DE60003994D1 - Verfahren zur Herstellung von Sputter-Targets aus hoch reinem Kobalt, die einer niedrigen magnetischen Permeabilität aufweisen - Google Patents

Verfahren zur Herstellung von Sputter-Targets aus hoch reinem Kobalt, die einer niedrigen magnetischen Permeabilität aufweisen

Info

Publication number
DE60003994D1
DE60003994D1 DE60003994T DE60003994T DE60003994D1 DE 60003994 D1 DE60003994 D1 DE 60003994D1 DE 60003994 T DE60003994 T DE 60003994T DE 60003994 T DE60003994 T DE 60003994T DE 60003994 D1 DE60003994 D1 DE 60003994D1
Authority
DE
Germany
Prior art keywords
production
magnetic permeability
low magnetic
sputtering targets
purity cobalt
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60003994T
Other languages
English (en)
Other versions
DE60003994T2 (de
Inventor
Alfred Snowman
Holger Koenigsmann
Andre Desert
Thomas J Hunt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Praxair ST Technology Inc
Praxair Technology Inc
Original Assignee
Praxair ST Technology Inc
Praxair Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Praxair ST Technology Inc, Praxair Technology Inc filed Critical Praxair ST Technology Inc
Publication of DE60003994D1 publication Critical patent/DE60003994D1/de
Application granted granted Critical
Publication of DE60003994T2 publication Critical patent/DE60003994T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
    • C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
    • C22F1/10—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of nickel or cobalt or alloys based thereon
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
    • H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
    • H01F41/18—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates by cathode sputtering
    • H01F41/183—Sputtering targets therefor
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/158—Sputtering

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Power Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Thermal Sciences (AREA)
  • Physical Vapour Deposition (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
DE60003994T 1999-11-01 2000-10-30 Verfahren zur Herstellung von Sputter-Targets aus hoch reinem Kobalt, die einer niedrigen magnetischen Permeabilität aufweisen Expired - Lifetime DE60003994T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US430988 1999-11-01
US09/430,988 US6176944B1 (en) 1999-11-01 1999-11-01 Method of making low magnetic permeability cobalt sputter targets

Publications (2)

Publication Number Publication Date
DE60003994D1 true DE60003994D1 (de) 2003-08-28
DE60003994T2 DE60003994T2 (de) 2004-05-19

Family

ID=23709954

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60003994T Expired - Lifetime DE60003994T2 (de) 1999-11-01 2000-10-30 Verfahren zur Herstellung von Sputter-Targets aus hoch reinem Kobalt, die einer niedrigen magnetischen Permeabilität aufweisen

Country Status (6)

Country Link
US (1) US6176944B1 (de)
EP (1) EP1096027B1 (de)
JP (1) JP4538146B2 (de)
KR (1) KR100499173B1 (de)
DE (1) DE60003994T2 (de)
TW (1) TW584669B (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6391172B2 (en) 1997-08-26 2002-05-21 The Alta Group, Inc. High purity cobalt sputter target and process of manufacturing the same
US6521108B1 (en) * 1998-12-29 2003-02-18 Tosoh Smd, Inc. Diffusion bonded sputter target assembly and method of making same
US6514358B1 (en) 2000-04-05 2003-02-04 Heraeus, Inc. Stretching of magnetic materials to increase pass-through-flux (PTF)
EP1305455A2 (de) * 2000-06-30 2003-05-02 Honeywell International, Inc. Verfahren und vorrichtung zur behandlung von metallen und so hergestellte metalle
US20030227068A1 (en) * 2001-05-31 2003-12-11 Jianxing Li Sputtering target
US6833058B1 (en) * 2000-10-24 2004-12-21 Honeywell International Inc. Titanium-based and zirconium-based mixed materials and sputtering targets
US6652668B1 (en) * 2002-05-31 2003-11-25 Praxair S.T. Technology, Inc. High-purity ferromagnetic sputter targets and method of manufacture
US20030228238A1 (en) * 2002-06-07 2003-12-11 Wenjun Zhang High-PTF sputtering targets and method of manufacturing
AU2003277063A1 (en) * 2002-10-08 2004-05-04 Honeywell International Inc. Homogenous solid solution alloys for sputter-deposited thin films
US20040123920A1 (en) * 2002-10-08 2004-07-01 Thomas Michael E. Homogenous solid solution alloys for sputter-deposited thin films
US20050149169A1 (en) * 2003-04-08 2005-07-07 Xingwu Wang Implantable medical device
US20060102871A1 (en) * 2003-04-08 2006-05-18 Xingwu Wang Novel composition
US20050149002A1 (en) * 2003-04-08 2005-07-07 Xingwu Wang Markers for visualizing interventional medical devices
US20050119725A1 (en) * 2003-04-08 2005-06-02 Xingwu Wang Energetically controlled delivery of biologically active material from an implanted medical device
US20050183797A1 (en) * 2004-02-23 2005-08-25 Ranjan Ray Fine grained sputtering targets of cobalt and nickel base alloys made via casting in metal molds followed by hot forging and annealing and methods of making same
US20060118758A1 (en) * 2004-09-15 2006-06-08 Xingwu Wang Material to enable magnetic resonance imaging of implantable medical devices
DE102005050424B4 (de) * 2005-10-19 2009-10-22 W.C. Heraeus Gmbh Sputtertarget aus mehrkomponentigen Legierungen
JP5204460B2 (ja) * 2007-10-24 2013-06-05 三井金属鉱業株式会社 磁気記録膜用スパッタリングターゲットおよびその製造方法
DE102009015638A1 (de) * 2009-03-24 2010-09-30 Wieland Dental + Technik Gmbh & Co. Kg Rohrförmiges Sputtertarget und Verfahren zu seiner Herstellung
KR101991150B1 (ko) 2013-03-27 2019-06-19 제이엑스금속주식회사 코발트 스퍼터링 타깃 및 그 제조 방법
CN104694894B (zh) * 2013-12-05 2017-07-04 有研亿金新材料股份有限公司 一种高透磁钴靶及其制备方法
US11830711B2 (en) * 2014-09-29 2023-11-28 Jx Metals Corporation Cobalt sputtering target
WO2017154888A1 (ja) 2016-03-09 2017-09-14 Ｊｘ金属株式会社 イグニッションを安定化することが可能なスパッタリングターゲット
US11421315B2 (en) 2018-07-27 2022-08-23 Ulvac, Inc. Sputtering target and method of producing sputtering target
CN111155060A (zh) * 2018-11-07 2020-05-15 宁波江丰电子材料股份有限公司 钴靶坯的制作方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4202932A (en) * 1978-07-21 1980-05-13 Xerox Corporation Magnetic recording medium
JPS6314864A (ja) 1986-07-08 1988-01-22 Ulvac Corp Ｃｏ基合金スパツタタ−ゲツトおよびその製造法
DE3819906C1 (de) 1988-06-11 1989-08-03 Degussa Ag, 6000 Frankfurt, De
JPH03115562A (ja) * 1989-09-27 1991-05-16 Nippon Mining Co Ltd スパッタリングターゲット材の製造方法
JPH03115564A (ja) * 1989-09-27 1991-05-16 Nippon Mining Co Ltd スパッタリングターゲット材の製造方法
US5282946A (en) 1991-08-30 1994-02-01 Mitsubishi Materials Corporation Platinum-cobalt alloy sputtering target and method for manufacturing same
JPH06104120A (ja) 1992-08-03 1994-04-15 Hitachi Metals Ltd 磁気記録媒体用スパッタリングターゲットおよびその製造方法
JP2806228B2 (ja) 1993-10-25 1998-09-30 株式会社神戸製鋼所 難加工性Ｃｏ合金の低透磁率化方法
EP0659901B1 (de) * 1993-12-20 1998-04-15 LEYBOLD MATERIALS GmbH Target für Magnetron-Kathodenzerstäubungsanlage aus einer Kobalt-Basislegierung
DE19609439A1 (de) * 1995-03-14 1996-09-19 Japan Energy Corp Verfahren zum Erzeugen von hochreinem Kobalt und Sputtering-Targets aus hochreinem Kobalt
JPH09272970A (ja) * 1996-04-05 1997-10-21 Japan Energy Corp 高純度コバルトスパッタリングターゲット及びその製造方法
US6391172B2 (en) * 1997-08-26 2002-05-21 The Alta Group, Inc. High purity cobalt sputter target and process of manufacturing the same
JP3115562B2 (ja) 1999-04-21 2000-12-11 株式会社オリエンタルランド 金箔を用いた装飾用シ−ル及びその製造方法
JP3115564B2 (ja) 1999-05-25 2000-12-11 博司 斎藤 吊具装置

Also Published As

Publication number Publication date
JP4538146B2 (ja) 2010-09-08
EP1096027B1 (de) 2003-07-23
KR100499173B1 (ko) 2005-07-04
TW584669B (en) 2004-04-21
JP2001200356A (ja) 2001-07-24
KR20010051338A (ko) 2001-06-25
EP1096027A1 (de) 2001-05-02
DE60003994T2 (de) 2004-05-19
US6176944B1 (en) 2001-01-23

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