DE60018412D1 - Steuergerät für messinstrument - Google Patents

Steuergerät für messinstrument

Info

Publication number
DE60018412D1
DE60018412D1 DE60018412T DE60018412T DE60018412D1 DE 60018412 D1 DE60018412 D1 DE 60018412D1 DE 60018412 T DE60018412 T DE 60018412T DE 60018412 T DE60018412 T DE 60018412T DE 60018412 D1 DE60018412 D1 DE 60018412D1
Authority
DE
Germany
Prior art keywords
control unit
measuring instrument
instrument
measuring
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60018412T
Other languages
English (en)
Other versions
DE60018412T2 (de
Inventor
Michael Mills
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taylor Hobson Ltd
Original Assignee
Taylor Hobson Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taylor Hobson Ltd filed Critical Taylor Hobson Ltd
Publication of DE60018412D1 publication Critical patent/DE60018412D1/de
Application granted granted Critical
Publication of DE60018412T2 publication Critical patent/DE60018412T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
DE60018412T 1999-05-28 2000-05-26 Steuergerät für messinstrument Expired - Lifetime DE60018412T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9912601 1999-05-28
GB9912601A GB2350429B (en) 1999-05-28 1999-05-28 A metrological instrument
PCT/GB2000/002022 WO2000073731A1 (en) 1999-05-28 2000-05-26 Movement control by a metrological instrument

Publications (2)

Publication Number Publication Date
DE60018412D1 true DE60018412D1 (de) 2005-04-07
DE60018412T2 DE60018412T2 (de) 2005-12-29

Family

ID=10854451

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60018412T Expired - Lifetime DE60018412T2 (de) 1999-05-28 2000-05-26 Steuergerät für messinstrument

Country Status (6)

Country Link
US (1) US6594532B2 (de)
EP (1) EP1181499B1 (de)
JP (1) JP2003500675A (de)
DE (1) DE60018412T2 (de)
GB (1) GB2350429B (de)
WO (1) WO2000073731A1 (de)

Families Citing this family (25)

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JP3443050B2 (ja) * 1999-10-21 2003-09-02 株式会社ミツトヨ 姿勢調整装置
JP4794753B2 (ja) 2001-06-04 2011-10-19 パナソニック株式会社 形状測定方法
US6990743B2 (en) * 2002-08-29 2006-01-31 Micron Technology, Inc. Process for monitoring measuring device performance
DE10334219B3 (de) * 2003-07-26 2004-12-16 Carl Mahr Holding Gmbh Rauheitsmesseinrichtung mit Prüfnormal
US6948254B2 (en) * 2003-10-27 2005-09-27 Micronic Laser Systems Ab Method for calibration of a metrology stage
US7508971B2 (en) * 2004-05-28 2009-03-24 The Boeing Company Inspection system using coordinate measurement machine and associated method
US20060011002A1 (en) * 2004-07-13 2006-01-19 Rashleger Timothy L Machine tool with dimensional change compensation
GB2422015B (en) * 2005-02-01 2007-02-28 Taylor Hobson Ltd A metrological instrument
JP4568621B2 (ja) * 2005-02-28 2010-10-27 株式会社ミツトヨ 表面性状測定機の真直度補正方法および表面性状測定機
JP4705792B2 (ja) * 2005-03-17 2011-06-22 株式会社ミツトヨ 軸間角度補正方法
JP5155533B2 (ja) 2006-02-16 2013-03-06 株式会社ミツトヨ 補正プログラム、及び測定装置
JP5183884B2 (ja) 2006-05-08 2013-04-17 株式会社ミツトヨ 補正方法、及び測定装置
JP4951270B2 (ja) * 2006-05-08 2012-06-13 株式会社ミツトヨ 測定方法、及び測定装置
JP5337955B2 (ja) * 2009-05-19 2013-11-06 株式会社ミツトヨ 形状測定装置、形状測定方法、及びプログラム
JP5330297B2 (ja) * 2009-05-26 2013-10-30 株式会社ミツトヨ アライメント調整機構、および測定装置
JP5843531B2 (ja) * 2010-09-27 2016-01-13 株式会社ミツトヨ 座標測定用ヘッドユニット及び座標測定機
JP6165461B2 (ja) * 2012-03-13 2017-07-19 東芝機械株式会社 機上測定機能付き加工装置
CN103455045A (zh) * 2012-05-30 2013-12-18 鸿富锦精密工业（深圳）有限公司 接触式运动控制系统及方法
EP2954285B1 (de) 2013-02-05 2022-04-06 Renishaw Plc. Verfahren und vorrichtung zur messung eines teils
DE102013015237A1 (de) * 2013-09-13 2015-03-19 Blum-Novotest Gmbh Rauheits-Messinstrument zum Einsatz in einer Werkzeugmaschine und Verfahren zur Rauheitsmessung in einer Werkzeugmaschine
GB2529131B (en) * 2014-05-06 2019-06-05 Taylor Hobson Ltd Method and apparatus for characterising instrument error
DE102014213955A1 (de) * 2014-07-17 2016-01-21 Dr. Johannes Heidenhain Gmbh Vorrichtung mit einer Abtasteinheit und einer Montagehilfe und Verfahren zur Montage der Abtasteinheit
GB201417771D0 (en) 2014-10-08 2014-11-19 Delcam Ltd Measuring device and related methods
US9952044B2 (en) 2015-02-02 2018-04-24 Rolls-Royce North American Technologies, Inc. Multi-axis calibration block
US11644294B2 (en) 2021-01-29 2023-05-09 Autodesk, Inc. Automatic generation of probe path for surface inspection and part alignment

Family Cites Families (35)

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EP0150947A3 (de) * 1984-01-26 1985-08-21 E.P.R. Bureau Limited Abtastsystem
JPS6179549A (ja) * 1984-09-28 1986-04-23 Takaaki Nagao 曲面加工装置
EP0342770B1 (de) * 1986-03-04 1994-05-18 Rank Taylor Hobson Limited Metrologischer Apparat
DE3637410A1 (de) * 1986-11-03 1988-05-11 Zeiss Carl Fa Verfahren zur messung von drehtischabweichungen
DE3781674T2 (de) * 1987-01-20 1993-04-15 Warner Swasey Co Positionsbestimmungsverfahren innerhalb des messraumes eines koordinatenmessgeraetes und dergleichen und system dafuer.
US4819195A (en) * 1987-01-20 1989-04-04 The Warner & Swasey Company Method for calibrating a coordinate measuring machine and the like and system therefor
US5154002A (en) * 1987-02-26 1992-10-13 Klaus Ulbrich Probe, motion guiding device, position sensing apparatus, and position sensing method
US5152072A (en) * 1988-02-18 1992-10-06 Renishaw Plc Surface-sensing device
US5189806A (en) * 1988-12-19 1993-03-02 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
DE69028158T2 (de) 1989-06-23 1997-02-20 Rank Taylor Hobson Ltd Messtechnische Vorrichtung und Kalibrierverfahren dafür
US5209131A (en) * 1989-11-03 1993-05-11 Rank Taylor Hobson Metrology
US5297055A (en) * 1990-04-20 1994-03-22 The Gleason Works Multi-functional measurement system
US5097602A (en) * 1990-07-09 1992-03-24 Westinghouse Electric Corp. Apparatus and method for automated inspection of a surface contour on a workpiece
JP2892826B2 (ja) * 1990-11-29 1999-05-17 松下電器産業株式会社 三次元測定機の校正方法
JP2748702B2 (ja) * 1991-02-04 1998-05-13 松下電器産業株式会社 三次元測定機の誤差補正方法
GB2256476B (en) 1991-05-30 1995-09-27 Rank Taylor Hobson Ltd Positional measurement
US5419222A (en) * 1992-10-08 1995-05-30 The United States Of America As Represented By The United States Department Of Energy Method for measuring the contour of a machined part
US5724264A (en) * 1993-07-16 1998-03-03 Immersion Human Interface Corp. Method and apparatus for tracking the position and orientation of a stylus and for digitizing a 3-D object
GB2281779B (en) 1993-09-14 1997-04-23 Rank Taylor Hobson Ltd Metrological instrument
US5505003A (en) * 1993-10-08 1996-04-09 M&M Precision Systems Corporation Generative measuring system
US5461797A (en) * 1994-04-19 1995-10-31 M&M Precision Systems Corporation Object measuring system
US5671541A (en) * 1995-09-01 1997-09-30 Brown & Sharpe Manufacturing Company Accuracy verification devices for coordinate measuring machines
US6076953A (en) * 1995-10-10 2000-06-20 The Esab Group, Inc. Digitizing probe
WO1997018533A1 (en) * 1995-11-15 1997-05-22 British United Shoe Machinery Co. Ltd. Computer aided design system
GB9612383D0 (en) * 1995-12-07 1996-08-14 Rank Taylor Hobson Ltd Surface form measurement
US6044170A (en) * 1996-03-21 2000-03-28 Real-Time Geometry Corporation System and method for rapid shape digitizing and adaptive mesh generation
US5887356A (en) * 1996-09-03 1999-03-30 Sheldon/Van Someren, Inc. Multi-axis continuous probe
US5743020A (en) * 1996-09-27 1998-04-28 Sheldon; Paul C. Three-axis continuous probe
US5801381A (en) * 1997-05-21 1998-09-01 International Business Machines Corporation Method for protecting a probe tip using active lateral scanning control
US6152662A (en) * 1997-07-31 2000-11-28 Machine Magic, Llc Key duplication apparatus and method
JPH1183450A (ja) * 1997-09-08 1999-03-26 Ricoh Co Ltd 光触針式形状測定機の誤差補正方法
US6161050A (en) * 1998-03-26 2000-12-12 Eastman Chemical Company Surface determination and automatic milling in spinnerette manufacturing
JPH11281306A (ja) * 1998-03-27 1999-10-15 Nikon Corp 座標測定機の校正値検出方法及びこの校正値を用いた形状データ校正方法
JPH11281348A (ja) * 1998-03-31 1999-10-15 Matsushita Electric Works Ltd 平坦度測定装置の精度補正方法
JP3474448B2 (ja) * 1998-09-01 2003-12-08 株式会社リコー 座標軸直角度誤差の校正方法及び三次元形状測定装置

Also Published As

Publication number Publication date
EP1181499B1 (de) 2005-03-02
WO2000073731A1 (en) 2000-12-07
EP1181499A1 (de) 2002-02-27
GB9912601D0 (en) 1999-07-28
GB2350429A (en) 2000-11-29
US6594532B2 (en) 2003-07-15
US20020059041A1 (en) 2002-05-16
GB2350429B (en) 2003-11-12
JP2003500675A (ja) 2003-01-07
DE60018412T2 (de) 2005-12-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition