DE4022733C1 - Three=dimensional cavity inspection appts. - uses matrix or line camera to receive reflected light via gp. of four mirrors and deflecting mirror - Google Patents

Three=dimensional cavity inspection appts. - uses matrix or line camera to receive reflected light via gp. of four mirrors and deflecting mirror

Info

Publication number
DE4022733C1
DE4022733C1 DE4022733A DE4022733A DE4022733C1 DE 4022733 C1 DE4022733 C1 DE 4022733C1 DE 4022733 A DE4022733 A DE 4022733A DE 4022733 A DE4022733 A DE 4022733A DE 4022733 C1 DE4022733 C1 DE 4022733C1
Authority
DE
Germany
Prior art keywords
mirror
mirrors
inspection area
conveyor
hollow body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE4022733A
Other languages
German (de)
English (en)
Inventor
Robert Rudolfstetten Ch Apter
Louis-Francais Ceyreste Fr Pau
Carsten Soborg Dk Agerskov
Ulrik Hellerup Dk Jacobi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Elpatronic AG
Original Assignee
Elpatronic AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from CH4560/89A external-priority patent/CH680088A5/de
Priority claimed from CH2006/90A external-priority patent/CH680393A5/de
Application filed by Elpatronic AG filed Critical Elpatronic AG
Application granted granted Critical
Publication of DE4022733C1 publication Critical patent/DE4022733C1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06126—Large diffuse sources

Landscapes

  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Blow-Moulding Or Thermoforming Of Plastics Or The Like (AREA)
  • Structure Of Telephone Exchanges (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • External Artificial Organs (AREA)
DE4022733A 1989-12-19 1990-07-17 Three=dimensional cavity inspection appts. - uses matrix or line camera to receive reflected light via gp. of four mirrors and deflecting mirror Expired - Fee Related DE4022733C1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH4560/89A CH680088A5 (en) 1989-12-19 1989-12-19 Three=dimensional cavity inspection appts.
CH2006/90A CH680393A5 (en) 1990-06-15 1990-06-15 Three=dimensional cavity inspection appts.

Publications (1)

Publication Number Publication Date
DE4022733C1 true DE4022733C1 (en) 1991-05-08

Family

ID=25689241

Family Applications (2)

Application Number Title Priority Date Filing Date
DE4022733A Expired - Fee Related DE4022733C1 (en) 1989-12-19 1990-07-17 Three=dimensional cavity inspection appts. - uses matrix or line camera to receive reflected light via gp. of four mirrors and deflecting mirror
DE59009743T Expired - Fee Related DE59009743D1 (de) 1989-12-19 1990-11-16 Vorrichtung zur dreidimensionalen Inspektion von Hohlkörpern.

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE59009743T Expired - Fee Related DE59009743D1 (de) 1989-12-19 1990-11-16 Vorrichtung zur dreidimensionalen Inspektion von Hohlkörpern.

Country Status (12)

Country Link
US (1) US5136157A (ru)
EP (1) EP0433666B1 (ru)
JP (1) JPH0731136B2 (ru)
KR (1) KR950000332B1 (ru)
CN (1) CN1019607B (ru)
AT (1) ATE128770T1 (ru)
AU (1) AU638650B2 (ru)
BR (1) BR9006441A (ru)
CA (1) CA2031885C (ru)
DE (2) DE4022733C1 (ru)
DK (1) DK295390A (ru)
RU (1) RU2009474C1 (ru)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19916703A1 (de) * 1999-04-14 2000-10-19 Haering Franz Inspektionsmaschine für transparente Behälter
DE19542630C2 (de) * 1995-11-15 2001-10-11 Thomas Huhn Vorrichtung und Verfahren zum Prüfen von Gefäßwänden
EP2156169B1 (de) * 2007-05-31 2018-10-31 KHS GmbH Opto-elektrisches erfassungssystem
US11047803B1 (en) * 2020-09-10 2021-06-29 Applied Vision Corporation Glass container inspection system

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4300169A1 (de) * 1993-01-07 1994-07-14 Alfill Getraenketechnik Verfahren und Vorrichtung zum Prüfen von Flaschen
US5405015A (en) * 1993-08-11 1995-04-11 Videojet Systems International, Inc. System and method for seeking and presenting an area for reading with a vision system
CH686910A5 (de) * 1994-02-24 1996-07-31 Elpatronic Ag Verfahren und Vorrichtung zur Pruefung der Seitenwand eines Behaelters.
US5442446A (en) * 1994-08-19 1995-08-15 Owens-Brockaway Glass Container Inc. Inspection of transparent containers
US5635728A (en) * 1995-06-19 1997-06-03 Denoptix, Inc. Rotating scanner system for reading multiple storage layer radiation screens
JPH11510256A (ja) 1995-08-04 1999-09-07 イメージ プロセッシング システムズ，インク． びんのねじ山の検査システムおよびその作動方法
JPH1032810A (ja) * 1996-07-15 1998-02-03 Matsushita Electric Works Ltd 画像処理検査装置
US6624438B2 (en) 1997-11-20 2003-09-23 Orex Computed Radiography Ltd. Scanning apparatus
JP3184183B2 (ja) * 1999-06-04 2001-07-09 株式会社ユタカ 扁平ワークの検査装置
DE19953738C1 (de) * 1999-11-09 2001-06-07 Krones Ag Inspektionsvorrichtung zur Seitenwandkontrolle von Gefäßen
US6473169B1 (en) 2000-05-03 2002-10-29 Air Logic Power Systems, Inc. Integrated leak and vision inspection system
US6806459B1 (en) 2001-08-30 2004-10-19 Owens-Brockway Glass Container Inc. Measurement of transparent container sidewall thickness
KR100430132B1 (ko) * 2001-09-20 2004-05-03 피엔에스테크놀러지(주) 용기의 측면 검사장치
KR20030046616A (ko) * 2001-12-06 2003-06-18 삼성전자주식회사 레이져 광 산란을 이용한 고순도 글래스 튜브의 미세 기포분석 장치
US6879389B2 (en) * 2002-06-03 2005-04-12 Innoventor Engineering, Inc. Methods and systems for small parts inspection
DE10339473A1 (de) * 2003-08-27 2005-03-24 Seidenader Maschinenbau Gmbh Vorrichtung zur Prüfung von Erzeugnissen
FR2871581B1 (fr) * 2004-06-15 2006-09-08 Arvinmeritor Light Vehicle Sys Systeme de detection d'un obstacle et procede de detection d'un obstacle
WO2008028185A2 (en) * 2006-09-01 2008-03-06 Meckl Michael F Vacuum turntable system for leak testing melt blown bottles
DE102007013086A1 (de) * 2007-03-14 2008-09-18 Sgs Institut Fresenius Gmbh Vorrichtung und Verfahren zur Erfassung von Verunreinigungen auf einem transparenten Substrat
CN101246080B (zh) * 2008-03-18 2010-04-07 中国科学院长春光学精密机械与物理研究所 一种可移动的光学仪器检测用三维调整装置
CN100565162C (zh) * 2008-04-10 2009-12-02 中国科学院长春光学精密机械与物理研究所 一种可移动的光学仪器检测用多功能调整装置
EP2194358B1 (en) * 2008-12-05 2011-06-01 Tenaris Connections Aktiengesellschaft Measurement method and device for thread parameters
DE102009020919A1 (de) * 2009-05-12 2010-11-18 Krones Ag Vorrichtung zum Erkennen von Erhebungen und/oder Vertiefungen auf Flaschen, insbesondere in einer Etikettiermaschine
EP2392895B1 (en) 2010-06-01 2013-03-06 Tenaris Connections Ltd. Method for measurement of geometrical parameters of coated threaded joints
EP2392896B1 (en) 2010-06-01 2019-11-27 Tenaris Connections B.V. Measuring device of thread parameters for threaded joints
US8416403B2 (en) * 2010-10-29 2013-04-09 GII Acquisitiom, LLC Method and system for high-speed, high-resolution 3-D imaging of manufactured parts of various sizes
DE202012009944U1 (de) * 2012-10-12 2014-01-20 Seidenader Maschinenbau Gmbh Vorrichtung zur Prüfung von Erzeugnissen
US10244149B2 (en) * 2015-06-09 2019-03-26 Lockheed Martin Corporation Imaging system with scan line titled off focal plane
DE102015211317B4 (de) * 2015-06-19 2021-04-01 Krones Ag Inspektionsverfahren und -vorrichtung zur Verschlusskontrolle von Behältern
DE102015221506B3 (de) 2015-11-03 2017-01-12 Kba-Kammann Gmbh Vorrichtung zur Inspektion mindestens eines Druckbildes
EP3848701B1 (en) * 2020-01-08 2024-10-09 Schott Ag Inspection device for cylindrical bodies
DE102021109998B3 (de) * 2021-04-20 2022-04-07 Heye International Gmbh Verfahren zur Fehlerinspektion eines dreidimensionalen Objektes
US12056866B2 (en) * 2021-10-28 2024-08-06 Mectron Engineering Company, Inc. Method of optical quality inspection of workpieces

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0047936A1 (de) * 1980-09-17 1982-03-24 Siemens Aktiengesellschaft Verfahren und Anordnung zur optisch-elektronischen Erfassung von Oberflächenstrukturen an rotationssymmetrischen Körpern
DE3029678C2 (de) * 1980-08-01 1984-03-22 Siemens AG, 1000 Berlin und 8000 München Anordnung zur optisch-elektronischen Ermittlung von Verunreinigungen im Bodenbereich von transparenten Behältern
DE3407386A1 (de) * 1984-02-29 1985-09-05 Hermann 8404 Wörth Kronseder Inspektionsmaschine fuer flaschen
DE3532068A1 (de) * 1984-10-24 1986-04-24 Hajime Industries, Ltd., Tokio/Tokyo Pruefvorrichtung
EP0293510A2 (en) * 1987-06-04 1988-12-07 Kabushiki Kaisha Kirin Techno System Apparatus for inspecting side-wall of bottle

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AR207635A1 (es) * 1973-06-27 1976-10-22 Connor B O Aparato para senalar la presencia de materia extrana y/o grietas en envases translucidos
DE3035077A1 (de) * 1980-09-17 1982-04-22 Siemens AG, 1000 Berlin und 8000 München Verfahren und anordnung zur pruefung transparenter behaelter auf verunreinigungen oder beschaedigungen
FR2558259B1 (fr) * 1984-01-17 1986-12-12 Saint Gobain Cinematique Contr Emetteur a balayage pour l'inspection optique d'articles transparents
JPH0799326B2 (ja) * 1986-08-30 1995-10-25 株式会社マキ製作所 球塊状物品の外観検査方法と装置
US4855608A (en) * 1987-06-12 1989-08-08 Peterson Ii William D Laser curtain having an array of parabolic mirrors each focusing radiation on a corresponding detector positioned in mirror's focal point
NL8902041A (nl) * 1989-08-10 1991-03-01 Heuft Qualiplus Bv Inrichting voor het vanuit verschillende gezichtshoeken inspecteren van voorwerpen.

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3029678C2 (de) * 1980-08-01 1984-03-22 Siemens AG, 1000 Berlin und 8000 München Anordnung zur optisch-elektronischen Ermittlung von Verunreinigungen im Bodenbereich von transparenten Behältern
EP0047936A1 (de) * 1980-09-17 1982-03-24 Siemens Aktiengesellschaft Verfahren und Anordnung zur optisch-elektronischen Erfassung von Oberflächenstrukturen an rotationssymmetrischen Körpern
DE3407386A1 (de) * 1984-02-29 1985-09-05 Hermann 8404 Wörth Kronseder Inspektionsmaschine fuer flaschen
DE3532068A1 (de) * 1984-10-24 1986-04-24 Hajime Industries, Ltd., Tokio/Tokyo Pruefvorrichtung
EP0293510A2 (en) * 1987-06-04 1988-12-07 Kabushiki Kaisha Kirin Techno System Apparatus for inspecting side-wall of bottle

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19542630C2 (de) * 1995-11-15 2001-10-11 Thomas Huhn Vorrichtung und Verfahren zum Prüfen von Gefäßwänden
DE19916703A1 (de) * 1999-04-14 2000-10-19 Haering Franz Inspektionsmaschine für transparente Behälter
EP2156169B1 (de) * 2007-05-31 2018-10-31 KHS GmbH Opto-elektrisches erfassungssystem
US11047803B1 (en) * 2020-09-10 2021-06-29 Applied Vision Corporation Glass container inspection system

Also Published As

Publication number Publication date
ATE128770T1 (de) 1995-10-15
BR9006441A (pt) 1991-10-01
EP0433666A2 (de) 1991-06-26
DK295390D0 (da) 1990-12-12
KR950000332B1 (ko) 1995-01-13
US5136157A (en) 1992-08-04
JPH0731136B2 (ja) 1995-04-10
CA2031885C (en) 1994-08-09
CN1052947A (zh) 1991-07-10
RU2009474C1 (ru) 1994-03-15
AU6698190A (en) 1991-06-27
DE59009743D1 (de) 1995-11-09
EP0433666A3 (en) 1992-03-25
KR910012703A (ko) 1991-08-08
EP0433666B1 (de) 1995-10-04
JPH03267746A (ja) 1991-11-28
DK295390A (da) 1991-06-20
CN1019607B (zh) 1992-12-23
AU638650B2 (en) 1993-07-01
CA2031885A1 (en) 1991-06-20

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Legal Events

Date Code Title Description
8100 Publication of patent without earlier publication of application
D1 Grant (no unexamined application published) patent law 81
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee