DE59813144D1 - Teilchenmanipulierung - Google Patents
TeilchenmanipulierungInfo
- Publication number
- DE59813144D1 DE59813144D1 DE59813144T DE59813144T DE59813144D1 DE 59813144 D1 DE59813144 D1 DE 59813144D1 DE 59813144 T DE59813144 T DE 59813144T DE 59813144 T DE59813144 T DE 59813144T DE 59813144 D1 DE59813144 D1 DE 59813144D1
- Authority
- DE
- Germany
- Prior art keywords
- particle manipulation
- manipulation
- particle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H3/00—Production or acceleration of neutral particle beams, e.g. molecular or atomic beams
- H05H3/04—Acceleration by electromagnetic wave pressure
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/773—Nanoparticle, i.e. structure having three dimensions of 100 nm or less
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Plasma Technology (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE59813144T DE59813144D1 (de) | 1997-04-02 | 1998-04-02 | Teilchenmanipulierung |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19713637A DE19713637C2 (de) | 1997-04-02 | 1997-04-02 | Teilchenmanipulierung |
DE59813144T DE59813144D1 (de) | 1997-04-02 | 1998-04-02 | Teilchenmanipulierung |
PCT/EP1998/001938 WO1998044766A2 (de) | 1997-04-02 | 1998-04-02 | Teilchenmanipulierung |
Publications (1)
Publication Number | Publication Date |
---|---|
DE59813144D1 true DE59813144D1 (de) | 2005-12-01 |
Family
ID=7825258
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19713637A Expired - Fee Related DE19713637C2 (de) | 1997-04-02 | 1997-04-02 | Teilchenmanipulierung |
DE59813144T Expired - Fee Related DE59813144D1 (de) | 1997-04-02 | 1998-04-02 | Teilchenmanipulierung |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19713637A Expired - Fee Related DE19713637C2 (de) | 1997-04-02 | 1997-04-02 | Teilchenmanipulierung |
Country Status (5)
Country | Link |
---|---|
US (1) | US6517912B1 (de) |
EP (1) | EP0972431B1 (de) |
JP (1) | JP2001518230A (de) |
DE (2) | DE19713637C2 (de) |
WO (1) | WO1998044766A2 (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19814871A1 (de) * | 1998-04-02 | 1999-10-07 | Max Planck Gesellschaft | Verfahren und Vorrichtung zur gezielten Teilchenmanipulierung und -deposition |
DE19926494C2 (de) * | 1999-06-10 | 2001-07-26 | Max Planck Gesellschaft | Verfahren und Vorrichtung zur Abbildung von mikroskopisch kleinen Teilchen |
JP2006318702A (ja) * | 2005-05-11 | 2006-11-24 | Mitsubishi Electric Corp | 電子放出源の製造方法 |
US9246298B2 (en) * | 2012-06-07 | 2016-01-26 | Cymer, Llc | Corrosion resistant electrodes for laser chambers |
US9478408B2 (en) | 2014-06-06 | 2016-10-25 | Lam Research Corporation | Systems and methods for removing particles from a substrate processing chamber using RF plasma cycling and purging |
US10047438B2 (en) | 2014-06-10 | 2018-08-14 | Lam Research Corporation | Defect control and stability of DC bias in RF plasma-based substrate processing systems using molecular reactive purge gas |
US10081869B2 (en) | 2014-06-10 | 2018-09-25 | Lam Research Corporation | Defect control in RF plasma substrate processing systems using DC bias voltage during movement of substrates |
PL3648550T3 (pl) | 2017-06-27 | 2021-11-22 | Canon Anelva Corporation | Urządzenie do przetwarzania plazmowego |
CN114666965A (zh) | 2017-06-27 | 2022-06-24 | 佳能安内华股份有限公司 | 等离子体处理装置 |
WO2019004189A1 (ja) * | 2017-06-27 | 2019-01-03 | キヤノンアネルバ株式会社 | プラズマ処理装置 |
PL3648554T3 (pl) | 2017-06-27 | 2021-11-22 | Canon Anelva Corporation | Urządzenie do przetwarzania plazmowego |
EP3648552B1 (de) | 2017-06-27 | 2022-04-13 | Canon Anelva Corporation | Plasmabehandlungsvorrichtung |
WO2020003557A1 (ja) | 2018-06-26 | 2020-01-02 | キヤノンアネルバ株式会社 | プラズマ処理装置、プラズマ処理方法、プログラムおよびメモリ媒体 |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5108543A (en) | 1984-11-07 | 1992-04-28 | Hitachi, Ltd. | Method of surface treatment |
JPS61158877A (ja) | 1984-12-27 | 1986-07-18 | 小宮山 宏 | セラミツクス多孔質膜の製造方法 |
DE3729347A1 (de) | 1986-09-05 | 1988-03-17 | Mitsubishi Electric Corp | Plasmaprozessor |
US4740267A (en) | 1987-02-20 | 1988-04-26 | Hughes Aircraft Company | Energy intensive surface reactions using a cluster beam |
JP2906057B2 (ja) * | 1987-08-13 | 1999-06-14 | セイコーエプソン株式会社 | 液晶表示装置 |
JP2549433B2 (ja) | 1989-03-13 | 1996-10-30 | 株式会社日立製作所 | 電気光学変調素子の駆動方法およびプリンタ |
DE4018954A1 (de) | 1989-06-15 | 1991-01-03 | Mitsubishi Electric Corp | Trockenaetzgeraet |
US5102496A (en) * | 1989-09-26 | 1992-04-07 | Applied Materials, Inc. | Particulate contamination prevention using low power plasma |
DE4118072C2 (de) | 1991-06-01 | 1997-08-07 | Linde Ag | Verfahren zur Stoßwellenbeschichtung von Substraten |
JP3137682B2 (ja) * | 1991-08-12 | 2001-02-26 | 株式会社日立製作所 | 半導体装置の製造方法 |
US5332441A (en) * | 1991-10-31 | 1994-07-26 | International Business Machines Corporation | Apparatus for gettering of particles during plasma processing |
CH687987A5 (de) * | 1993-05-03 | 1997-04-15 | Balzers Hochvakuum | Verfahren zur Erhoehung der Beschichtungsrate in einem Plasmaentladungsraum und Plasmakammer. |
DE69420774T2 (de) * | 1993-05-13 | 2000-01-13 | Applied Materials Inc | Kontrolle der Kontamination in einem Plasma durch Ausgestaltung des Plasmaschildes unter Verwendung von Materialien mit verschiedenen RF-Impedanzen |
DE4316349C2 (de) * | 1993-05-15 | 1996-09-05 | Ver Foerderung Inst Kunststoff | Verfahren zur Innenbeschichtung von Hohlkörpern mit organischen Deckschichten durch Plasmapolymerisation, sowie Vorrichtung zur Durchführung des Verfahrens |
US5456796A (en) * | 1993-06-02 | 1995-10-10 | Applied Materials, Inc. | Control of particle generation within a reaction chamber |
KR100333237B1 (ko) * | 1993-10-29 | 2002-09-12 | 어플라이드 머티어리얼스, 인코포레이티드 | 플라즈마에칭챔버내에서오염물질을감소시키는장치및방법 |
US5518547A (en) * | 1993-12-23 | 1996-05-21 | International Business Machines Corporation | Method and apparatus for reducing particulates in a plasma tool through steady state flows |
JPH07226395A (ja) | 1994-02-15 | 1995-08-22 | Matsushita Electric Ind Co Ltd | 真空プラズマ処理装置 |
US5573597A (en) * | 1995-06-07 | 1996-11-12 | Sony Corporation | Plasma processing system with reduced particle contamination |
US5637190A (en) * | 1995-09-15 | 1997-06-10 | Vanguard International Semiconductor Corporation | Plasma purge method for plasma process particle control |
DE19538045C1 (de) * | 1995-10-13 | 1997-01-30 | Forschungszentrum Juelich Gmbh | Vorrichtung zur Beschichtung von Substraten |
US5746928A (en) * | 1996-06-03 | 1998-05-05 | Taiwan Semiconductor Manufacturing Company Ltd | Process for cleaning an electrostatic chuck of a plasma etching apparatus |
US5854138A (en) * | 1997-07-29 | 1998-12-29 | Cypress Semiconductor Corp. | Reduced-particle method of processing a semiconductor and/or integrated circuit |
-
1997
- 1997-04-02 DE DE19713637A patent/DE19713637C2/de not_active Expired - Fee Related
-
1998
- 1998-04-02 DE DE59813144T patent/DE59813144D1/de not_active Expired - Fee Related
- 1998-04-02 EP EP98919213A patent/EP0972431B1/de not_active Expired - Lifetime
- 1998-04-02 US US09/402,295 patent/US6517912B1/en not_active Expired - Fee Related
- 1998-04-02 WO PCT/EP1998/001938 patent/WO1998044766A2/de active IP Right Grant
- 1998-04-02 JP JP54117798A patent/JP2001518230A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0972431B1 (de) | 2005-10-26 |
EP0972431A2 (de) | 2000-01-19 |
JP2001518230A (ja) | 2001-10-09 |
WO1998044766A2 (de) | 1998-10-08 |
DE19713637C2 (de) | 1999-02-18 |
WO1998044766A3 (de) | 1999-01-07 |
DE19713637A1 (de) | 1998-10-22 |
US6517912B1 (en) | 2003-02-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |