DE60015472D1 - Telekommunikationsmasken-Testfähigkeit aufweisendes Test- und Messinstrument mit automatischer Anpassung an die Maske - Google Patents

Telekommunikationsmasken-Testfähigkeit aufweisendes Test- und Messinstrument mit automatischer Anpassung an die Maske

Info

Publication number
DE60015472D1
DE60015472D1 DE60015472T DE60015472T DE60015472D1 DE 60015472 D1 DE60015472 D1 DE 60015472D1 DE 60015472 T DE60015472 T DE 60015472T DE 60015472 T DE60015472 T DE 60015472T DE 60015472 D1 DE60015472 D1 DE 60015472D1
Authority
DE
Germany
Prior art keywords
mask
test
telecommunication
measurement instrument
automatic adaptation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60015472T
Other languages
English (en)
Other versions
DE60015472T2 (de
Inventor
Peter J Letts
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Application granted granted Critical
Publication of DE60015472D1 publication Critical patent/DE60015472D1/de
Publication of DE60015472T2 publication Critical patent/DE60015472T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/30—Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/005—Interface circuits for subscriber lines
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/305—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Controls And Circuits For Display Device (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
DE60015472T 1999-09-24 2000-09-22 Telekommunikationsmasken-Testfähigkeit aufweisendes Test- und Messinstrument mit automatischer Anpassung an die Maske Expired - Lifetime DE60015472T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US15597799P 1999-09-24 1999-09-24
US155977 1999-09-24
US09/602,575 US6728648B1 (en) 1999-09-24 2000-06-22 Test and measurement instrument having telecommunications mask testing capability with an autofit to mask feature
US602575 2000-06-22

Publications (2)

Publication Number Publication Date
DE60015472D1 true DE60015472D1 (de) 2004-12-09
DE60015472T2 DE60015472T2 (de) 2005-10-27

Family

ID=26852763

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60015472T Expired - Lifetime DE60015472T2 (de) 1999-09-24 2000-09-22 Telekommunikationsmasken-Testfähigkeit aufweisendes Test- und Messinstrument mit automatischer Anpassung an die Maske

Country Status (6)

Country Link
US (1) US6728648B1 (de)
EP (1) EP1089079B1 (de)
JP (1) JP3670944B2 (de)
KR (1) KR100734961B1 (de)
CN (1) CN1184754C (de)
DE (1) DE60015472T2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6642926B1 (en) * 1999-09-24 2003-11-04 Tektronix, Inc. Test and measurement instrument having telecommunications mask testing capability with a mask zoom feature
US6895349B2 (en) * 2000-11-09 2005-05-17 Tektronix, Inc. Gate comparator
US7158137B2 (en) * 2002-06-06 2007-01-02 Tektronix, Inc. Architecture for improved display performance in a signal acquisition and display device
US6928374B2 (en) * 2002-11-22 2005-08-09 Tektronix, Inc. Methods for displaying jitter and other anomalies in long acquisition data records
DE102006041824A1 (de) * 2006-09-06 2008-03-27 Rohde & Schwarz Gmbh & Co. Kg Vorrichtung und Verfahren für Analyse von Signalverläufen unter Verwendung von Masken
AU2008224428A1 (en) * 2007-03-12 2008-09-18 Elta Systems Ltd. Method and system for detecting motorized objects
JP4740919B2 (ja) * 2007-10-15 2011-08-03 アンリツ株式会社 信号解析装置
US8199149B2 (en) 2007-12-13 2012-06-12 Tektronix, Inc. Automatic generation of frequency domain mask
DE102009051370A1 (de) 2009-06-04 2010-12-09 Rohde & Schwarz Gmbh & Co Kg Messkoppler in Bandleitertechnik
DE102010020910B4 (de) 2009-12-17 2019-02-28 Rohde & Schwarz Gmbh & Co. Kg Verfahren und Vorrichtungen zur Ermittlung einer Frequenzmaske für ein Frequenzspektrum
CN103869117B (zh) * 2012-12-13 2018-01-16 北京普源精电科技有限公司 一种波形检测方法及示波器
US10024884B2 (en) 2014-05-22 2018-07-17 Tektronix, Inc. Dynamic mask testing
USD947693S1 (en) 2019-09-20 2022-04-05 Tektronix, Inc. Measurement probe head assembly

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4497062A (en) * 1983-06-06 1985-01-29 Wisconsin Alumni Research Foundation Digitally controlled X-ray beam attenuation method and apparatus
US4816814A (en) * 1987-02-12 1989-03-28 International Business Machines Corporation Vector generator with direction independent drawing speed for all-point-addressable raster displays
US5146592A (en) * 1987-09-14 1992-09-08 Visual Information Technologies, Inc. High speed image processing computer with overlapping windows-div
US5440676A (en) * 1988-01-29 1995-08-08 Tektronix, Inc. Raster scan waveform display rasterizer with pixel intensity gradation
US5012467A (en) * 1989-10-10 1991-04-30 3Com Corporation Method and apparatus for collision detection in a local area network transceiver
JPH0414336A (ja) * 1990-05-08 1992-01-20 Ando Electric Co Ltd Ｉｓｄｎのバイオレーション制御回路
JP2957665B2 (ja) * 1990-09-07 1999-10-06 富士通株式会社 Ｈｄｂ３，ａｍｉ符号則違反検出装置
US5283596A (en) * 1991-02-05 1994-02-01 Hewlett-Packard Company Digitally synthesized gray scale for raster scan oscilloscope color display of overlapping multichannel waveforms
US5313577A (en) * 1991-08-21 1994-05-17 Digital Equipment Corporation Translation of virtual addresses in a computer graphics system
US5315696A (en) * 1991-08-21 1994-05-24 Digital Equipment Corporation Graphics command processing method in a computer graphics system
US5315698A (en) * 1991-08-21 1994-05-24 Digital Equipment Corporation Method and apparatus for varying command length in a computer graphics system
US5337403A (en) * 1991-09-18 1994-08-09 Klingman Edwin E Digital signal processing method and apparatus including a graphic template display
GB2271699B (en) * 1992-10-13 1997-02-05 Gould Inc Display resolution enhancement
US5488698A (en) * 1992-11-05 1996-01-30 Oliver; David C. Rasterization of line segments using difference vectors
JPH06231275A (ja) * 1993-01-29 1994-08-19 Hitachi Ltd 画像シミュレーション方法
US5530454A (en) * 1994-04-13 1996-06-25 Tektronix, Inc. Digital oscilloscope architecture for signal monitoring with enhanced duty cycle
JP3337873B2 (ja) * 1995-06-28 2002-10-28 沖電気工業株式会社 衝突防止装置
JP3237473B2 (ja) * 1995-06-29 2001-12-10 安藤電気株式会社 マスク制御装置
US5929842A (en) * 1996-07-31 1999-07-27 Fluke Corporation Method and apparatus for improving time variant image details on a raster display
US5978742A (en) * 1997-04-04 1999-11-02 Tektronix, Inc. Method and apparatus for digital sampling of electrical waveforms
US6097755A (en) * 1997-10-20 2000-08-01 Tektronix, Inc. Time domain reflectometer having optimal interrogating pulses
US6219029B1 (en) * 1998-04-03 2001-04-17 Tektronix, Inc. Emphasizing infrequent events in a digital oscilloscope having variable intensity rasterizer and variable intensity or color display
US6222521B1 (en) * 1998-04-03 2001-04-24 Tektronix, Inc. High waveform throughput digital oscilloscope with variable intensity rasterizer and variable intensity or color display

Also Published As

Publication number Publication date
KR100734961B1 (ko) 2007-07-03
JP2001099869A (ja) 2001-04-13
DE60015472T2 (de) 2005-10-27
EP1089079A3 (de) 2003-07-02
US6728648B1 (en) 2004-04-27
JP3670944B2 (ja) 2005-07-13
KR20010050593A (ko) 2001-06-15
CN1290077A (zh) 2001-04-04
EP1089079A2 (de) 2001-04-04
EP1089079B1 (de) 2004-11-03
CN1184754C (zh) 2005-01-12

Similar Documents

Publication Publication Date Title
DE60134812D1 (de) Verteiltes Echtzeit-Test- und Messinstrument
DE59901650D1 (de) Integrierte schaltung mit einer selbsttesteinrichtung zur durchführung eines selbsttests der integrierten schaltung
DE69933553D1 (de) Elektronischer batterietester
DE69814840D1 (de) Windturbine mit vorrichtung zur messung der windgeschwindigkeit
DE59913407D1 (de) Messeinrichtung
DE69706653T2 (de) Elektronisches entfernungsmessgerät
DK1071946T3 (da) Elektrokemisk måling
DE60040197D1 (de) Test- und Messinstrument mit mehrkanaliger Telekommunikationsmaskentestfähigkeit
DE60015472D1 (de) Telekommunikationsmasken-Testfähigkeit aufweisendes Test- und Messinstrument mit automatischer Anpassung an die Maske
DE69807908D1 (de) Messvorrichtung für farmkerndurchliegung
DE69926341D1 (de) Magnetoelektrischer Vorrichtung
KR960015836A (ko) 집적회로 시험장치
DE59712893D1 (de) Messeinrichtung
DE59807182D1 (de) Messvorrichtung an einer fahrbaren Erntemaschine
DE60040129D1 (de) Test- und Messinstrument mit Telekommunikationsmaskentestfähigkeit und Zoom-Anordnung
DE59914895D1 (de) Messverfahren und -vorrichtung
DE69623683D1 (de) Delta-T-Messschaltung
DE69933964D1 (de) Instrument mit sichtbaren Zubehörmodulen
DE69521805T2 (de) Messinstrument mit digitaler rückstelleinrichtung
DE69941322D1 (de) Verbindungstestverfahren
ID28840A (id) Pengujian
DE69115856D1 (de) Gegossenes Gehäuse für eine integrierte Schaltung mit einer Vorrichtung zur Reduzierung der dynamischen Impedanz
DE69517758D1 (de) Prüfung einer integrierten Schaltungsanordnung
DE69832980D1 (de) Mess-Schaltkreis
DE69730501D1 (de) Messvorrichtung

Legal Events

Date Code Title Description
8364 No opposition during term of opposition