DE10084566T1 - Metrologisches Instrument - Google Patents

Metrologisches Instrument

Info

Publication number
DE10084566T1
DE10084566T1 DE10084566T DE10084566T DE10084566T1 DE 10084566 T1 DE10084566 T1 DE 10084566T1 DE 10084566 T DE10084566 T DE 10084566T DE 10084566 T DE10084566 T DE 10084566T DE 10084566 T1 DE10084566 T1 DE 10084566T1
Authority
DE
Germany
Prior art keywords
metrological instrument
metrological
instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE10084566T
Other languages
English (en)
Other versions
DE10084566B4 (de
Inventor
James Donaldson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taylor Hobson Ltd
Original Assignee
Taylor Hobson Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taylor Hobson Ltd filed Critical Taylor Hobson Ltd
Publication of DE10084566T1 publication Critical patent/DE10084566T1/de
Application granted granted Critical
Publication of DE10084566B4 publication Critical patent/DE10084566B4/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Dental Tools And Instruments Or Auxiliary Dental Instruments (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
DE10084566.5T 1999-05-14 2000-05-12 Metrologisches Instrument Expired - Lifetime DE10084566B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9911303A GB2349949B (en) 1999-05-14 1999-05-14 Metrological instrument
GB9911303.7 1999-05-14
PCT/GB2000/001828 WO2000070301A2 (en) 1999-05-14 2000-05-12 Metrological instrument

Publications (2)

Publication Number Publication Date
DE10084566T1 true DE10084566T1 (de) 2002-04-25
DE10084566B4 DE10084566B4 (de) 2019-08-08

Family

ID=10853517

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10084566.5T Expired - Lifetime DE10084566B4 (de) 1999-05-14 2000-05-12 Metrologisches Instrument

Country Status (6)

Country Link
US (1) US6629373B1 (de)
JP (1) JP2003508728A (de)
AU (1) AU5082200A (de)
DE (1) DE10084566B4 (de)
GB (1) GB2349949B (de)
WO (1) WO2000070301A2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4689890B2 (ja) * 2001-02-08 2011-05-25 株式会社ミツトヨ 表面性状測定装置
JP2003028675A (ja) * 2001-07-13 2003-01-29 Mitsutoyo Corp 測定補助装置および測定装置
JP4597583B2 (ja) * 2004-05-31 2010-12-15 シャープ株式会社 データ送信装置、データ受信装置、通信システム、データ送信装置の制御プログラム、データ受信装置の制御プログラム、および、コンピュータ読み取り可能な記録媒体
WO2006013979A1 (ja) 2004-08-06 2006-02-09 Sharp Kabushiki Kaisha 送信機、受信機、通信システム、通信方法、通信プログラム
KR100902341B1 (ko) 2005-01-28 2009-06-12 샤프 가부시키가이샤 통신기기, 통신시스템, 통신방법, 통신 프로그램을 기록한 컴퓨터독취가능한 기록매체, 통신회로
US7787391B2 (en) 2005-01-28 2010-08-31 Sharp Kabushiki Kaisha Communication device, communication system, communication method, communication program, and communication circuit
US8291273B2 (en) * 2005-01-28 2012-10-16 Sharp Kabushiki Kaisha Communication device, non-transitory computer-readable medium storing a communication program
US8051182B2 (en) * 2005-01-28 2011-11-01 Sharp Kabushiki Kaisha Communication device, communication system, communication method, communication program, and communication circuit
US20090262661A1 (en) * 2005-11-10 2009-10-22 Sharp Kabushiki Kaisha Data transmission device and method of controlling same, data receiving device and method of controlling same, data transfer system, data transmission device control program, data receiving device control program, and storage medium containing the programs
JP4219950B2 (ja) * 2006-10-16 2009-02-04 シャープ株式会社 通信機器、通信方法、通信回路、携帯電話機、プログラム、およびプログラムを記録したコンピュータ読み取り可能な記録媒体

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4328623A (en) 1980-08-28 1982-05-11 The Valeron Corporation Telemetry gage system
DE8600738U1 (de) 1986-01-14 1986-02-20 Aktieselskabet Brüel & Kjaer, Naerum Rauheitsprüfer
EP0342770B1 (de) * 1986-03-04 1994-05-18 Rank Taylor Hobson Limited Metrologischer Apparat
GB8618152D0 (en) * 1986-07-25 1986-09-03 Renishaw Plc Co-ordinate measuring
DD262079A1 (de) 1987-07-10 1988-11-16 Karl Marx Stadt Tech Hochschul Einrichtung zur ueberwachung der rauheit, insbesondere an werkzeugmaschinen mit revolverkopf
GB8729632D0 (en) * 1987-12-18 1988-02-03 Renishaw Plc Workpiece inspection
GB8808613D0 (en) * 1988-04-12 1988-05-11 Renishaw Plc Signal transmission system for machine tools inspection machines &c
US5150529A (en) * 1988-04-12 1992-09-29 Renishaw Plc Signal transmission system for machine tools, inspection machines, and the like
DE9013971U1 (de) 1990-10-08 1990-12-13 Hommelwerke Gmbh, 7730 Villingen-Schwenningen, De
ITBO940167A1 (it) * 1994-04-19 1995-10-19 Marposs Spa Sistema per il rilevamento di dimensioni lineari e metodo di verifica del relativo funzionamento
DE19547977A1 (de) * 1995-12-21 1997-06-26 Zeiss Carl Fa Tastsystem für Koordinatenmeßgeräte
US5777562A (en) * 1996-08-19 1998-07-07 Hoffman; David J. Centering device and method for centering
DE19642293C2 (de) * 1996-10-14 1998-07-16 Zeiss Carl Jena Gmbh Koordinatenmeßgerät
KR19980035051A (ko) * 1996-11-11 1998-08-05 구자홍 영상표시기기의 실내온도 및 체온 표시장치와 방법
FR2762110A1 (fr) * 1997-04-14 1998-10-16 Renishaw Plc Systeme formant capteur programmable
US6442857B1 (en) * 2000-11-10 2002-09-03 Toto Ltd. Portable surface inspector

Also Published As

Publication number Publication date
DE10084566B4 (de) 2019-08-08
GB9911303D0 (en) 1999-07-14
AU5082200A (en) 2000-12-05
WO2000070301A2 (en) 2000-11-23
WO2000070301A3 (en) 2001-02-08
JP2003508728A (ja) 2003-03-04
US6629373B1 (en) 2003-10-07
GB2349949B (en) 2003-03-05
GB2349949A (en) 2000-11-15

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8128 New person/name/address of the agent

Representative=s name: GRAF VON STOSCH PATENTANWALTSGESELLSCHAFT MBH, 805

R016 Response to examination communication
R016 Response to examination communication
R018 Grant decision by examination section/examining division
R020 Patent grant now final
R071 Expiry of right