034731T
Other languages
English (en)
Other versions
DE60034731T2 (de
Inventor
Noyan Kinayman
Nitin Jain
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Whitaker LLC
Original Assignee
Whitaker LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Whitaker LLC filed Critical Whitaker LLC
Publication of DE60034731D1 publication Critical patent/DE60034731D1/de
Application granted granted Critical
Publication of DE60034731T2 publication Critical patent/DE60034731T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/64—Impedance arrangements
    • H01L23/66—High-frequency adaptations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/58—Structural electrical arrangements for semiconductor devices not otherwise provided for
    • H01L2223/64—Impedance arrangements
    • H01L2223/66—High-frequency adaptations
    • H01L2223/6605—High-frequency electrical connections
    • H01L2223/6611—Wire connections
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/4501—Shape
    • H01L2224/45012—Cross-sectional shape
    • H01L2224/45014—Ribbon connectors, e.g. rectangular cross-section
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/45099—Material
    • H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144—Gold (Au) as principal constituent
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4801—Structure
    • H01L2224/48011—Length
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01019—Potassium [K]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01079—Gold [Au]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/14—Integrated circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/14—Integrated circuits
    • H01L2924/141—Analog devices
    • H01L2924/1423—Monolithic Microwave Integrated Circuit [MMIC]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/1901—Structure
    • H01L2924/1904—Component type
    • H01L2924/19041—Component type being a capacitor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/1905—Shape
    • H01L2924/19051—Impedance matching structure [e.g. balun]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191—Disposition
    • H01L2924/19101—Disposition of discrete passive components
    • H01L2924/19107—Disposition of discrete passive components off-chip wires
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/30107—Inductance
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/3011—Impedance

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Wire Bonding (AREA)
DE60034731T 1999-03-30 2000-03-28 Kompensationsstruktur für einen Verbindungsdraht beim Hochfrequenzbetrieb Expired - Fee Related DE60034731T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US280474 1999-03-30
US09/280,474 US6201454B1 (en) 1999-03-30 1999-03-30 Compensation structure for a bond wire at high frequency operation

Publications (2)

Publication Number Publication Date
DE60034731D1 true DE60034731D1 (de) 2007-06-21
DE60034731T2 DE60034731T2 (de) 2008-01-31

Family

ID=23073246

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60034731T Expired - Fee Related DE60034731T2 (de) 1999-03-30 2000-03-28 Kompensationsstruktur für einen Verbindungsdraht beim Hochfrequenzbetrieb

Country Status (5)

Country Link
US (1) US6201454B1 (de)
EP (1) EP1041632B1 (de)
JP (1) JP4388198B2 (de)
KR (1) KR100627208B1 (de)
DE (1) DE60034731T2 (de)

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US6294966B1 (en) 1999-12-31 2001-09-25 Hei, Inc. Interconnection device
US6646521B1 (en) * 2000-09-15 2003-11-11 Hei, Inc. Connection for conducting high frequency signal between a circuit and a discrete electric component
JP2005072031A (ja) * 2003-08-22 2005-03-17 Renesas Technology Corp 高周波用半導体装置および通信用電子部品並びに無線通信システム
TWI373925B (en) * 2004-02-10 2012-10-01 Tridev Res L L C Tunable resonant circuit, tunable voltage controlled oscillator circuit, tunable low noise amplifier circuit and method of tuning a resonant circuit
US7508898B2 (en) 2004-02-10 2009-03-24 Bitwave Semiconductor, Inc. Programmable radio transceiver
US7187256B2 (en) * 2004-02-19 2007-03-06 Hittite Microwave Corporation RF package
US20080007365A1 (en) * 2006-06-15 2008-01-10 Jeff Venuti Continuous gain compensation and fast band selection in a multi-standard, multi-frequency synthesizer
US7672645B2 (en) * 2006-06-15 2010-03-02 Bitwave Semiconductor, Inc. Programmable transmitter architecture for non-constant and constant envelope modulation
US7548143B2 (en) * 2006-12-06 2009-06-16 Electronics And Telecommunications Research Institute Microwave module having converter for improving transmission characteristics
US8164167B2 (en) * 2007-03-09 2012-04-24 Nanyang Technological University Integrated circuit structure and a method of forming the same
US8872333B2 (en) * 2008-02-14 2014-10-28 Viasat, Inc. System and method for integrated waveguide packaging
US20090236701A1 (en) * 2008-03-18 2009-09-24 Nanyang Technological University Chip arrangement and a method of determining an inductivity compensation structure for compensating a bond wire inductivity in a chip arrangement
US8611821B2 (en) * 2009-04-28 2013-12-17 Broadcom Corporation Communication device that detects and adapts to the presence of other devices and methods for use therewith
US8032167B2 (en) 2009-05-07 2011-10-04 Broadcom Corporation Multimode control device for allocating resources to communication devices that use differing protocols and methods for use therewith
US8095162B2 (en) * 2009-05-07 2012-01-10 Broadcom Corporation Control device for allocating resources to communication devices that use differing protocols and methods for use therewith
SG169255A1 (en) 2009-09-02 2011-03-30 Sony Corp An integrated circuit
JP5361934B2 (ja) 2011-04-19 2013-12-04 株式会社東芝 電力増幅器
CN102393863B (zh) * 2011-06-15 2013-06-12 西安电子科技大学 金丝键合线的阻抗匹配方法
US9679869B2 (en) * 2011-09-02 2017-06-13 Skyworks Solutions, Inc. Transmission line for high performance radio frequency applications
KR101921686B1 (ko) 2012-06-14 2018-11-26 스카이워크스 솔루션즈, 인코포레이티드 와이어 본드 패드 및 관련된 시스템, 장치, 및 방법을 포함하는 전력 증폭기 모듈
US10014276B2 (en) 2015-02-25 2018-07-03 The United States Of America, As Represented By The Secretary Of The Navy Compensation of bondwires in the microwave regime
CN113036377B (zh) * 2020-12-21 2021-09-28 安徽大学 一种射频微系统中金丝互连垂直补偿结构及其设计方法

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Publication number Priority date Publication date Assignee Title
JPS55102292A (en) * 1979-01-29 1980-08-05 Nippon Electric Co High frequency high output transistor amplifier
FR2550011B1 (fr) * 1983-07-29 1986-10-10 Thomson Csf Dispositif d'interconnexion entre les cellules d'un circuit integre hyperfrequences pre-implante
JPS61108161A (ja) * 1984-11-01 1986-05-26 Matsushita Electronics Corp マイクロ波集積回路
JPS62120104A (ja) * 1985-11-20 1987-06-01 Matsushita Electric Ind Co Ltd Ｐｌｌ型変調器同期検出回路
JPH03195049A (ja) * 1989-12-25 1991-08-26 Hitachi Ltd 半導体集積回路装置
US5345205A (en) * 1990-04-05 1994-09-06 General Electric Company Compact high density interconnected microwave system
JP2643662B2 (ja) * 1991-07-08 1997-08-20 三菱電機株式会社 高出力電界効果トランジスタ増幅器
KR100197187B1 (ko) * 1995-04-05 1999-06-15 모리 가즈히로 고주파전력 증폭회로장치
US6008533A (en) * 1997-12-08 1999-12-28 Micron Technology, Inc. Controlling impedances of an integrated circuit

Also Published As

Publication number Publication date
EP1041632A1 (de) 2000-10-04
KR20010006917A (ko) 2001-01-26
JP2000294731A (ja) 2000-10-20
KR100627208B1 (ko) 2006-09-22
JP4388198B2 (ja) 2009-12-24
EP1041632B1 (de) 2007-05-09
US6201454B1 (en) 2001-03-13
DE60034731T2 (de) 2008-01-31

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